Measurement probe

Patent metadata

Field	Value
Publication number	US-11473904-B2
Application number	US-202017077515-A
Country	US
Kind code	B2
Filing date	Oct 22, 2020
Priority date	Oct 28, 2019
Publication date	Oct 18, 2022
Grant date	Oct 18, 2022

Abstract

A measurement probe of the present disclosure that scans a surface of a measurement object to measure a three-dimensional shape or the like of the surface of the measurement object includes a first movable portion having a stylus, a second movable portion that is connected to the first movable portion to be movable in a Z direction, a third movable portion that is connected to the second movable portion to be movable in the Z direction, a first position measurer that measures a first position of the first movable portion in the Z direction, a second position measurer that measures a second position of the second movable portion in the Z direction, and a third position measurer that measures a third position of the third movable portion in the Z direction. A first relative position is calculated based on the first position and the second position. A second relative position is calculated based on the first position and the third position. The first relative position of the second movable portion with respect to the first movable portion in the Z direction and the second relative position of the third movable portion with respect to the first movable portion in the Z direction are maintained constant.

First claim

What is claimed is:

1. A measurement probe that scans a surface of a measurement object to measure a shape of the surface of the measurement object, comprising:
a first movable portion having a stylus;
a second movable portion that is connected to the first movable portion and is movable in a Z direction;
a third movable portion that is internally provided with a space for accommodating the second movable portion, is connected to the second movable portion, and is movable in the Z direction;
a first position measurer that measures a first position of the first movable portion in the Z direction;
a second position measurer that measures a second position of the second movable portion in the Z direction; and
a third position measurer that measures a third position of the third movable portion in the Z direction,
wherein a first relative position is calculated based on the first position and the second position,
a second relative position is calculated based on the first position and the third position, and
(i) the first relative position of the second movable portion with respect to the first movable portion in the Z direction and (ii) the second relative position of the third movable portion with respect to the first movable portion in the Z direction are maintained constant.

2. The measurement probe of claim 1 , further comprising:
a first spring that connects the first movable portion with the second movable portion; and
a second spring that connects the second movable portion with the third movable portion.

3. The measurement probe of claim 1 ,
wherein mass of the second movable portion is 1/100 or less of mass of the third movable portion.

4. The measurement probe of claim 1 ,
wherein the first position measurer, the second position measurer, and the third position measurer are provided in a space defined inside the measurement probe.

5. The measurement probe of claim 4 ,
wherein the first position measurer includes a first light source,
the second position measurer includes a second light source,
the third position measurer includes a third light source, and
each of the first light source, the second light source, and the third light source is disposed to emit beams in parallel to the Z direction.

6. The measurement probe of claim 1 ,
wherein the measurement probe resets the first relative position and the second relative position to predetermined positions stored in advance.

7. A shape measuring device comprising:
the measurement probe of claim 1 .

Assignees

• Panasonic Ip Man Co Ltd

Inventors

• Kubo Keishi
• Inoue Takashi
• Doi Masateru
• Okazaki Makoto
• Usui Yukiya
• Funabashi Takanori

Classifications

• G01B11/24

  for measuring contours or curvatures · CPC title

• G01B11/002

  for measuring two or more coordinates · CPC title

• G01B5/012 Primary

  Contact-making feeler heads therefor · CPC title

• G01B11/005

  coordinate measuring machines · CPC title

• G01B11/026

  by measuring distance between sensor and object (G01B11/0608 takes precedence) · CPC title