Q-factor enhancement in resonant phase sensing of resistive-inductive-capacitive sensors

Patent metadata

Field	Value
Publication number	US-11537242-B2
Application number	US-201916294217-A
Country	US
Kind code	B2
Filing date	Mar 6, 2019
Priority date	Mar 29, 2018
Publication date	Dec 27, 2022
Grant date	Dec 27, 2022

Abstract

A system may include a resistive-inductive-capacitive sensor, a measurement circuit communicatively coupled to the resistive-inductive-capacitive sensor and configured to measure phase information associated with the resistive-inductive-capacitive sensor and based on the phase information, determine a displacement of a mechanical member relative to the resistive-inductive-capacitive sensor. The system may also include a Q factor enhancer communicatively coupled to the resistive-inductive-capacitive sensor and configured to control a Q factor of the resistive-inductive-capacitive sensor.

First claim

What is claimed is:

1. A system comprising:
a resistive-inductive-capacitive sensor;
a measurement circuit communicatively coupled to the resistive-inductive-capacitive sensor and configured to:
measure phase information associated with the resistive-inductive-capacitive sensor; and
based on the phase information, determine a displacement of a mechanical member relative to the resistive-inductive-capacitive sensor; and

a Q factor enhancer communicatively coupled to the resistive-inductive-capacitive sensor and configured to control a Q factor of the resistive-inductive-capacitive sensor.

2. The system of claim 1 , wherein the Q factor enhancer implements a negative impedance that at least partially cancels an impedance of the resistive-inductive-capacitive sensor.

3. The system of claim 1 , further comprising a Q factor detector coupled to the Q factor enhancer and configured to monitor the Q factor based on the phase information and based on amplitude information associated with the resistive-inductive-capacitive sensor.

4. The system of claim 3 , wherein the Q factor enhancer is further configured to control the Q factor to maintain the Q factor as measured by the Q factor detector within one or more predetermined thresholds.

5. The system of claim 4 , wherein the Q factor enhancer and the Q factor detector form at least a portion of a control loop that comprises at least one of a feedforward path and a feedback path.

6. The system of claim 5 , wherein a bandwidth of the control loop is set to avoid interference with an algorithm of the measurement circuit for determining the displacement of the mechanical member.

7. The system of claim 5 , wherein the Q factor detector determines whether the Q factor is within the one or more predetermined thresholds based on at least one or more of a slope of a phase of the resistive-inductive-capacitive sensor as indicated by the phase information, an absolute phase of the resistive-inductive-capacitive sensor as indicated by the phase information, and an amplitude as indicated by the amplitude information.

8. The system of claim 7 , wherein the measurement circuit is configured to account for modification of the Q factor by the Q factor enhancer in determining the phase information.

9. The system of claim 5 , wherein the control loop controls the Q factor in such a manner to prevent oscillation of the resistive-inductive-capacitive sensor.

10. The system of claim 1 , wherein the measurement circuit comprises a coherent incident/quadrature detector and the measurement circuit is configured to measure the phase information using the coherent incident/quadrature detector.

11. A method comprising:
measuring phase information associated with the resistive-inductive-capacitive sensor;
based on the phase information, determining a displacement of a mechanical member relative to the resistive-inductive-capacitive sensor; and
controlling a Q factor of the resistive-inductive-capacitive sensor with a Q factor enhancer communicatively coupled to the resistive-inductive-capacitive sensor.

12. The method of claim 11 , wherein the Q factor enhancer implements a negative impedance that at least partially cancels an impedance of the resistive-inductive-capacitive sensor.

13. The method of claim 11 , further comprising monitoring the Q factor based on the phase information and based on amplitude information associated with the resistive-inductive-capacitive sensor with a Q factor detector coupled to the Q factor enhancer.

14. The method of claim 13 , further comprising controlling, with the Q factor enhancer, the Q factor to maintain the Q factor as measured by the Q factor detector within one or more predetermined thresholds.

15. The method of claim 14 , wherein the Q factor enhancer and the Q factor detector form at least a portion of a control loop that comprises at least one of a feedforward path and a feedback path.

16. The method of claim 15 , wherein a bandwidth of the control loop is set to avoid interference with an algorithm of the measurement circuit for determining the displacement of the mechanical member.

17. The method of claim 15 , further comprising determining, with the Q factor detector, whether the Q factor is within the one or more predetermined thresholds based on at least one or more of a slope of a phase of the resistive-inductive-capacitive sensor as indicated by the phase information, an absolute phase of the resistive-inductive-capacitive sensor as indicated by the phase information, and an amplitude as indicated by the amplitude information.

18. The method of claim 17 , further comprising accounting for modification of the Q factor by the Q factor enhancer in determining the phase information.

19. The method of claim 15 , wherein the control loop controls the Q factor in such a manner to prevent oscillation of the resistive-inductive-capacitive sensor.

20. The method of claim 11 , wherein measuring the phase information comprises measuring the phase information with a coherent incident/quadrature detector.

Assignees

• Cirrus Logic Int Semiconductor Ltd
• Cirrus Logic Inc

Inventors

• Das Tejasvi
• Maru Siddharth
• You Zhong
• Lapointe Luke

Classifications

• H03K17/9537 Primary

  in a resonant circuit · CPC title

• G06F3/045

  using resistive elements, e.g. a single continuous surface or two parallel surfaces put in contact · CPC title

• G06F3/0416

  Control or interface arrangements specially adapted for digitisers · CPC title

• G06F3/044 Primary

  by capacitive means · CPC title