Reflective bijective method and device for coded aperture image acquisition and reconstruction

US11531195B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11531195-B2
Application numberUS-201716082132-A
CountryUS
Kind codeB2
Filing dateMar 7, 2017
Priority dateMar 8, 2016
Publication dateDec 20, 2022
Grant dateDec 20, 2022

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Abstract

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A bijective coded aperture system uses mirror system with a multitude of reflector elements attached to an absorbing, such as black, substrate. Each of the reflector elements is independently placed at a different angle with respect to each other in such a manner that the image of the scene is replicated several times at the focal plane and on the image sensor. Moreover, these replicated images may be overlapping. An image processor can then execute reconstruction methods of the image to faithfully represent the scene.

First claim

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What is claimed is: 1. A coded aperture imaging system, comprising: a tip/tilt mirror system for reflecting light from a scene, the tip/tilt mirror system comprising reflector elements that are positioned at different angles with respect to each other relative to an x, y plane of the tip/tilt mirror system in which the reflector elements have different combinations of rotation around an x axis, angle θ, and rotation around a y axis, angle φ; an objective lens system for collecting the light from the tip/tilt mirror system; and an image sensor for detecting the light from the objective lens system, wherein the different rotation angles θ, φ of the reflector elements fall within a range in which the light from the scene is reflected by the reflector elements within a numerical aperture of the objective lens system to replicate an image of the scene several times on the image sensor; an image processor for recovering the image of the scene based on the positioning of the reflector elements; wherein the tip/tilt mirror system provides positional feedback concerning an angular position of each of the reflector elements used by the image processor to resolve encoding performed by the tip/tilt mirror system and thereby facilitates decoding of the image detected by the image sensor. 2. A system as claimed in claim 1 , wherein at least some of the reflector elements are spaced away from the plane of the tip/tilt mirror system. 3. A system as claimed in claim 1 , wherein the reflector elements are each planar mirrors. 4. A system as claimed in claim 1 , wherein the reflector elements are supported on an absorbing substrate. 5. A system as claimed in claim 1 , wherein the tip/tilt mirror system comprises a micro electromechanical system (MEMS) tip/tilt mirror array. 6. A system as claimed in claim 1 , wherein the image sensor is located at a focal distance of the objective lens system. 7. A system as claimed in claim 1 , wherein the image processor determines a mapping between the scene and the image detected by the image sensor. 8. A system as claimed in claim 1 , wherein only a portion of the image detected by the image sensor is transmitted by an image processor to effect image compression of the scene. 9. A system as claimed in claim 1 , wherein the image sensor is placed within the Fraunhaufer regime of an optical field. 10. A system as claimed in claim 1 , wherein a distance to the scene is at least 10 times larger than a diameter of the objective lens system. 11. A system as claimed in claim 1 , wherein parts of the scene are imaged to different portions of the image sensor requiring an image detected by the image sensor to be decoded to recover an actual image of the scene. 12. A system as claimed in claim 1 , wherein each of the reflector elements comprise one or more θtorsion arms and one or more φ torsion arms, which are connected to each other via a gimbal ring. 13. A system as claimed in claim 1 , wherein the tip/tilt mirror system comprises more than 1000 reflector elements. 14. A system as claimed in claim 1 , wherein the rotation around the x axis, angle θ, and rotation around the y axis, angle φ is actively controlled by the image processor. 15. A coded aperture imaging method, comprising: reflecting light from a scene with reflector elements that are positioned at different angles with respect to each other relative to an x, y plane of a tip/tilt mirror system, wherein the tip/tilt mirror system comprises a tip/tilt mirror array which is actively controlled in which the reflector elements have different combinations of rotation around an x axis, angle θ, and rotation around a y axis, angle φ; collecting the light from the tip/tilt mirror system with an objective lens system; and detecting the collected light with an image sensor; recovering the image of the scene based on the positioning of the reflector elements with an image processor; wherein the different rotation angles θ, φ of the reflector elements fall within a range in which the light from the scene is reflected by the reflector elements within a numerical aperture of the objective lens system to replicate an image of the scene several times on the image sensor and wherein the tip/tilt mirror system provides positional feedback concerning an angular position of each of the reflector elements used by the image processor to resolve encoding performed by the tip/tilt mirror system and thereby facilitate decoding of the image detected by the image sensor. 16. A method as claimed in claim 15 , wherein at least some of the reflector elements are spaced away from the plane of the tip/tilt mirror system. 17. A method as claimed in claim 15 , wherein the reflector elements are each planar mirrors. 18. A method as claimed in claim 15 , wherein the reflector elements are supported on an absorbing substrate. 19. A method as claimed in claim 15 , wherein the image sensor is located at a focal distance of the objective lens system. 20. A method as claimed in claim 15 , further comprising recovering the image of the scene based on the positioning of the reflector elements. 21. A method as claimed in claim 15 , further comprising determining a mapping between the scene and the image detected by the image sensor. 22. An imaging system, comprising: a tip/tilt mirror system for reflecting light from a scene, the tip/tilt mirror system comprising a MEMS mirror array comprising reflector elements that are positioned at different angles with respect to each other in which the reflector elements have different combinations of rotation around an x axis, angle θ, and rotation around a y axis, angle φ; an objective lens system for collecting the light from the tip/tilt mirror system; and an image sensor for detecting the light from the objective lens system, wherein the different rotation θ, φ angles of the reflector elements fall within a range in which the light from the scene is reflected by the reflector elements within a numerical aperture of the objective lens system to replicate an image of the scene several times on the image sensor; wherein the tip/tilt mirror system provides positional feedback concerning an angular position of each of the reflector elements used by an image processor to resolve encoding performed by the tip/tilt mirror system and thereby facilitates decoding of the image detected by the image sensor. 23. The method as claimed in claim 15 , further comprising: determining a mapping of the aperture using machine learning.

Assignees

Inventors

Classifications

  • the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD (G02B26/0825 takes precedence; micromechanical devices in general B81B) · CPC title

  • Coded aperture imaging · CPC title

  • Machine learning · CPC title

  • for mirrors · CPC title

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What does patent US11531195B2 cover?
A bijective coded aperture system uses mirror system with a multitude of reflector elements attached to an absorbing, such as black, substrate. Each of the reflector elements is independently placed at a different angle with respect to each other in such a manner that the image of the scene is replicated several times at the focal plane and on the image sensor. Moreover, these replicated images…
Who is the assignee on this patent?
Charles Stark Draper Laboratory Inc
What technology area does this patent fall under?
Primary CPC classification G02B26/0833. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 20 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).