Compensation for air gap changes and temperature changes in a resonant phase detector

Patent metadata

Field	Value
Publication number	US-11595037-B2
Application number	US-202217848051-A
Country	US
Kind code	B2
Filing date	Jun 23, 2022
Priority date	Jun 3, 2019
Publication date	Feb 28, 2023
Grant date	Feb 28, 2023

Abstract

A system may include a sensor configured to output a sensor signal indicative of a distance between the sensor and a mechanical member associated with the sensor, a measurement circuit communicatively coupled to the sensor and configured to determine a physical force interaction with the mechanical member based on the sensor signal, and a compensator configured to monitor the sensor signal and to apply a compensation factor to the sensor signal to compensate for changes to properties of the sensor based on at least one of changes in a distance between the sensor and the mechanical member and changes in a temperature associated with the sensor.

First claim

What is claimed is:

1. A system comprising:
a sensor configured to output a sensor signal indicative of a distance between the sensor and a mechanical member associated with the sensor;
a measurement circuit communicatively coupled to the sensor and configured to determine a physical force interaction with the mechanical member based on the sensor signal; and
a compensator configured to monitor the sensor signal and to apply a compensation factor to the sensor signal to compensate for changes to properties of the sensor based on at least one of:
changes in a distance between the sensor and the mechanical member; and
changes in a temperature associated with the sensor;

wherein the compensator comprises a quality factor detector configured to monitor a quality factor of the sensor and the compensator is configured to apply the compensation factor based on the quality factor and the compensator is configured to determine a temperature associated with the sensor based on the quality factor.

2. The system of claim 1 , wherein the sensor is a resistive-inductive-capacitive sensor.

3. The system of claim 2 , wherein:
the system further comprises a driver configured to drive the sensor at a driving frequency; and
the measurement circuit is configured to:
measure phase information associated with the sensor; and
based on the phase information, determine a displacement of a mechanical member relative to the resistive-inductive-capacitive sensor, wherein the displacement of the mechanical member causes a change in an impedance of the resistive-inductive-capacitive sensor.

4. The system of claim 3 , wherein the displacement is indicative of an interaction with a virtual button comprising the mechanical member.

5. The system of claim 4 , wherein the compensator is further configured to apply the compensation factor to consistently determine interaction with the virtual button despite changes in properties of the sensor.

6. The system of claim 1 , wherein the compensator is further configured to:
determine a resonant frequency of the sensor; and
determine a change in one or more of the distance between the sensor and the mechanical member and the temperature based on the resonant frequency.

7. The system of claim 1 , wherein the compensator is further configured to:
determine a resonant frequency of the sensor; and
determine a change in an impedance of the sensor based on the frequency.

8. The system of claim 1 , wherein the compensator is further configured to:
determine a resonant frequency of the sensor; and
determine a change in an inductance of the sensor based on the frequency.

9. The system of claim 1 , wherein the compensator is further configured to determine a change in the distance between the sensor and the mechanical member based on the change in inductance.

10. The system of claim 1 , wherein the compensator applies the compensation factor in response to one or more of:
a change in resonant frequency of the sensor by more than a threshold frequency change;
a change in resonant frequency of the sensor at a rate outside of a predetermined frequency rate change range;
a change in a quality factor of the sensor by more than a threshold quality factor change; and
a change in the quality factor of the sensor at a rate outside of a predetermined quality factor rate change range.

11. The system of claim 1 , wherein the compensation factor comprises one or more of:
scaling of measured phase information associated with the sensor;
scaling of measured amplitude information associated with the sensor;
modification of a detection threshold for indicating physical force interaction with the mechanical member;
application of an offset to the sensor signal;
application of a filter to the sensor signal;
application of a compensation value from a lookup table; and
modification of a resonant frequency of the sensor.

12. The system of claim 1 , wherein the compensator is further configured to:
determine impedance of the sensor as a function of frequency;
determine a calculated inductance of the sensor based on the impedance of the sensor as a function of frequency;
compare the calculated inductance against a predetermined inductance versus distance relationship of the sensor to determine the distance between the mechanical member and the sensor; and
apply the compensation as a gain correction to compensate for changes in the distance.

13. The system of claim 1 , wherein the compensator is further configured to:
over a duration, linearly increase a current driven to the sensor from a minimum current to a maximum current;
measure a voltage associated with the sensor during the duration;
determine a calculated inductance of the sensor based on the voltage, the maximum current and the minimum current;
compare the calculated inductance against a predetermined inductance versus distance relationship of the sensor to determine the distance between the mechanical member and the sensor; and
apply the compensation as a gain correction to compensate for changes in the distance.

14. A method comprising, in a system comprising a sensor configured to output a sensor signal indicative of a distance between the sensor and a mechanical member associated with the sensor and a measurement circuit communicatively coupled to the sensor and configured to determine a physical force interaction with the mechanical member based on the sensor signal:
applying a compensation factor to the sensor signal to compensate for changes to properties of the sensor based on at least one of:
changes in a distance between the sensor and the mechanical member; and
changes in a temperature associated with the sensor;

monitoring a quality factor of the sensor and the compensator is configured to apply the compensation factor based on the quality factor; and
determining a temperature associated with the sensor based on the quality factor.

15. The method of claim 14 , wherein the sensor is a resistive-inductive-capacitive sensor.

16. The method of claim 15 , wherein:
the system further comprises a driver configured to drive the sensor at a driving frequency; and
the measurement circuit is configured to:
measure phase information associated with the sensor; and
based on the phase information, determine a displacement of a mechanical member relative to the resistive-inductive-capacitive sensor, wherein the displacement of the mechanical member causes a change in an impedance of the resistive-inductive-capacitive sensor.

17. The method of claim 16 , wherein the displacement is indicative of an interaction with a virtual button comprising the mechanical member.

18. The method of claim 17 , further comprising applying the compensation factor to consistently determine interaction with the virtual button despite changes in properties of the sensor.

19. The method of claim 14 , further comprising:
determining a resonant frequency of the sensor; and
determining a change in one or more of the distance between the sensor and the mechanical member and the temperature based on the resonant frequency.

20. The method of claim 14 , further comprising:
determining a resonant frequency of the sensor; and
determining a change in an impedance of the sensor based on the frequency.

21. The method of claim 14 , further comprising:
determining a resonant frequency of the sensor; and
determining a change in an inductance of the sensor based on the frequency.

22. The method

Assignees

• Cirrus Logic Int Semiconductor Ltd
• Cirrus Logic Inc

Inventors

• Beardsworth Matthew
• Das Tejasvi
• Maru Siddharth
• Lapointe Luke

Classifications

• G01L1/14

  by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators · CPC title

• H03K17/9522

  with a galvanically isolated probe · CPC title

• H03K17/975

  using a capacitive movable element · CPC title

• H03K17/9502

  Measures for increasing reliability · CPC title

• G01D18/008 Primary

  with calibration coefficients stored in memory · CPC title