Piezoelectric thin film resonator, filter, and multiplexer
US-2018175275-A1 · Jun 21, 2018 · US
US11469735B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11469735-B2 |
| Application number | US-201916688446-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 19, 2019 |
| Priority date | Nov 28, 2018 |
| Publication date | Oct 11, 2022 |
| Grant date | Oct 11, 2022 |
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An acoustic wave device includes: a piezoelectric substrate; electrodes sandwiching the piezoelectric substrate and exciting a thickness shear vibration in the piezoelectric substrate; and an edge region that is a region surrounding a center region of a resonance region, wherein a first region of the edge region is located on both sides of the center region in a first direction substantially parallel to a displacement direction of a thickness shear vibration, a second region of the edge region is located on both sides of the center region in a second direction substantially perpendicular to the first direction, a width of the second region is different from a width of the first region, and acoustic velocities of acoustic waves in the piezoelectric substrate in the first and second regions are less than that in the piezoelectric substrate in the center region.
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What is claimed is: 1. An acoustic wave device comprising: a piezoelectric substrate; a pair of electrodes sandwiching the piezoelectric substrate and exciting a thickness shear vibration in the piezoelectric substrate; an edge region that is a region surrounding a center region of a resonance region and is in an edge portion of the resonance region, the resonance region being a region where the pair of electrodes faces each other across at least a part of the piezoelectric substrate; a first region that is a part of the edge region and is located on both sides of the center region in a first direction that is substantially parallel to a displacement direction of a thickness shear vibration that is a primary mode in the piezoelectric substrate, an acoustic velocity of an acoustic wave in the piezoelectric substrate in the first region being less than an acoustic velocity of an acoustic wave in the piezoelectric substrate in the center region; and a second region that is a part of the edge region and is located on both sides of the center region in a second direction substantially perpendicular to the first direction, a width in the second direction of the second region being different from a width in the first direction of the first region, an acoustic velocity of an acoustic wave in the piezoelectric substrate in the second region being less than the acoustic velocity of the acoustic wave in the piezoelectric substrate in the center region. 2. The acoustic wave device according to claim 1 , wherein the width in the second direction of the second region is less than the width in the first direction of the first region. 3. The acoustic wave device according to claim 1 , wherein the acoustic velocity of the acoustic wave in the piezoelectric substrate in the first region is substantially equal to the acoustic velocity of the acoustic wave in the piezoelectric substrate in the second region. 4. A filter comprising: the acoustic wave device according to claim 1 . 5. A multiplexer comprising: the filter according to claim 4 . 6. The acoustic wave device according to claim 1 , wherein the piezoelectric substrate is a rotated Y-cut lithium niobate substrate. 7. The acoustic wave device according to claim 1 , further comprising: a first additional film provided in the first region; and a second additional film provided in the second region. 8. The acoustic wave device according to claim 1 , wherein the piezoelectric substrate is an X-cut lithium tantalate substrate. 9. An acoustic wave device comprising: a piezoelectric substrate that is a rotated Y-cut lithium niobate substrate; a pair of electrodes sandwiching the piezoelectric substrate and exciting a thickness shear vibration in the piezoelectric substrate; an additional film that surrounds a center region of a resonance region and is located in an edge portion of the resonance region, the resonance region being a region where the pair of electrodes faces each other across at least a part of the piezoelectric substrate; a first region that is a part of the additional film and is located on both sides of the center region in a first direction that is an X direction that is obtained when Euler angles are (0°±5°, 75°±5°, 0°±5°); and a second region that is a part of the additional film and is located on both sides of the center region in a second direction that is an X direction that is obtained when Euler angles are (90°±5°, 75°±5°, 0°±5°), a width in the second direction of the second region being less than a width in the first direction of the first region. 10. An acoustic wave device comprising: a piezoelectric substrate that is an X-cut lithium tantalate substrate; a pair of electrodes sandwiching the piezoelectric substrate and exciting a thickness shear vibration in the piezoelectric substrate; an additional film that surrounds a center region of a resonance region and is located in an edge portion of the resonance region, the resonance region being a region where the pair of electrodes faces each other across at least a part of the piezoelectric substrate; a first region that is a part of the additional film and is located on both sides of the center region in a first direction that is an X direction that is obtained when Euler angles are (90°±5°, 90°±5°, 132°±5°); and a second region that is a part of the additional film and is located on both sides of the center region in a second direction that is an X direction that is obtained when Euler angles are (90°±5°, 90°±5°, 42°±5°), a width in the second direction of the second region being less than a width in the first direction of the first region. 11. An acoustic wave device comprising: a piezoelectric substrate; a pair of electrodes sandwiching the piezoelectric substrate and exciting a thickness shear vibration in the piezoelectric substrate; an edge region that is a region surrounding a center region of a resonance region and is in an edge portion of the resonance region, the resonance region being a region where the pair of electrodes faces each other across at least a part of the piezoelectric substrate; a first region that is a part of the edge region and is located on both sides of the center region in a first direction that is substantially parallel to a displacement direction of a thickness shear vibration that is a primary mode in the piezoelectric substrate, an acoustic velocity of an acoustic wave in the piezoelectric substrate in the first region being less than an acoustic velocity of an acoustic wave in the piezoelectric substrate in the center region; and a second region that is a part of the edge region and is located on both sides of the center region in a second direction substantially perpendicular to the first direction, an acoustic velocity of an acoustic wave in the piezoelectric substrate in the second region being less than the acoustic velocity of the acoustic wave in the piezoelectric substrate in the center region and being different from the acoustic velocity of the acoustic wave in the piezoelectric substrate in the first region. 12. The acoustic wave device according to claim 11 , wherein the acoustic velocity of the acoustic wave in the piezoelectric substrate in the second region is greater than the acoustic velocity of the acoustic wave in the piezoelectric substrate in the first region. 13. The acoustic wave device according to claim 11 , wherein a width in the first direction of the first region is substantially equal to a width in the second direction of the second region. 14. An acoustic wave device comprising: a piezoelectric substrate; a pair of electrodes sandwiching the piezoelectric substrate and exciting a thickness shear vibration in the piezoelectric substrate; and an additional film that is not provided in a center region of a resonance region and is provided from at least a part of an edge region surrounding the center region to an outside of the resonance region, the resonance region being a region where the pair of electrodes overlaps in plan view while sandwiching at least a part of the piezoelectric substrate, wherein the additional film is provided from edge regions located in both ends of the resonance region in a first direction of planar directions of the piezoelectric substrate to the outside of the resonance region, and is not located in edge regions located in both ends of the resonance region in a second direction intersecting with the first direction among the planar directions. 15. The acoustic wave device according to claim 14 , wherein the additional film is provided on an opposite side of at least one of
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