Open circuit diagnostic for pulsed solenoid I/P

US11525523B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11525523-B2
Application numberUS-202016779409-A
CountryUS
Kind codeB2
Filing dateJan 31, 2020
Priority dateJan 31, 2020
Publication dateDec 13, 2022
Grant dateDec 13, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Techniques for diagnosing failures in a digital solenoid I/P converter are provided herein. A controller of the I/P converter may apply a fixed voltage to an I/P coil of the I/P converter, causing an armature to move from an off-position to an on-position in a properly-functioning I/P converter. The controller may receive an indication of whether a digital logic line trip has occurred, indicating that a current for the I/P coil has reached a desired maximum current level. The controller may remove the fixed voltage applied to the I/P coil when the maximum current level is reached or when a threshold period of time has elapsed from the application of the fixed voltage to the I/P coil. The controller may diagnose, based on whether the digital logic line trip occurred prior to removing the fixed voltage, a failure in the I/P converter.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for diagnosing failures in a digital solenoid I/P converter of a field device in a process control system, wherein the digital solenoid I/P converter includes an I/P coil and drive circuitry, and wherein the digital solenoid I/P converter, when actuated, causes an armature to move from an off-position to an on-position, the method comprising: establishing that a fixed voltage has been applied to the I/P coil at a first time; establishing that the fixed voltage was removed from the I/P coil at a second time; receiving, from a current sensor, an indication of a current level associated with the I/P coil; performing a first comparison of the indication of the current level associated with the I/P coil and a desired maximum current level; causing, based on the comparison, a digital logic line to trip when the current level associated with the I/P coil reaches the desired maximum current level; performing a second comparison of whether the digital logic line trips before the second time; determining, based on the second comparison, whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed; and causing a controller to take a control action changing an operation of the process control system based on determining that one or more of the I/P coil or the drive circuitry has failed, wherein the control action includes switching from using the field device in the process control system to using a second, redundant field device in the process control system. 2. The method of claim 1 , wherein determining whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed further comprises: determining, based on the digital logic line tripping before the second time, that the I/P coil and drive circuitry are properly functioning. 3. The method of claim 1 , wherein determining whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed: determining, based on the digital logic line not tripping before the second time, that one or more of the I/P coil or the drive circuitry has failed. 4. The method of claim 3 , further comprising determining, based on the digital logic line not tripping before the second time, that one or more of the I/P coil or the drive circuitry has failed due to an open circuit in one or more of the I/P coil or the drive circuitry. 5. The method of claim 3 , further comprising: generating an alert based on determining that one or more of the I/P coil or the drive circuitry has failed. 6. A system for diagnosing failures in a digital solenoid I/P converter in a process control system, the system comprising: a digital solenoid I/P converter of a field device of the process control system, including an I/P coil and drive circuitry, the digital solenoid I/P converter being configured to cause an armature to move from an off-position to an on-position when actuated; a controller configured to cause a fixed voltage to be applied to the I/P coil at a first time and to remove the fixed voltage applied to the I/P coil at a second time, when the first of the following occurs: (i) the I/P coil reaches the desired maximum current level; or (ii) a threshold period of time has elapsed from the first time; a current sensor configured to sense an amount of current associated with the I/P coil; and a diagnostic circuit configured to: perform a first comparison of the sensed amount of current associated with the I/P coil and a maximum desired current level; cause, based on the first comparison, a digital logic line to trip when the sensed amount of current associated with the I/P coil reaches the maximum desired current level; perform a second comparison of whether the digital logic line has tripped after the first time; determine, based on the second comparison, whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed; and cause the controller to take a control action changing an operation of the process control system based on determining that one or more of the I/P coil or the drive circuitry has failed, wherein the control action includes switching from using the field device in the process control system to using a second, redundant field device in the process control system. 7. The system of claim 6 , wherein the diagnostic circuit is configured to determine, based on the digital logic line tripping before the second time, that the I/P coil and drive circuitry are properly functioning. 8. The system of claim 6 , wherein the diagnostic circuit is configured to determine, based on the digital logic line not tripping before the second time, that one or more of the I/P coil or the drive circuitry has failed. 9. The system of claim 8 , wherein the diagnostic circuit is configured to determine, based on the digital logic line not tripping before the second time, that one or more of the I/P coil or the drive circuitry has failed due to an open circuit in one or more of the I/P coil or the drive circuitry. 10. The system of claim 8 , wherein the diagnostic circuit is further configured to generate an alert based on determining that one or more of the I/P coil or the drive circuitry has failed.

Assignees

Inventors

Classifications

  • the actuated members consisting of multiple way valves · CPC title

  • Electromagnet aspects, e.g. electric supply therefor · CPC title

  • fluid passing through the solenoid coil · CPC title

  • Armature and valve member being one single element · CPC title

  • multiple way valves · CPC title

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What does patent US11525523B2 cover?
Techniques for diagnosing failures in a digital solenoid I/P converter are provided herein. A controller of the I/P converter may apply a fixed voltage to an I/P coil of the I/P converter, causing an armature to move from an off-position to an on-position in a properly-functioning I/P converter. The controller may receive an indication of whether a digital logic line trip has occurred, indicati…
Who is the assignee on this patent?
Fisher Controls Int Llc
What technology area does this patent fall under?
Primary CPC classification F16K31/0606. Mapped technology areas include Mechanical Engineering.
When was this patent published?
Publication date Tue Dec 13 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).