Apparatus for generating charged particles
US-2018139835-A1 · May 17, 2018 · US
Sample analyzer and analyzing method thereof
US11555779B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11555779-B2 |
| Application number | US-202016842487-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 7, 2020 |
| Priority date | Apr 9, 2019 |
| Publication date | Jan 17, 2023 |
| Grant date | Jan 17, 2023 |
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- Title
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- Abstract
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- First independent claim
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Abstract
Official abstract text for this publication.
The present disclosure provides a sample analyzer and an analyzing method thereof. The sample analyzer includes a first beam source configured to provide a first energy beam to a sample, a second beam source configured to provide a second energy beam, which is different from the first energy beam, to the sample, a reflected beam sensor disposed between the second beam source and the sample to detect a reflected beam of the second energy beam, which is reflected by one side of the sample, and a transmitted beam sensor disposed adjacent to the other side of the sample to detect a transmitted beam of the second energy beam.
First claim
Opening claim text (preview).
What is claimed is: 1. A sample analyzer comprising: a first beam source configured to provide a first energy beam to a sample; a second beam source configured to provide a second energy beam, which is different from the first energy beam, to the sample; a reflected beam sensor disposed between the second beam source and the sample to detect a reflected beam of the second energy beam, which is reflected by one side of the sample; and a transmitted beam sensor disposed adjacent to the other side of the sample to detect a transmitted beam of the second energy beam, wherein the transmitted beam sensor comprises a radiation sensor, an electron sensor disposed between the sample and the radiation sensor, and a proton sensor disposed between the sample and the electron sensor. 2. The sample analyzer of claim 1 , wherein the second beam source is a multi-energy beam generator. 3. The sample analyzer of claim 2 , wherein the second energy beam is a multi-energy beam comprising an ultraviolet ray, an ion particle, a proton, an electron, and a radiation. 4. The sample analyzer of claim 1 , wherein the transmitted beam sensor further comprises an ion sensor disposed between the sample and the proton sensor.
Assignees
Inventors
Classifications
Investigating crystals, e.g. liquid crystals · CPC title
using heat to ionise a gas · CPC title
A physical transformation being implied in the method, e.g. a phase change · CPC title
Coherent sources; lasers · CPC title
- G01N21/55Primary
Specular reflectivity · CPC title
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Frequently asked questions
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- What does patent US11555779B2 cover?
- The present disclosure provides a sample analyzer and an analyzing method thereof. The sample analyzer includes a first beam source configured to provide a first energy beam to a sample, a second beam source configured to provide a second energy beam, which is different from the first energy beam, to the sample, a reflected beam sensor disposed between the second beam source and the sample to d…
- Who is the assignee on this patent?
- Electronics & Telecommunications Res Inst
- What technology area does this patent fall under?
- Primary CPC classification G01N21/55. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jan 17 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).