Time-of-flight detector with single-axis scan
US-2017176596-A1 · Jun 22, 2017 · US
US11579256B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11579256-B2 |
| Application number | US-201916508821-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 11, 2019 |
| Priority date | Jul 11, 2019 |
| Publication date | Feb 14, 2023 |
| Grant date | Feb 14, 2023 |
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A light detection and ranging system includes synchronously scanning transmit and receive mirrors that scan a pulsed fanned laser beam in two dimensions. Imaging optics image a receive aperture onto an arrayed receiver that includes a plurality of light sensitive devices. A phase offset may be injected into a scanning trajectory to mitigate effects of interfering light sources.
Opening claim text (preview).
What is claimed is: 1. A light detection and ranging system comprising: a laser light source; at least one light sensitive device; at least one time-of-flight measurement circuit responsive to the at least one light sensitive device; a first scanning mirror assembly responsive to a first drive signal to scan light from the laser light source into a scan trajectory in a field of view, the scan trajectory having a fast-scan direction and a slow-scan direction; a second scanning mirror assembly responsive to a second drive signal to synchronously scan with the first scanning mirror assembly and deposit reflected light energy from the field of view on the at least one light sensitive device; and a control circuit coupled to provide the first and second drive signals, wherein the control circuit includes a phase offset circuit, the phase offset circuit configured to selectively apply phase offsets to the scan trajectory in the slow-scan direction. 2. The light detection and ranging system of claim 1 further comprising an interference detection circuit configured to detect interference. 3. The light detection and ranging system of claim 2 wherein the phase offset circuit is coupled to selectively apply phase offsets to the scan trajectory in the slow-scan direction responsive to the interference detection circuit detecting interference. 4. The light detection and ranging system of claim 3 wherein the phase offset circuit selectively applies phase offsets to the scan trajectory by selecting a phase offset to apply to the scan trajectory using a backoff algorithm. 5. The light detection and ranging system of claim 3 wherein the phase offset circuit selectively applies phase offsets to the scan trajectory by selecting a phase offset to apply to the scan trajectory to select one of a discrete number of channels. 6. The light detection and ranging system of claim 3 wherein the interference detection circuit detects interference by detecting time-of-flight anomalies in the field of view. 7. The light detection and ranging system of claim 1 further comprising at least one optical device to form the light into a fanned beam. 8. The light detection and ranging system of claim 7 wherein the at least one light sensitive device comprises an array of light sensitive devices. 9. The light detection and ranging system of claim 8 wherein the at least one time-of-flight measurement circuit comprises a plurality of time-of-flight measurement circuits coupled to be responsive to the array of light sensitive devices. 10. A light detection and ranging system comprising: a laser light source; a scanning mirror assembly to scan laser light pulses from the laser light source into a scan trajectory in a scan field, the scan trajectory having two directions; a light sensitive device to detect reflections of the laser light pulses; a time-of-flight measurement circuit responsive to the light sensitive device; an interference detection circuit responsive to time-of-flight measurements made by the time-of-flight measurement circuit; and a phase offset circuit responsive to the interference detection circuit to selectively apply phase offsets to the scan trajectory. 11. The light detection and ranging system of claim 10 wherein the interference detection circuit comprises circuitry to detect high frequency variations in measured time-of-flight data, and wherein the phase offset circuit selectively applies phase offsets to the scan trajectory responsive to detected high frequency variations in the measured time-of-flight data. 12. The light detection and ranging system of claim 10 wherein the interference detection circuit comprises circuitry to detect anomalous time-of-flight data, and wherein the phase offset circuit selectively applies phase offsets to the scan trajectory responsive to detected anomalous time-of-flight data. 13. The light detection and ranging system of claim 10 wherein the phase offset circuit is configured to selectively apply phase offsets to the scan trajectory by selecting a phase offset to apply to the scan trajectory using an exponential backoff algorithm. 14. The light detection and ranging system of claim 10 wherein the phase offset circuit is configured to selectively apply phase offsets to the scan trajectory by selecting a phase offset to apply to the scan trajectory that corresponds to one of a plurality of phase-separated channels. 15. The light detection and ranging system of claim 10 wherein the phase offsets are selectively applied in one of the two directions. 16. A method comprising: producing a pulsed fanned beam of laser light; synchronously scanning a transmit scanning mirror and a receive scanning mirror to scan the pulsed fanned beam of laser light into a scan trajectory, the scan trajectory having two dimensions in a field of view and to deposit reflected light energy from the field of view onto an array of light sensitive devices; measuring times-of-flight of pulses received by the array of light sensitive devices to create a point cloud; detecting at least one anomaly in measured times-of-flight; and modifying a phase of the scanning of the transmit scanning mirror to selectively apply phase offsets to the scan trajectory responsive to detecting the at least one anomaly in the measured times-of-flight. 17. The method of claim 16 wherein the detecting at least one anomaly comprises detecting high frequency variations of measured times-of-flight in a portion of the field of view and wherein the modifying a phase of the scanning of the transmit scanning mirror to selectively apply phase offsets to the scan trajectory is responsive to detecting the high frequency variations of measured times-of-flight. 18. The method of claim 16 wherein the detecting at least one anomaly comprises detecting measured times-of-flight greater than a threshold in a portion of the field of view and wherein the modifying a phase of the scanning of the transmit scanning mirror to selectively apply phase offsets to the scan trajectory is responsive to detecting the measured times-of-flight greater than the threshold. 19. The method of claim 16 wherein the modifying a phase of the scanning of the transmit scanning mirror to selectively apply phase offsets to the scan trajectory responsive to detecting the at least one anomaly comprises selecting a phase offset to apply to the scan trajectory using an exponential backoff algorithm. 20. The method of claim 16 wherein the modifying a phase of the scanning of the transmit scanning mirror to selectively apply phase offsets to the scan trajectory responsive to detecting the at least one anomaly comprises identifying an alternate phase-separated channel and selecting a phase offset to apply to the scan trajectory that corresponds to the identified alternate phase-separated channel.
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