X-ray imaging method and system thereof

Patent metadata

Field	Value
Publication number	US-11506487-B2
Application number	US-202017099187-A
Country	US
Kind code	B2
Filing date	Nov 16, 2020
Priority date	Mar 6, 2020
Publication date	Nov 22, 2022
Grant date	Nov 22, 2022

Abstract

An X-ray imaging method includes the following steps: (a) performing a first object imaging and obtaining a first object intensity signal by detecting an X-ray passing through a first object; (b) performing baseline imaging process, obtaining a baseline intensity signal by detecting the X-ray when the first object is not in a FOV; and; (c) obtaining the first thickness of the first object by performing operations on the first object intensity signal, the baseline intensity signal, and the first attenuation coefficient of the first object.

First claim

What is claimed is:

1. An X-ray imaging method, comprising:
(a) performing a first object imaging process to obtain a first object image by detecting a plurality of X-rays of a X-ray source passing through a first object in an field of view (FOV);
(b) performing a baseline imaging process to obtain a baseline image by detecting the X-rays when the first object is not in the FOV;
(c) obtaining a first thickness of the first object based on the first object image, the baseline image, and a first attenuation coefficient of the first object;
(d) performing a second object imaging process to obtain a second object image by detecting the X-rays passing through a second object in the FOV;
(e) obtaining a second thickness of the second object based on the second object image, the baseline image, and a second attenuation coefficient of the second object;
(f) subtracting the first thickness from the second thickness to obtain a sample thickness, wherein the first object is a carrier, the second object comprises a sample and the carrier;
(g) obtaining a number of residual photons base on the baseline image, the sample thickness, and a sample absorption coefficient; and
(h) obtaining the number of absorbed photons in the sample based on the baseline image and the number of residual photons.

2. The X-ray imaging method of claim 1 , wherein obtaining the first thickness in step (c) further comprises:
(c-1) calculating an X-ray energy spectrum of the baseline image and the first attenuation coefficient to obtain a first thickness characteristic curve; and
(c-2) obtaining the first thickness based on the first thickness characteristic curve and the first object image.

3. The X-ray imaging method of claim 2 , wherein the first thickness characteristic curve is obtained through a function, and the function includes:

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Assignees

• Delta Electronics Inc

Inventors

• Chen Sih-Yu
• Lee Jhih-Shian

Classifications

• A61B6/5217 Primary

  extracting a diagnostic or physiological parameter from medical diagnostic data · CPC title

• G01T1/08 Primary

  Photographic dosimeters {(photometry G01J1/52)} · CPC title

• G01B15/025 Primary

  by measuring absorption · CPC title

• G01N23/04

  and forming images of the material · CPC title

• A61B6/544

  dependent on patient size · CPC title