Fluidic die with surface condition monitoring

US11559987B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11559987-B2
Application numberUS-201917058690-A
CountryUS
Kind codeB2
Filing dateJan 31, 2019
Priority dateJan 31, 2019
Publication dateJan 24, 2023
Grant dateJan 24, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

One example provides a fluidic die including a nozzle layer disposed on a substrate, the nozzle layer having an upper surface opposite the substrate and including a plurality of nozzles formed therein, each nozzle including a fluid chamber and a nozzle orifice extending through the nozzle layer from the upper surface to the fluid chamber. A conductive trace is exposed to the upper surface of the nozzle layer and extends proximate to a portion of the nozzle orifices, an impedance of the conductive trace indicative of a surface condition of the upper surface of the nozzle layer.

First claim

Opening claim text (preview).

The invention claimed is: 1. A fluidic die comprising: a substrate; a nozzle layer disposed on the substrate, the nozzle layer having an upper surface opposite the substrate and including a plurality of nozzles formed therein, each nozzle including a fluid chamber and a nozzle orifice extending through the nozzle layer from the upper surface to the fluid chamber; a conductive trace exposed to the upper surface of the nozzle layer and extending proximate to and spaced from a portion of the nozzle orifices; and control logic to monitor impedance of the conductive trace, and to compare the monitored impedance to known expected impedance values to determine a temperature and a presence of fluid at the upper surface of the nozzle layer. 2. The fluidic die of claim 1 , the conductive trace extending along opposite sides of the portion of nozzle orifices. 3. The fluidic die of claim 1 , the portion of nozzle orifices comprising a column of nozzles. 4. The fluidic die of claim 1 , the conductive trace embedded within the nozzle layer with a portion exposed to the upper surface. 5. The fluidic die of claim 1 , the conductive trace disposed on the upper surface of the nozzle layer. 6. The fluidic die of claim 1 , an impedance of the conductive trace indicating a presence of a fluid puddle on the upper surface which is simultaneously in contact with the conductive trace on each side of a column of nozzle orifices. 7. The fluidic die of claim 1 , the conductive trace having a temperature-dependent resistance indicative of the temperature of the upper surface of the nozzle layer. 8. The fluidic die of claim 1 , the impedance of the conductive trace in a first range indicating a temperature of the upper surface and in a second range indicating a presence of fluid on the upper surface. 9. The fluidic die of claim 1 , the conductive trace including: a first segment and a second segment extending on opposite sides of the portion of nozzle orifices; and a third segment extending laterally to and joining the first and second segments to form a continuous conductive trace. 10. The fluidic die of claim 9 , the third segment having a length selected to increase a signal-to-noise ratio of an electrical property of the conductive trace. 11. A printhead comprising: a fluidic die including: a substrate; a nozzle layer disposed on the substrate and having an upper surface opposite the substrate, the nozzle layer including a plurality of nozzles formed therein, each nozzle including a fluid chamber and a nozzle orifice extending through the nozzle layer from the upper surface to the fluid chamber; and a conductive trace exposed to the upper surface of the nozzle layer and extending proximate to and spaced from a portion of the nozzle orifices; and a monitoring circuit to monitor an impedance of the conductive trace, and to compare the monitored impedance to known expected impedance values to determine a temperature and a presence of fluid at the upper surface of the nozzle layer. 12. A method of monitoring a fluidic die including: disposing a conductive trace exposed to an upper surface of a nozzle layer of a fluidic die, the conductive trace extending proximate to and spaced from a group of nozzle orifices of a plurality of nozzles formed in the nozzle layer; monitoring an impedance of the conductive trace; and comparing the monitored impedance to known expected impedance values to determine a temperature and a presence of fluid at the upper surface of the nozzle layer. 13. The method of claim 12 , wherein known expected impedance values in a first range are indicative of the temperature, and known expected impedance values in a second range are indicative of the presence of fluid.

Assignees

Inventors

Classifications

  • Structure of nozzle plates · CPC title

  • controlling heads based on piezoelectric elements · CPC title

  • Structure of print heads with piezoelectric elements · CPC title

  • detecting head temperature; Ink temperature · CPC title

  • Structure of bubble jet print heads · CPC title

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Frequently asked questions

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What does patent US11559987B2 cover?
One example provides a fluidic die including a nozzle layer disposed on a substrate, the nozzle layer having an upper surface opposite the substrate and including a plurality of nozzles formed therein, each nozzle including a fluid chamber and a nozzle orifice extending through the nozzle layer from the upper surface to the fluid chamber. A conductive trace is exposed to the upper surface of th…
Who is the assignee on this patent?
Hewlett Packard Development Co
What technology area does this patent fall under?
Primary CPC classification B41J2/04563. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jan 24 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).