Rational nano-coulomb ionization

Patent metadata

Field	Value
Publication number	US-11476778-B2
Application number	US-201716645269-A
Country	US
Kind code	B2
Filing date	Sep 12, 2017
Priority date	Sep 12, 2016
Publication date	Oct 18, 2022
Grant date	Oct 18, 2022

Abstract

An ion pulse generator (100) includes a triboelectric generator (110), an ion emitter (132) and a conductive surface (134). The triboelectric generator (110) includes a first electrode (114), a spaced apart second electrode (120) and a first triboelectric layer (116). The triboelectric generator (110) generates a predetermined amount of charge as a result of relative movement of the first triboelectric layer (116). The ion emitter (132) is electrically coupled to the first electrode (114). The conductive surface (134) is electrically coupled to the second electrode (120) and is spaced apart from the ion emitter (132) at a predetermined distance. Generation of the predetermined amount of charge causes formation of ions between the ion emitter (132) and the conductive surface (134).

First claim

What is claimed is:

1. A mass spectrometry ionizing system, comprising:
(a) a triboelectric ion pulse generator that generates ions from gaseous material;
(b) a magnetic field generator that generates a magnetic through which the ions travel and deflects the ions by an amount that is a function of mass; and
(c) a detector that detects the ions that have been deflected by the magnetic field and determines an amount of deflection experienced by each ion.

2. The mass spectrometry ionizing system of claim 1 , wherein the triboelectric ion pulse generator comprises:
(a) a triboelectric generator, including a first electrode, a spaced apart second electrode and a first triboelectric layer, that is configured to generate a predetermined amount of charge as a result of relative movement of the first triboelectric layer;
(b) an ion emitter electrically coupled to the first electrode; and
(c) a conductive surface electrically coupled to the second electrode and spaced apart from the ion emitter at a predetermined distance,
wherein generation of the predetermined amount of charge causes formation of ions between the ion emitter and the conductive surface.

3. The mass spectrometry ionizing system of claim 2 , wherein the triboelectric generator comprises a contact/separation-mode triboelectric generator, wherein in the contact/separation-mode triboelectric generator, the first electrode is coupled to the triboelectric layer and wherein triboelectric layer is initially in contact with the second electrode and wherein the relative movement of the first triboelectric layer comprises separating the first electrode and the triboelectric layer from the second electrode so as to form a gap there between.

4. The mass spectrometry ionizing system of claim 3 , wherein at least one of the first electrode and the second electrode comprises copper and wherein the first triboelectric layer comprises fluorinated ethylene propylene.

5. The mass spectrometry ionizing system of claim 2 , wherein the triboelectric generator comprises a sliding-mode triboelectric generator, wherein the sliding-mode triboelectric generator further comprises a second triboelectric layer that is disposed on a first side of the first triboelectric layer and is contact therewith, the first electrode disposed on a second side of the first triboelectric layer, opposite from the first side, and the second electrode disposed on the second side of the first triboelectric layer and spaced apart from the first electrode, the second triboelectric layer configured to slide between a first position that is aligned with the first electrode and a second position that is aligned with the second electrode.

6. The mass spectrometry ionizing system of claim 5 , wherein at least one of the first electrode and the second electrode comprises copper, wherein the first triboelectric layer comprises fluorinated ethylene propylene and wherein the second triboelectric layer comprises copper.

7. The mass spectrometry ionizing system of claim 2 , wherein the ion emitter comprises a needle electrode.

8. The mass spectrometry ionizing system of claim 2 , wherein the first triboelectric layer has a nanoscale texture applied thereto.

Assignees

• Georgia Tech Res Inst

Inventors

• Li Anyin
• Fernandez Facundo Martin
• Zi Yunlong

Classifications

• H01J49/26

  Mass spectrometers or separator tubes · CPC title

• H01J49/168 Primary

  field ionisation, e.g. corona discharge (atmospheric pressure corona discharge per se H01T19/00) · CPC title

• H02N1/04

  Friction generators · CPC title

• H01J49/167

  Capillaries and nozzles specially adapted therefor; (electrostatic spraying per se B05B5/00) · CPC title

• H01J49/10

  Ion sources; Ion guns · CPC title