Salt, acid generator, resist composition and method for producing resist pattern

US11467490B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11467490-B2
Application numberUS-202117166303-A
CountryUS
Kind codeB2
Filing dateFeb 3, 2021
Priority dateFeb 6, 2020
Publication dateOct 11, 2022
Grant dateOct 11, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Disclosed are a salt represented by formula (I), and an acid generator and a resist composition which include the same:wherein R1 represents a fluorine atom or a fluorinated alkyl group; R2, R3 and R4 each represent a halogen atom, a fluorinated alkyl group or a hydrocarbon group; m2 and m3 represent an integer of 0 to 4; m4 represents an integer of 0 to 5; Q1 and Q2 each represent a fluorine atom or a perfluoroalkyl group; L1 represents a saturated hydrocarbon group, —CH2- included in the group may be replaced by —O— or —CO—, and a hydrogen atom included in the group may be substituted with a fluorine atom or a hydroxy group; Y1 represents a methyl group which may have a substituent or an alicyclic hydrocarbon group which may have a substituent.

First claim

Opening claim text (preview).

The invention claimed is: 1. A salt represented by formula (I): wherein, in formula (I), R 1 represents a fluorine atom or a fluorinated alkyl group having 1 to 4 carbon atoms, R 2 , R 3 and R 4 each independently represent a halogen atom, a fluorinated alkyl group having 1 to 4 carbon atoms or a hydrocarbon group having 1 to 12 carbon atoms, and —CH 2 —included in the hydrocarbon group may be replaced by —O— or —CO—, m2 represents an integer of 0 to 4, and when m2 is 2 or more, a plurality of R 2 may be the same or different from each other, m3 represents an integer of 0 to 4, and when m3 is 2 or more, a plurality of R 3 may be the same or different from each other, m4 represents an integer of 0 to 5, and when m4 is 2 or more, a plurality of R 4 may be the same or different from each other, Q 1 and Q 2 each independently represent a fluorine atom or a perfluoroalkyl group having 1 to 6 carbon atoms, L 1 represents a saturated hydrocarbon group having 1 to 24 carbon atoms, —CH 2 —included in the saturated hydrocarbon group may be replaced by —O— or —CO—, and a hydrogen atom included in the saturated hydrocarbon group may be substituted with a fluorine atom or a hydroxy group, Y 1 represents a methyl group which may have a substituent or an alicyclic hydrocarbon group having 3 to 24 carbon atoms which may have a substituent, and —CH 2 — included in the alicyclic hydrocarbon group may be replaced by —O—, —SO 2 — or —CO—. 2. The salt according to claim 1 , wherein R 2 , R 3 and R 4 each independently represent a fluorine atom, an iodine atom or a perfluoroalkyl group having 1 to 4 carbon atoms. 3. The salt according to claim 1 , wherein R 1 represents a fluorinated alkyl group having 1 to 4 carbon atoms. 4. The salt according to claim 1 , wherein L 1 is not a perfluoroalkanediyl group. 5. The salt according to claim 1 , wherein at least one —CH 2 — included in the saturated hydrocarbon group represented by L 1 is replaced by —O— or —CO—. 6. The salt according to claim 1 , wherein Y 1 represents the alicyclic hydrocarbon group having 3 to 24 carbon atoms which may have a substituent, and —CH 2 — included in the alicyclic hydrocarbon group may be replaced by —O—, —SO 2 — or —CO—. 7. An acid generator comprising the salt according to claim 1 . 8. A resist composition comprising the acid generator according to claim 7 and a resin having an acid-labile group. 9. The resist composition according to claim 8 , wherein the resin having an acid-labile group comprises at least one selected from the group consisting of a structural unit represented by formula (a1-1) and a structural unit represented by formula (a1-2): wherein, in formula (a1-1) and formula (a1-2), L a1 and L a2 each independently represent —O— or *—O—(CH 2 ) k1 —CO—O—, k1 represents an integer of 1 to 7, and * represents a bonding site to —CO—, R a4 and R a5 each independently represent a hydrogen atom, a halogen atom, or an alkyl group having 1 to 6 carbon atoms which may have a halogen atom, R a6 and R a7 each independently represent an alkyl group having 1 to 8 carbon atoms, an alkenyl group having 2 to 8 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, an aromatic hydrocarbon group having 6 to 18 carbon atoms, or a group obtained by combining these groups, m1 represents an integer of 0 to 14, n1 represents an integer of 0 to 10, and n1′ represents an integer of 0 to 3. 10. The resist composition according to claim 8 , wherein the resin having an acid-labile group comprises a structural unit represented by formula (a2-A): wherein, in formula (a2-A), R a50 represents a hydrogen atom, a halogen atom, or an alkyl group having 1 to 6 carbon atoms which may have a halogen atom, R a51 represents a halogen atom, a hydroxy group, an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an alkoxyalkyl group having 2 to 12 carbon atoms, an alkoxyalkoxy group having 2 to 12 carbon atoms, an alkylcarbonyl group having 2 to 4 carbon atoms, an alkylcarbonyloxy group having 2 to 4 carbon atoms, an acryloyloxy group or a methacryloyloxy group, A a50 represents a single bond or *—X a51 -(A a52 -X a52 ) nb —, and * represents a bonding site to carbon atoms to which —R a50 is bonded, A a52 represents an alkanediyl group having 1 to 6 carbon atoms, X a51 and X a52 each independently represent —O—, —CO—O— or —O—CO—, nb represents 0 or 1, and mb represents an integer of 0 to 4, and when mb is an integer of 2 or more, a plurality of R a51 may be the same or different from each other. 11. The resist composition according to claim 8 , further comprising a salt generating an acid having an acidity lower than that of an acid generated from the acid generator. 12. A method for producing a resist pattern, which comprises: (1) a step of applying the resist composition according to claim 8 on a substrate, (2) a step of drying the applied composition to form a composition layer, (3) a step of exposing the composition layer, (4) a step of heating the exposed composition layer, and (5) a step of developing the heated composition layer.

Assignees

Inventors

Classifications

  • condensed with a ring other than six-membered · CPC title

  • Sulfonium compounds · CPC title

  • condensed with carbocyclic rings or ring systems · CPC title

  • Adamantanes · CPC title

  • C07D327/04Primary

    Five-membered rings · CPC title

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Frequently asked questions

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What does patent US11467490B2 cover?
Disclosed are a salt represented by formula (I), and an acid generator and a resist composition which include the same:wherein R1 represents a fluorine atom or a fluorinated alkyl group; R2, R3 and R4 each represent a halogen atom, a fluorinated alkyl group or a hydrocarbon group; m2 and m3 represent an integer of 0 to 4; m4 represents an integer of 0 to 5; Q1 and Q2 each represent a fluorine a…
Who is the assignee on this patent?
Sumitomo Chemical Co
What technology area does this patent fall under?
Primary CPC classification C07D327/04. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Oct 11 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).