System and method for individual particle sizing using light scattering techniques

Patent metadata

Field	Value
Publication number	US-11480509-B2
Application number	US-202016856915-A
Country	US
Kind code	B2
Filing date	Apr 23, 2020
Priority date	Oct 2, 2015
Publication date	Oct 25, 2022
Grant date	Oct 25, 2022

Abstract

A particle sizing system is provided that includes an optical source generating a light beam for illuminating particles in a monitored volume, a plurality of light deflectors, each positioned to receive and deflect light scattered by the particles, and an image capture device collecting scattered light deflected by each light deflector. The image capture device outputs an image including a plurality of sub-images, each generated from the collected light deflected from a respective one of the light deflectors. Each particle is imaged as a spot in each sub-image, the plurality of spots associated with each particle corresponding to a plurality of scattering angles. The system also includes a processing unit configured to identify the spots associated with each particle in the sub-images, compute a spot parameter associated with each spot, and determine the size of each particle from its related spot parameters. A particle sizing method is also provided.

First claim

The invention claimed is:

1. A system for particle analysis using light scattering, the system comprising:
a plurality of light deflectors configured to deflect light scattered by particles in response to illumination light;
an image capture device configured to collect scattered light deflected by the plurality of light deflectors and generate from the collected scattered light an image comprising a plurality of sub-images respectively associated with the plurality of light deflectors, the plurality of sub-images representing the light scattered by the particles in a respective plurality of scattering angle ranges; and
a processor configured to receive the image from the image capture device, analyze the plurality of sub-images of the image, and determine therefrom one or more characteristics of the particles.

2. The system of claim 1 , further comprising an optical source configured to generate the illumination light to illuminate the particles.

3. The system of claim 2 , wherein the optical source comprises one or a plurality of monochromatic light sources.

4. The system of claim 1 , wherein the processor is configured to identify the particles as spots in the plurality of sub-images and determine the one or more characteristics of the particles from size, shape, location, intensity, polarization, temporal, or spectral information associated with the identified spots, or a combination thereof.

5. The system of claim 1 , wherein the light deflectors comprise light reflectors.

6. The system of claim 1 , wherein the light deflectors comprise optical filters to deflect light scattered by the particles in a spectrally selective manner.

7. The system of claim 1 , wherein the image capture device has spectrally resolved imaging capabilities, temporally resolved imaging capabilities, or both.

8. The system of claim 1 , wherein the collected scattered light comprises scattered light that is wavelength-shifted with respect to the illumination light.

9. The system of claim 8 , wherein the wavelength-shifted scattered light comprises fluorescent light.

10. The system of claim 1 , wherein the one or more characteristics of the particles comprise composition information.

11. The system of claim 10 , wherein the one or more characteristics of the particles further comprise size, shape, phase, or position information, or a combination thereof.

12. A method of particle analysis using light scattering, comprising:
illuminating particles with illumination light; deflecting, with a plurality of light deflectors, light scattered by the particles in response to the illumination light;
using an image capture device to collect scattered light deflected by the plurality of light deflectors, and generating, from the collected scattered light, an image comprising a plurality of sub-images respectively associated with the plurality of light deflectors, the plurality of sub-images representing the light scattered by the particles in a respective plurality of scattering angle ranges and conveying information indicative of one or more characteristics of the particles; and
analyzing the plurality of sub-images and determining therefrom the one or more characteristics of the particles.

13. The method of claim 12 , wherein analyzing the plurality of sub-images comprises identifying spots associated with the particles in the plurality of sub-images, and wherein determining the one of more characteristics of the particles comprises assessing size, shape, location, intensity, polarization, temporal, or spectral information relating to the spots, or a combination thereof.

14. The method of claim 12 , wherein deflecting light scattered by the particles comprises deflecting light scattered by the particles in a spectrally selective manner.

15. The method of claim 12 , wherein the collected scattered light comprises scattered light that is wavelength-shifted with respect to the illumination light.

16. The method of claim 12 , wherein the collected scattered light comprises fluorescent light.

17. The method of claim 12 , wherein determining the one or more characteristics of the particles comprise determining composition information.

18. The method of claim 17 , wherein determining the one or more characteristics of the particles further comprises determining size, shape, phase, or position information about the particles, or a combination thereof.

19. A system for fluorescence-based particle analysis, the system comprising:
an optical source configured to illuminate particles with illumination light;
a plurality of light deflectors configured to deflect, in a spectrally sensitive manner, fluorescent scattered light emitted by the particles in response to the illumination light;
an image capture device configured to collect fluorescent scattered light deflected by the plurality of light deflectors and generate an image from the collected fluorescent scattered light, the image comprising a plurality of sub-images respectively associated with the plurality of light deflectors, the plurality of sub-images representing the fluorescent light scattered by the particles in a respective plurality of scattering angle ranges and conveying composition information about the particles; and
a processor configured to receive the image from the image capture device, analyze the plurality of sub-images of the image, and determine therefrom the composition information about the particles.

Assignees

• Institut Nat Doptique

Inventors

• Cantin Daniel

Classifications

• G01N15/0211 Primary

  Investigating a scatter or diffraction pattern · CPC title

• G01N2015/1486

  Counting the particles · CPC title

• G01N15/06

  Investigating concentration of particle suspensions (by weighing G01N5/00; investigating sedimentation of particle suspensions G01N15/04; investigating individual particles G01N15/10) · CPC title

• G01N2015/0046

  in gas, e.g. smoke · CPC title

• G01N21/49

  within a body or fluid · CPC title