Method for analyzing malfunctions in a system of process automation

US11550312B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11550312-B2
Application numberUS-201716348963-A
CountryUS
Kind codeB2
Filing dateOct 10, 2017
Priority dateNov 11, 2016
Publication dateJan 10, 2023
Grant dateJan 10, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The invention comprises a method for analyzing malfunctions and/or changes of device statuses in a system of automation technology, wherein the system has a plurality of field devices communicating with one another directly via a communication network and being designed to issue an appropriate diagnostic notice depending on a malfunction or a change of a device status in the system. The diagnostic notices are transmitted to a data bank and stored in same. The method comprises: reading the diagnostic notices from the data bank; filtering the read diagnostic notices using at least one selection criterion; linking the filtered diagnostic notices using time stamps; defining time intervals; grouping the diagnostic notices linked using the time stamps into the defined time intervals which correspond to their respective time stamps; and evaluating the grouped diagnostic notices with regard to defined abnormalities.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for analyzing malfunctions and changes in device statuses in a system of automation technology, wherein the system includes a plurality of field devices, wherein the field devices communicate with one another directly via a communications network or via a communications unit, and the field devices are designed to issue an appropriate diagnostic notice depending upon a malfunction or a change in a device status in the system, and wherein the diagnostic notices are transmitted to a data bank and stored therein, the method comprising: reading the diagnostic notices from the data bank; filtering the read diagnostic notices according to a time period; filtering the read diagnostic notices using a selection criterion; linking the filtered diagnostic notices using time stamps, wherein a time stamp contains a date of occurrence of a malfunction contained in the corresponding diagnostic notice; dividing the time period into time intervals of equal time; grouping the linked diagnostic notices into the time intervals that correspond to their time stamps; creating a heat map from the grouped diagnostic notices, wherein along a first axis of the heat map is the plurality of field devices and along a second axis of the heat map are time intervals, whereby a grid is defined by the first and second axes, and wherein the creating of the heat map includes marking each occurrence of a diagnostic notice in the grid of the heat map at an intersection of a field device that issued the diagnostic notice and a time interval in which the diagnostic notice was issued; and evaluating the grouped diagnostic notices via evaluating the heat map with regard to defined abnormalities. 2. The method according to claim 1 , further comprising: creating a proposal for correcting a cause of the malfunctions and the changes in the device statuses, wherein the proposal is based on the evaluation of the grouped diagnostic notices. 3. The method according to claim 1 , wherein a computer unit evaluates the diagram using algorithms implemented on the computer unit, including algorithms for image or pattern recognition and algorithms for cluster detection. 4. The method according to claim 1 , wherein the diagnostic notices are generated within a field device upon occurrence of at least one of the following malfunctions or changes in device statuses of the respective field device: a communications error of the respective field device; insufficient power supply or shutdown, or restart of the respective field device; a maintenance requirement of the respective field device; a measurement error generated by the respective field device; an error of at least one electronic component of the respective field device; an error of at least one software component of the respective field device; exceeding defined measuring ranges; and falling below the defined measuring ranges. 5. The method according to claim 1 , wherein the read diagnostic notices are filtered based upon at least one of the following selection criteria: the device type of the field devices; the type of malfunction, or the change in the device status; the system sector in which the respective field devices are integrated; the respective communications unit with which the respective field devices communicate; a respective communications structure of the field devices; environmental influences which act on the corresponding field devices; an operating period of the respective field devices; an age of the field devices; a serial number and a range of serial numbers; a product batch of the field devices; components of a supplier used for the system; and the respective communications unit with which the respective field devices communicate. 6. The method according to claim 1 , wherein the grouped diagnostic notices are evaluated with regard to at least one of the following abnormalities: increasing occurrence of diagnostic notices of one or more of the field devices during one of the predetermined time intervals; increasing occurrence of diagnostic notices with regard to a specific device type of the field devices; increasing occurrence of diagnostic notices with regard to a respective communications structure of the field devices; increasing occurrence of diagnostic notices with regard to a respective communications protocol of the field devices; increasing occurrence of diagnostic notices with regard to process parameters of the field devices; increasing occurrence of diagnostic notices with regard to a process medium with which the corresponding field devices come into contact; increasing occurrence of diagnostic notices with regard to positions of the corresponding field devices in the system; increasing occurrence of diagnostic notices with regard to environmental influences on the corresponding field devices; increasing occurrence of diagnostic notices with regard to the age of the field devices; increasing occurrence of diagnostic notices with regard to an installation height of the corresponding field devices; increasing occurrence of diagnostic notices with regard to a type of installation of the corresponding field devices; increasing occurrence of diagnostic notices with regard to a version number of firmware of the field devices; increasing occurrence of diagnostic notices with regard to a version number of a communications protocol of the field devices; increasing occurrence of diagnostic notices based upon material properties of the field devices; increasing occurrence of diagnostic notices with regard to a power supply of the field devices; and increasing occurrence of diagnostic notices with regard to maintenance and exchange plans of the field devices.

Assignees

Inventors

Classifications

  • Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user · CPC title

  • Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS] · CPC title

  • Control of logging system, e.g. decision on which data to store; time-stamping measurements · CPC title

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Frequently asked questions

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What does patent US11550312B2 cover?
The invention comprises a method for analyzing malfunctions and/or changes of device statuses in a system of automation technology, wherein the system has a plurality of field devices communicating with one another directly via a communication network and being designed to issue an appropriate diagnostic notice depending on a malfunction or a change of a device status in the system. The diagnos…
Who is the assignee on this patent?
Endress Hauser Process Solutions Ag
What technology area does this patent fall under?
Primary CPC classification G05B23/0272. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 10 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).