Device for imaging 1-D nanomaterials

Patent metadata

Field	Value
Publication number	US-11549890-B2
Application number	US-201816143510-A
Country	US
Kind code	B2
Filing date	Sep 27, 2018
Priority date	Aug 29, 2014
Publication date	Jan 10, 2023
Grant date	Jan 10, 2023

Abstract

A device for imaging one dimension nanomaterials is provided. The device includes an optical microscope with a liquid immersion objective, a laser device, and a spectrometer. The laser device is configured to provide an incident light beam with a continuous spectrum. The spectrometer is configured to obtain spectral information of the one dimensional nanomaterials.

First claim

What is claimed is:

1. A device for imaging one dimensional nanomaterials, consisting of:
an optical microscope with a liquid immersion objective;
a laser device configured to provide an incident light beam with a white continuous spectrum, wherein the incident light beam with the white continuous spectrum is configured to illuminate one dimensional nanomaterials to generate resonance Rayleigh scattering, and the one dimensional nanomaterials are a plurality of carbon nanotubes parallel with each other;
a container comprising a side wall and a bottom wall, wherein the side wall and the bottom wall together define a chamber, there are only the one dimensional nanomaterials, a substrate, and water in the chamber; the one dimensional nanomaterials is horizontally aligned on the substrate, and the substrate and the one dimensional nanomaterials are immersed into the water; the incident light beam with the white continuous spectrum passes through the side wall to reach the one dimensional nanomaterials, and the incident light beam is perpendicular to the side wall, so that an angle is formed between the incident light beam and the bottom wall, the angle is greater than 0 degrees, and the angle is also smaller than and equal to 45 degrees; and the laser device is located outside of the side wall of the container, and both the laser device and the one dimensional nanomaterials are located on the same side of the substrate; and
a spectrometer configured to obtain spectral information of the one dimensional nanomaterials.

2. The device of claim 1 , wherein the substrate consists of a silicon layer and a silicon dioxide layer coated on the silicon layer.

3. The device of claim 2 , wherein a thickness of the silicon dioxide layer is in a range from about 30 nanometers to about 300 nanometers.

4. The device of claim 2 , wherein the substrate defines a groove, and the plurality of carbon nanotubes are suspended on the groove.

5. A device for imaging one dimensional nanomaterials, consisting of:
an optical microscope with a liquid immersion objective;
a laser device configured to provide an incident light beam with a white continuous spectrum, wherein the incident light beam with the white continuous spectrum is configured to illuminate one dimensional nanomaterials to generate resonance Rayleigh scattering, and the one dimensional nanomaterials are a plurality of carbon nanotubes parallel with each other;
a container comprising a side wall and a bottom wall, wherein the side wall and the bottom wall together define a chamber, there are only the one dimensional nanomaterials, a substrate, and water in the chamber; the one dimensional nanomaterials is horizontally aligned on the substrate, and the substrate and the one dimensional nanomaterials are immersed into the water; the incident light beam with the white continuous spectrum passes through the side wall to reach the one dimensional nanomaterials, and the incident light beam is perpendicular to the side wall, so that an angle is formed between the incident light beam and the bottom wall, the angle is greater than 0 degrees, and the angle is also smaller than and equal to 45 degrees; and the laser device is located outside of the side wall of the container, and both the laser device and the one dimensional nanomaterials are located on the same side of the substrate;
a spectrometer configured to obtain spectral information of the one dimensional nanomaterials;
a filter configured to filter out infrared light of the incident light beam, wherein the filter is located in an optical path of the incident light beam;
a focusing lens configured to increase intensity of the incident light beam, wherein the focusing lens is located in the optical path of the incident light beam; and
a camera connected to the optical microscope.

6. The device of claim 5 , wherein an angle between the side wall and the bottom wall is in a range from 45 degrees to 90 degrees.

7. The device of claim 5 , wherein the substrate defines a groove, and the plurality of carbon nanotubes are suspended on the groove.

Assignees

• Univ Tsinghua
• Hon Hai Prec Ind Co Ltd

Inventors

• Wu wen-yun
• Yue Jing-Ying
• Lin xiao-yang
• Zhao Qing-Yu
• Jiang Kai-Li
• Fan Shou-Shan

Classifications

• B82B3/009

  Characterizing nanostructures, i.e. measuring and identifying electrical or mechanical constants · CPC title

• H01J2201/30469

  Carbon nanotubes (CNTs) · CPC title

• G01N21/65 Primary

  Raman scattering · CPC title

• G01N21/6458

  Fluorescence microscopy (fluorescence microscopes per se G02B21/0076 and G02B21/16) · CPC title

• G01N2021/4792

  Polarisation of scatter light · CPC title