Information processing apparatus and method for controlling same
US-2021142459-A1 · May 13, 2021 · US
Inspection method of examination system and examination system
US11574396B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11574396-B2 |
| Application number | US-202117187586-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 26, 2021 |
| Priority date | Mar 4, 2020 |
| Publication date | Feb 7, 2023 |
| Grant date | Feb 7, 2023 |
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- Title
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Abstract
Official abstract text for this publication.
An inspection method to be used to inspect an examination system configured to image an object and make a good/defective determination of the object on the basis of an image acquired by the imaging comprises displaying a sample image of the object, imaging the displayed sample image by a camera, and making a good/defective determination of the object indicated by the sample image on, the basis of the image acquired by imaging of the camera.
First claim
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What is claimed is: 1. An inspection method usable to inspect an examination system configured to image an object and make a good/defective determination of the object based on an image acquired by imaging the object, the examination system comprising a display device configured to display an image, an imaging device including a camera configured to image the object, and a control device configured to control the display device and the imaging device, and the method comprising, under control of the control device: displaying a sample image of a good article or a defective article of the object on the display device; imaging the displayed sample image by the camera; making a good/defective determination of the object included in the sample image based on the image acquired by the imaging by the camera; and determining whether or not the examination system is normal. 2. The inspection method of claim 1 , wherein the sample image is displayed in an actual size of the object. 3. The inspection method of claim 1 , wherein the making the good/defective determination of the object comprises comparing the image acquired by the imaging by the camera and the sample image with each other. 4. The inspection method of claim 3 , further comprising, after making the good/defective determination of the object included in the sample image, outputting a result of the good/defective determination. 5. An examination system configured to image an object and make a good/defective determination of the object based on an image acquired by imaging the object, the examination system comprising: a display device configured to display an image; an imaging device including a camera configured to image the object; and a control device configured to control the display device and the imaging device, wherein the control device is configured to: control the display device to display a sample image of a good article or a defective article of the object; control the camera to image the sample image displayed on the display device; make a good/defective determination of the object included in the sample image based on the image acquired by the imaging by the camera; and determine whether or not the examination system is normal. 6. The examination system of claim 5 , wherein the display device displays the sample image in an actual size of the object. 7. The examination system of claim 5 , wherein the control device makes the good/defective determination of the object by comparing the image acquired by the imaging by the camera and the sample image with each other. 8. The examination system of claim 7 , further comprising an output device configured to output a result of making the good/defective determination of the object included in the sample image.
Assignees
Inventors
Classifications
Workpiece; Machine component · CPC title
- G01N21/01Primary
Arrangements or apparatus for facilitating the optical investigation · CPC title
Apparatus in one mechanical, optical or electronic block · CPC title
Image quality inspection · CPC title
- G06T7/001Primary
using an image reference approach · CPC title
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Frequently asked questions
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- What does patent US11574396B2 cover?
- An inspection method to be used to inspect an examination system configured to image an object and make a good/defective determination of the object on the basis of an image acquired by the imaging comprises displaying a sample image of the object, imaging the displayed sample image by a camera, and making a good/defective determination of the object indicated by the sample image on, the basis …
- Who is the assignee on this patent?
- Nhk Spring Co Ltd
- What technology area does this patent fall under?
- Primary CPC classification G01N21/01. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Feb 07 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).