Surface emitting laser element, illumination device, projection device, measurement device, robot, electronic apparatus, mobile body, and modeling device

Patent metadata

Field	Value
Publication number	US-11527867-B2
Application number	US-202016814077-A
Country	US
Kind code	B2
Filing date	Mar 10, 2020
Priority date	Mar 20, 2019
Publication date	Dec 13, 2022
Grant date	Dec 13, 2022

Abstract

A plurality of surface emitting lasers are formed on the single surface emitting laser element. The plurality of surface emitting lasers have respective emission wavelengths selected from wavelengths satisfying condition of:0<λ1−λs≤5.36×10−5λc2−×5.83×10−2λc+32.4where a first emission wavelength is λ1 [nm], a second emission wavelength shorter than the first emission wavelength is λs [nm], and a middle wavelength between the first emission wavelength and the second emission wavelength is λc [nm]. At least one of the plurality of surface emitting lasers has an emission wavelength different from an emission wavelength of another surface emitting laser.

First claim

What is claimed is:

1. A surface emitting laser element on a semiconductor substrate, wherein
a plurality of surface emitting lasers are on a single surface emitting laser element,
the plurality of surface emitting lasers have respective emission wavelengths selected from wavelengths satisfying condition of:
0<λ 1 −λ s ≤5.36×10 −5 λ c 2 −5.83×10 −2 λ c +32.4

where a first emission wavelength is λ 1 (nm), a second emission wavelength shorter than the first emission wavelength is λ s (nm), and a middle wavelength between the first emission wavelength and the second emission wavelength is λ c (nm), and
at least one of the plurality of surface emitting lasers has an emission wavelength different from an emission wavelength of another surface emitting laser,
the surface emitting laser element further comprising:
a lower Bragg reflecting mirror on the substrate;
a resonator on the lower Bragg reflecting mirror and including an active layer; and
an upper Bragg reflecting mirror on the resonator, wherein
the upper Bragg reflecting mirror includes a first upper Bragg reflecting mirror, a wavelength adjustment region, and a second upper Bragg reflecting mirror, in order from the substrate,
the wavelength adjustment region includes a first phase adjustment layer, a number of wavelength adjustment layers, and a second phase adjustment layer, in order from the substrate, and
an optical film thickness difference d being a difference between a total of optical film thicknesses of wavelength adjustment layers having the first emission wavelength, of the surface emitting laser and a total of optical film thicknesses of wavelength adjustment layers having the second emission wavelength, of the surface emitting laser is a film thickness difference satisfying condition of:
1.4×10 −5 λ c +5.8×10 −3 ≤d≤ 0.26.

2. The surface emitting laser element according to claim 1 , wherein:
the plurality of surface emitting lasers have respective emission wavelengths selected from wavelengths satisfying condition of:

λ
c
2

1.6
×

10
5

⁢
π

≤

λ
l

-

λ
s

≤

5.36
×

10

-
5

⁢

λ
c
2

-

5.83
×

10

-
2

⁢

λ
c

+
32.4

instead of the condition of:
0<λ 1 −λ s ≤5.36×10 −5 λ c 2 −5.83×10 −2 λ c +32.4.

3. An illumination device comprising:
the surface emitting laser element according to claim 1 ; and
an optical system configured to guide light from the surface emitting laser element.

4. A projection device comprising:
the illumination device according to claim 3 ; and
a light deflecting element configured to reflect the light guided with the optical system onto a projection region.

5. A measurement device comprising:
the projection device according to claim 4 ;
an imager to image the projection region; and
a measurer to measure a measurement target from an image of the projection region imaged with the imager.

6. A robot comprising:
the measurement device according to claim 5 ; and
an articulated arm to which the measurer is attached.

7. An electronic apparatus comprising:
the measurement device according to claim 5 ; and
an authenticator configured to perform authentication of a user based on a measurement result of the user by the measurement device.

8. A mobile body comprising:
the measurement device according to claim 5 ; and
a driving support configured to support driving of the mobile body based on a measurement result by the measurement device.

9. A modeling device comprising:
the measurement device according to claim 5 ; and
a modeler to model a modeled object based on a measurement result by the measurement device.

Assignees

• Ricoh Co Ltd

Inventors

• Nagasawa Kazuki
• Miki Yoshihiko
• Yoneda Kazuhiro
• Fukuoka Naoki

Classifications

• H01S5/187

  using Bragg reflection · CPC title

• H01S5/18313

  by oxidizing at least one of the DBR layers · CPC title

• H01S5/18358

  containing spacer layers to adjust the phase of the light wave in the cavity · CPC title

• H01S5/18355

  having a defined polarisation · CPC title

• H01S5/4087 Primary

  emitting more than one wavelength · CPC title