System and method for configuring an inspection robot for inspecting an inspection surface

US11565417B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11565417-B2
Application numberUS-202016869691-A
CountryUS
Kind codeB2
Filing dateMay 8, 2020
Priority dateDec 23, 2016
Publication dateJan 31, 2023
Grant dateJan 31, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Systems and methods for configuring a robot for inspecting an inspection surface are disclosed. An example system may include an inspection robot having a payload coupled to at least two inspection sensors and a controller. The controller may include a route profile processing circuit to interpret route profile data for the inspection robot, a configuration determining circuit to determine one or more configurations for the inspection robot in response to the route profile data; and a configuration processing circuit to provide configuration data in response to the determined one or more configurations, the configuration data defining, at least in part, one or more inspection characteristics for the inspection robot.

First claim

Opening claim text (preview).

What is claimed is: 1. An apparatus for configuring an inspection robot for inspecting an inspection surface, the apparatus comprising: the inspection robot comprising: a plurality of payloads; a plurality of arms, wherein each of the plurality of arms is pivotally mounted to a corresponding payload of the plurality of payloads; and a plurality of sleds, wherein a first sled of the plurality of sleds has a first inspection sensor mounted thereto and a second sled of the plurality of sleds has a second inspection sensor mounted thereto, wherein each sled is mounted to at least one of the plurality of arms, wherein the inspection sensors are operationally couplable to the inspection surface, and wherein the plurality of sleds are horizontally distributed on the inspection surface at selected horizontal positions, and wherein at least one of the plurality of arms is horizontally moveable relative to the corresponding payload; and a controller structured to: interpret data for the inspection robot relative to the inspection surface; determine one or more configurations for the inspection robot in response to the data; and provide configuration data in response to the determined one or more configurations, the configuration data defining, in part, one or more inspection characteristics for the inspection robot. 2. The apparatus of claim 1 , wherein the one or more inspection characteristics include at least one inspection characteristic selected from the inspection characteristics consisting of: a type of inspection sensor for the inspection robot; a horizontal spacing between adjacent inspection sensors for the inspection robot; a horizontal spacing between inspection lanes for an inspection operation of the inspection robot; a magnitude of a downward force applied to a sled housing an inspection sensor of the inspection robot; a sled geometry for a sled housing an inspection sensor of the inspection robot; a payload configuration for a payload of the inspection robot; a wheel configuration for the inspection robot; and a type of a downward force biasing device for the inspection robot structured to apply a downward force on an inspection sensor of the inspection robot. 3. The apparatus of claim 1 , further comprising: the controller further structured to configure the inspection robot in response to the provided configuration data. 4. The apparatus of claim 3 , wherein the controller is further structured to configure the inspection robot by performing at least one operation selected from the operations consisting of: configuring a horizontal spacing between inspection lanes for an inspection operation of the inspection robot; configuring at least one of an inspection route and a horizontal spacing between adjacent inspection sensors, thereby performing an inspection operation compliant with an on-surface inspected resolution target; or configuring a downward force biasing device to apply a selected down force to a sled housing an inspection sensor of the inspection robot. 5. The apparatus of claim 1 , wherein the controller is further structured to: interpret updated data during an inspection operation of the inspection surface by the inspection robot; determine one or more updated configurations of the inspection robot in response to the updated data; and provide updated configuration data in response to the determined updated one or more configurations. 6. The apparatus of claim 5 , further comprising the controller further structured to re-configure the inspection robot in response to the updated one or more configurations. 7. The apparatus of claim 1 , wherein the data comprises: obstacle data. 8. A method for configuring an apparatus comprising an inspection robot for inspecting an inspection surface, the method comprising: interpreting data for the inspection robot relative to the inspection surface; determining one or more configurations for the inspection robot in response to the data; and providing configuration data in response to the determined one or more configurations, the configuration data defining, at least in part, one or more inspection characteristics for the inspection robot, wherein the apparatus further comprises: the inspection robot comprising a plurality of payloads; a plurality of arms, wherein each of the plurality of arms is pivotally mounted to a corresponding payload of the plurality of payloads; a plurality of sleds, wherein each sled is mounted to one of the plurality of arms; and a plurality of inspection sensors, each of the plurality of inspection sensors coupled to one of the plurality of sleds such that each sensor is operationally couplable to the inspection surface, wherein the plurality of sleds are horizontally distributed on the inspection surface at selected horizontal positions, and wherein each of the plurality of arms is horizontally moveable relative to the corresponding payload. 9. The method of claim 8 , wherein the one or more inspection characteristics include at least one inspection characteristic selected from the inspection characteristics consisting of: a type of inspection sensor for the inspection robot; a horizontal spacing between adjacent inspection sensors for the inspection robot; a horizontal spacing between inspection lanes for an inspection operation of the inspection robot; a magnitude of a downward force applied to a sled housing an inspection sensor of the inspection robot; a sled geometry for a sled housing an inspection sensor of the inspection robot; a payload configuration for a payload of the inspection robot; a wheel configuration for the inspection robot; and a type of a downward force biasing device for the inspection robot structured to apply a downward force to a sled housing an inspection sensor of the inspection robot. 10. The method of claim 8 , wherein providing the configuration data comprises communicating the configuration data to a user device. 11. The method of claim 8 , wherein determining the one or more configurations for the inspection robot is performed during an inspection operation of the inspection robot of the inspection surface. 12. The method of claim 11 , further comprising adjusting a configuration of the inspection robot in response to the determined one or more configurations for the inspection robot during the inspection operation of the inspection robot. 13. The method of claim 12 , wherein adjusting the configuration of the inspection robot comprises at least one operation selected from the operations consisting of: configuring a horizontal spacing between inspection lanes for an inspection operation of the inspection robot; configuring at least one of an inspection route and a horizontal spacing between adjacent inspection sensors, thereby performing an inspection operation compliant with an on-surface inspected resolution target; or configuring a downward force biasing device to apply a selected down force to a sled housing an inspection sensor of the inspection robot. 14. The method of claim 8 , further comprising mounting an inspection sensor to the inspection robot in response to the provided configuration data. 15. The method of claim 8 , further comprising mounting a module to the inspection robot in response to the provided configuration data. 16. The method of claim 8 , further comprising adjusting an inspection sensor disposed on the inspection robot in response to the provided configuration data. 17. A system comprising: an inspection robot comprising a plurality of payloads comprising at leas

Assignees

Inventors

Classifications

  • for measuring contours or curvatures · CPC title

  • Gears specially adapted therefor, e.g. reduction gears (gearings in general F16H) · CPC title

  • Sensing devices · CPC title

  • characterised by motion, path, trajectory planning · CPC title

  • characterised by the operator's input device (input arrangements for computing systems in general G06F3/00) · CPC title

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Frequently asked questions

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What does patent US11565417B2 cover?
Systems and methods for configuring a robot for inspecting an inspection surface are disclosed. An example system may include an inspection robot having a payload coupled to at least two inspection sensors and a controller. The controller may include a route profile processing circuit to interpret route profile data for the inspection robot, a configuration determining circuit to determine one …
Who is the assignee on this patent?
Gecko Robotics Inc
What technology area does this patent fall under?
Primary CPC classification B25J9/1669. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jan 31 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).