Analysis device

Patent metadata

Field	Value
Publication number	US-11587777-B2
Application number	US-202117225558-A
Country	US
Kind code	B2
Filing date	Apr 8, 2021
Priority date	Apr 22, 2020
Publication date	Feb 21, 2023
Grant date	Feb 21, 2023

Abstract

An analysis device includes an electron emission element, a collector, an electric field former, a power source, and a controller. The electron emission element includes a bottom electrode, a surface electrode, and an intermediate layer arranged between the bottom electrode and the surface electrode. The power source and the controller allow application of a voltage between the bottom electrode and the surface electrode. The electric field former forms an electric field in an ion movement region where anions directly or indirectly generated by electrons emitted from the electron emission element move toward the collector. The collector and the controller allow measurement of a current waveform of an electric current made to flow by arrival of anions at the collector. The controller regulates, based on the current waveform, a voltage applied between the bottom electrode and the surface electrode.

First claim

What is claimed is:

1. An analysis device comprising an electron emission element, a collector, an electric field former, a power source, and a controller, wherein
the electron emission element includes a bottom electrode, a surface electrode, and an intermediate layer arranged between the bottom electrode and the surface electrode,
the power source and the controller allow application of a voltage between the bottom electrode and the surface electrode,
the electric field former forms an electric field in an ion movement region where anions directly or indirectly generated by electrons emitted from the electron emission element move toward the collector,
the collector and the controller allow measurement of a current waveform of an electric current made to flow by arrival of anions at the collector, and
the controller regulates, based on the current waveform, a voltage applied between the bottom electrode and the surface electrode.

2. The analysis device according to claim 1 , wherein
the current waveform has a peak corresponding to an ion species arriving at the collector, and
the controller regulates the voltage applied between the bottom electrode and the surface electrode to cause a peak height or a peak area of a peak corresponding to primary ions generated by ionization of an air component to approach a particular target value.

3. The analysis device according to claim 1 , wherein
the current waveform has a peak corresponding to an ion species arriving at the collector, and
the controller regulates the voltage applied between the bottom electrode and the surface electrode to cause a total peak area of the current waveform to approach a particular target value.

4. The analysis device according to claim 3 , wherein the controller changes the particular target value to regulate measurement sensitivity or ionization capability.

5. The analysis device according to claim 1 , further comprising an electrostatic gate electrode, wherein
the electrostatic gate electrode is arranged between the ion movement region and an ionization region where anions are directly or indirectly generated by electrons emitted from the electron emission element, and
the electrostatic gate electrode and the controller allow control of an electric potential of the electrostatic gate electrode to control feed of anions generated in the ionization region to the ion movement region.

6. The analysis device according to claim 5 , further comprising a specimen feeder that feeds a specimen gas to the ionization region, wherein
the controller regulates the voltage applied between the bottom electrode and the surface electrode before starting feed of the specimen gas to the ionization region.

7. The analysis device according to claim 5 , further comprising a specimen feeder that feeds a specimen gas to the ionization region, wherein
the controller regulates the voltage applied between the bottom electrode and the surface electrode after starting feed of the specimen gas to the ionization region.

8. The analysis device according to claim 7 , wherein the controller raises the voltage applied between the bottom electrode and the surface electrode if the current waveform has a peak corresponding to ions generated by ionization of the specimen gas and does not have a peak corresponding to primary ions generated by ionization of an air component.

9. The analysis device according to claim 5 , further comprising a drift gas feeder and an exhaust port, wherein
the drift gas feeder and the exhaust port cause a drift gas to flow in the ion movement region from a collector side toward a side of the electrostatic gate electrode.

10. The analysis device according to claim 1 , wherein
the current waveform has a peak corresponding to an ion species arriving at the collector, and
the controller calculates a concentration of a component to be detected, based on a ratio between a peak height or a peak area of a peak corresponding to primary ions generated by ionization of an air component and a peak height or a peak area of a peak corresponding to ions generated by ionization of the component to be detected.

Assignees

• Sharp Kk

Inventors

• Moritani Masamitsu
• Kyuhken Katsuhiko
• Komaru Shohei
• Iwamatsu Tadashi
• Morimoto Satoshi

Classifications

• G01N27/624

  Differential mobility spectrometry [DMS]; Field asymmetric-waveform ion mobility spectrometry [FAIMS] · CPC title

• H01J49/282 Primary

  using electrostatic analysers · CPC title

• G01N27/622 Primary

  Ion mobility spectrometry · CPC title