Automated analysis device

Patent metadata

Field	Value
Publication number	US-11506534-B2
Application number	US-201716472129-A
Country	US
Kind code	B2
Filing date	Oct 24, 2017
Priority date	Dec 27, 2016
Publication date	Nov 22, 2022
Grant date	Nov 22, 2022

Abstract

An automatic analysis apparatus comprises: a light source generating light having a center wavelength equal to or shorter than 340 nm; a fluorescent substance excited by the light source light, and generates light together with transmitted light from the light source, having a wavelength of 340 nm to 800 nm; a condenser lens; at least one slit; a reaction cell holding a reaction solution where a specimen and reagent are mixed, and that the light source light and the light from the fluorescent substance enter; and a detector that detects light transmitted through the reaction cell. The light source, fluorescent substance, condenser lens, and slit are provided along a straight light corresponding to the optical axis. The width of the slit's opening is equal to or narrower than the width of a ray forming an image of the light source at the position of the slit.

First claim

The invention claimed is:

1. An automatic analysis apparatus comprising:
a light source that generates light having a center wavelength equal to or shorter than 340 nm;
a fluorescent substance that is excited with the light of the light source to emit light, and that generates light having a wavelength of 340 nm to 800 nm, together with transmitted light from the light source;
a condenser lens;
a first slit;
a second slit;
a reaction cell that holds a reaction solution in which a specimen and a reagent are mixed, and both the light from the light source and the light from the fluorescent substance enter the reaction cell; and
a detector that detects light transmitted through the reaction cell,
wherein the light source, the fluorescent substance, the condenser lens, the first slit and the second slit are provided along a straight line corresponding to an optical axis,
wherein the first slit is provided between a front focal point of the condenser lens and the fluorescent substance, and the second slit is provided between a rear focal point of the condenser lens and the reaction cell,
wherein the width of an opening of the first slit is equal to or narrower than the width of a ray forming an image of the light source at the position of the first slit, and
wherein the width of an opening of the second slit is equal to or narrower than the width of a ray forming an image of the light source at the position of the second slit.

2. The automatic analysis apparatus according to claim 1 , wherein the light source is sealed with resin including the fluorescent substance.

3. The automatic analysis apparatus according to claim 2 ,
further comprising a holding member that holds the light source sealed with the resin and the first slit,
wherein the first slit is provided so as to be in contact with the resin.

4. The automatic analysis apparatus according to claim 1 ,
further comprising a member including the fluorescent substance,
wherein the member including the fluorescent substance is resin including the fluorescent substance or glass coated with the fluorescent substance, and is provided on an optical axis of the light source.

5. The automatic analysis apparatus according to claim 4 ,
further comprising a holding member that holds the member including the fluorescent substance and the light source,
wherein the member including the fluorescent substance and the light source are configured individually separable from the holding member.

6. The automatic analysis apparatus according to claim 5 ,
wherein the holding member further holds the first slit, and
wherein the first slit is provided so as to be in contact with the member including the fluorescent substance.

7. The automatic analysis apparatus according to claim 1 ,
wherein the light source is a light emitting diode, and
wherein the apparatus further comprises a temperature stabilizer that cools and temperature-stabilizes the light source to 25° C. or less.

8. The automatic analysis apparatus according to claim 7 ,
wherein the temperature stabilizer includes a Peltier device.

Assignees

• Hitachi High Tech Corp
• Hitachi High Tech Corp

Inventors

• Ishida Takeshi
• Yamazaki Isao
• Adachi Sakuichiro
• Imamura Shin

Classifications

• G01N21/272

  for following a reaction, e.g. for determining photometrically a reaction rate (photometric cinetic analysis) · CPC title

• G01N2201/0453

  Multicell sequential and multitest, e.g. multiwavelength · CPC title

• G01N2201/062

  LED's · CPC title

• G01N21/253 Primary

  for batch operation, i.e. multisample apparatus (analytical automats G01N35/00) · CPC title

• G01N21/255

  Details, e.g. use of specially adapted sources, lighting or optical systems · CPC title