Self-radiated loopback test procedure for millimeter wave antennas

Patent metadata

Field	Value
Publication number	US-11575450-B2
Application number	US-201916663298-A
Country	US
Kind code	B2
Filing date	Oct 24, 2019
Priority date	Oct 26, 2018
Publication date	Feb 7, 2023
Grant date	Feb 7, 2023

Abstract

Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.

First claim

What is claimed is:

1. A method of testing a device under test (DUT) performed by the DUT, the method comprising:
setting the DUT in a simultaneous transmit and receive mode;
receiving a lower frequency radio frequency (RF) signal from a test unit, the lower frequency RF signal being a signal in a GHz frequency range;
up-converting the lower frequency RF signal to a higher frequency RF signal, the higher frequency RF signal having a higher frequency than the lower frequency RF signal;
transmitting the higher frequency RF signal using a first antenna of the DUT on a first multiple-input and multiple-output (MIMO) layer;
receiving the higher frequency RF signal using a second antenna of the DUT on a second MIMO layer;
down-converting the received higher frequency RF signal to a received test RF signal; and
providing the received test RF signal to the test unit.

2. The method of claim 1 , wherein the first antenna and the second antenna are selected from a plurality of antennas of the DUT.

3. The method of claim 2 , wherein the plurality of antennas are coupled to the DUT prior to testing.

4. The method of claim 2 , wherein the first antenna and the second antenna are separated by at least one other antenna of the plurality of antennas.

5. The method of claim 2 , wherein the plurality of antennas includes one or more dipole antennas and one or more patch antennas.

6. The method of claim 5 , wherein the first antenna and the second antenna are both dipole antennas.

7. The method of claim 5 , wherein the first antenna and the second antenna are both patch antennas.

8. The method of claim 1 , wherein the transmitting and receiving are performed by a single transceiver integrated circuit (IC) that is part of the DUT.

9. The method of claim 1 , further comprising:
receiving a second lower frequency RF signal from the test unit, the second lower frequency RF signal being a signal in the GHz frequency range;
up-converting the second lower frequency RF signal to a second higher frequency RF signal, the second higher frequency RF signal having a higher frequency than the second lower frequency RF signal;
transmitting the second higher frequency RF signal using the second antenna;
receiving the second higher frequency RF signal using the first antenna;
down-converting the received second higher frequency RF signal to a second received test RF signal; and
providing the second received test RF signal to the test unit.

10. The method of claim 9 , wherein the lower frequency RF signal and the second lower frequency RF signal are the same.

11. The method of claim 1 , wherein the lower frequency RF signal received from the test unit comprises a multi-tone RF signal.

12. The method of claim 1 , wherein the lower frequency RF signal comprises a non-millimeter wave RF signal in the GHz frequency range and the higher frequency RF signal comprises a millimeter wave RF signal.

13. A device under test (DUT), comprising:
a memory;
a plurality of antennas coupled to the at least one processor, the plurality of antenna comprising at least a first antenna and a second antenna, wherein a transmit path for the first antenna is electrically independent of a receive path of the second antenna;
an up-converter and a down-converter; and
at least one processor coupled to the memory, the at least one processor configured to:
set the DUT in a simultaneous transmit and receive mode;
receive a lower frequency radio frequency (RF) signal from a test unit, the lower frequency RF signal being a signal in a GHz frequency range;
up-convert, via the up-converter, the lower frequency RF signal to a higher frequency RF signal, the higher frequency RF signal having a higher frequency than the lower frequency RF signal;
transmit, via the first antenna, the higher frequency RF signal on a first multiple-input and multiple-output (MIMO) layer;
receive, via the second antenna, the higher frequency RF signal on a second MIMO layer;
down-convert, via the down-converter, the received higher frequency RF signal to a received test RF signal; and
provide the received test RF signal to the test unit.

14. The DUT of claim 13 , wherein the first antenna and the second antenna are separated by at least one other antenna of the plurality of antennas.

15. The DUT of claim 13 , wherein the plurality of antennas includes one or more dipole antennas and one or more patch antennas.

16. The DUT of claim 15 , wherein the first antenna and the second antenna are both dipole antennas, or wherein the first antenna and the second antenna are both patch antennas.

17. The DUT of claim 13 , wherein the lower frequency RF signal comprises a non-millimeter wave RF signal in the GHz frequency range and the higher frequency RF signal comprises a millimeter wave RF signal.

18. The DUT of claim 13 , wherein the first antenna and the second antenna are separated by at least one other antenna of the plurality of antennas.

19. The DUT of claim 13 , wherein the plurality of antennas includes one or more dipole antennas and one or more patch antennas.

20. The DUT of claim 19 , wherein the first antenna and the second antenna are both dipole antennas, or wherein the first antenna and the second antenna are both patch antennas.

Assignees

• Qualcomm Inc

Inventors

• Verma Gaurav
• Collins David
• Wendlandt Ryan
• Deshpande Prachi
• Singhania Gaurav
• Moncombu Ramakrishnan Karthik
• Carr Jeffrey
• Bhattacharya Anushruti
• Feenaghty Dennis

Classifications

• H04B17/297

  Self-testing arrangements · CPC title

• H04B1/50

  using different frequencies for the two directions of communication · CPC title

• H04B17/17

  Detection of non-compliance or faulty performance, e.g. response deviations (H04B17/18 takes precedence) · CPC title

• H01Q9/0407

  Substantially flat resonant element parallel to ground plane, e.g. patch antenna (dipole H01Q9/285; monopole H01Q9/40) · CPC title

• G01R31/2822

  of microwave or radiofrequency circuits (of attenuation, gain, e.g. using network analyzers G01R27/28) · CPC title