Semiconductor device

Patent metadata

Field	Value
Publication number	US-11495678-B2
Application number	US-202117318894-A
Country	US
Kind code	B2
Filing date	May 12, 2021
Priority date	Jul 29, 2020
Publication date	Nov 8, 2022
Grant date	Nov 8, 2022

Abstract

A semiconductor device includes a semiconductor substrate, a transistor region, a diode region, a boundary trench gate, and a carrier control region. The boundary trench gate is provided in a boundary portion between the transistor region and the diode region. The carrier control region is provided as a surface layer of the semiconductor substrate at a position closer to the boundary trench gate than the source layer located between the boundary trench gate and the trench gate. A concentration of first conductivity type impurities contained in the carrier control region is higher than a concentration of the first conductivity type impurities contained in the source layer or a concentration of second conductivity type impurities contained in the carrier control region is lower than a concentration of the second conductivity type impurities contained in the source layer.

First claim

What is claimed is:

1. A semiconductor device comprising:
a semiconductor substrate;
a transistor region in which a transistor is formed, the transistor including a first conductivity type base layer provided in a surface layer of the semiconductor substrate, a second conductivity type source layer selectively provided in a surface layer of the base layer, and a trench gate that extends so as to cross the source layer in plan view;
a diode region that is disposed adjacent to the transistor region and in which a diode is formed;
a boundary trench gate provided in a boundary portion between the transistor region and the diode region; and
a carrier control region provided as the surface layer of the semiconductor substrate at a position closer to the boundary trench gate than the source layer located between the boundary trench gate and the trench gate, wherein
a concentration of first conductivity type impurities contained in the carrier control region is higher than a concentration of the first conductivity type impurities contained in the source layer or a concentration of second conductivity type impurities contained in the carrier control region is lower than a concentration of the second conductivity type impurities contained in the source layer.

2. The semiconductor device according to claim 1 , wherein
the source layer located between the boundary trench gate and the trench gate is in contact with the trench gate and is not in contact with the boundary trench gate.

3. The semiconductor device according to claim 1 , wherein
the carrier control region includes the base layer provided between the source layer and the boundary trench gate.

4. The semiconductor device according to claim 1 , wherein
the transistor region includes a first conductivity type contact layer formed in the surface layer of the base layer as the surface layer of the semiconductor substrate between the boundary trench gate and the trench gate,
the source layer and the contact layer provided between the boundary trench gate and the trench gate are alternately arranged in an extension direction of the trench gate, and
a concentration of the first conductivity type impurities contained in the contact layer is higher than a concentration of the first conductivity type impurities contained in the base layer.

5. The semiconductor device according to claim 1 , wherein
the carrier control region includes a first conductivity type contact layer formed in a surface layer of the base layer provided between the source layer and the boundary trench gate, and
a concentration of the first conductivity type impurities contained in the contact layer is higher than a concentration of the first conductivity type impurities contained in the base layer.

6. The semiconductor device according to claim 5 , wherein
the contact layer is formed to a deeper position than the source layer.

7. The semiconductor device according to claim 1 , wherein
the diode region includes:
a first conductivity type anode layer provided in the surface layer on an upper surface side of the semiconductor substrate; and
a second conductivity type cathode layer provided in a surface layer on a lower surface side of the semiconductor substrate, and

the cathode layer extends to the transistor region.

8. The semiconductor device according to claim 1 , wherein
the transistor region includes:
the base layer and the source layer provided in the surface layer on an upper surface side of the semiconductor substrate;
a first conductivity type collector layer provided in a surface layer on a lower surface side of the semiconductor substrate; and
a second conductivity type drift layer between the base layer and the collector layer,

the trench gate penetrates the source layer and the base layer from the upper surface of the semiconductor substrate and reaches the drift layer,
the transistor is an insulated gate bipolar transistor (IGBT) including the source layer, the base layer, the drift layer, the trench gate, and the collector layer,
the diode region includes:
a first conductivity type anode layer provided in the surface layer on the upper surface side of the semiconductor substrate;
a second conductivity type cathode layer provided in the surface layer on the lower surface side of the semiconductor substrate; and
the drift layer between the anode layer and the cathode layer,

the diode is a freewheeling diode including the anode layer, the cathode layer, and the drift layer, and
the insulated gate bipolar transistor and the freewheeling diode provided on the semiconductor substrate form a reverse conducting IGBT.

Assignees

• Mitsubishi Electric Corp

Inventors

• Harada Kenji
• Otsuka Kakeru
• Oki Hirofumi

Classifications

• H10D62/129

  Cathode regions of diodes · CPC title

• H10D8/00

  Diodes (variable-capacitance diodes H10D1/64; gated diodes H10D12/00) · CPC title

• H10D62/128

  Anode regions of diodes · CPC title

• H01L29/1095

  Electricity · mapped topic

• H01L29/7397 Primary

  Electricity · mapped topic