Optical element having metallic seed layer and aluminum layer, and method for producing same

US11466356B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11466356-B2
Application numberUS-202016994526-A
CountryUS
Kind codeB2
Filing dateAug 14, 2020
Priority dateAug 16, 2019
Publication dateOct 11, 2022
Grant dateOct 11, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for producing an aluminum layer is provided. The method includes depositing a metallic seed layer on a substrate, the seed layer having a thickness of not more than 5 nm, and also includes applying the aluminum layer to the seed layer, wherein the aluminum layer has a thickness of more than 30 nm. Further, an optical element, which can be a mirror layer, is provided including the metallic seed layer and the aluminum layer.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for producing an optical element including a substrate, a metallic seed layer on the substrate and an aluminum layer deposited on a side of the metallic seed layer that faces away from the substrate, wherein the aluminum layer directly adjoins the metallic seed layer and the aluminum layer has a root mean square roughness of less than 0.7 nm, the method comprising: depositing the metallic seed layer on the substrate, the metallic seed layer having a thickness of not more than 5 nm; and applying the aluminum layer directly to the metallic seed layer, wherein the aluminum layer has a thickness of 30 nm to 100 nm inclusive. 2. The method according to claim 1 , wherein the metallic seed layer comprises Cu, Ti, Fe, Zn or Cr. 3. The method according to claim 1 , wherein the metallic seed layer is between 2 nm and 5 nm thick. 4. The method according to claim 1 , wherein the metallic seed layer is between 2.5 nm and 3.5 nm thick. 5. The method according to claim 1 , wherein the aluminum layer has a root mean square surface roughness of less than 0.4 nm. 6. The method according to claim 1 , further comprising applying a protective layer to the aluminum layer, wherein the protective layer has a thickness of not more than 5 nm. 7. An optical element comprising: a substrate; a metallic seed layer on the substrate, the metallic seed layer having a thickness of not more than 5 nm; and an aluminum layer disposed on a side of the metallic seed layer that faces away from the substrate, wherein the aluminum layer directly adjoins the metallic seed layer, wherein the aluminum layer has a thickness of 30 nm to 100 nm inclusive, and wherein the aluminum layer has a root mean square roughness of less than 0.7 nm. 8. The optical element according to claim 7 , wherein the metallic seed layer comprises Cu, Ti, Fe, Zn or Cr. 9. The optical element according to claim 7 , wherein the optical element is a mirror, and wherein the aluminum layer is a mirror layer. 10. The optical element according to claim 7 , wherein the metallic seed layer is between 2 nm and 5 nm thick. 11. The optical element according to claim 7 , wherein the metallic seed layer is between 2.5 nm and 3.5 nm thick. 12. The optical element according to claim 7 , wherein the aluminum layer has a root mean square surface roughness of less than 0.4 nm. 13. The optical element according to claim 7 , further comprising a protective layer disposed on the aluminum layer, wherein the protective layer has a thickness of not more than 5 nm. 14. An optical element comprising: a substrate; a metallic seed layer on the substrate, the metallic seed layer having a thickness of not more than 5 nm; and an aluminum layer disposed on a side of the metallic seed layer that faces away from the substrate, wherein the aluminum layer directly adjoins the metallic seed layer, wherein the aluminum layer has a thickness of more than 30 nm, wherein the metallic seed layer is between 2.5 nm and 3.5 nm thick, and wherein all layers of the optical element are arranged on a same side of the substrate. 15. The optical element of claim 14 , wherein the metallic seed layer comprises Cu, Ti, Fe, Zn or Cr. 16. The optical element of claim 14 , wherein the optical element is a mirror, and wherein the aluminum layer is a mirror layer. 17. The optical element of claim 14 , further comprising a protective layer disposed on the aluminum layer, wherein the protective layer has a thickness of not more than 5 nm. 18. The optical element of claim 14 , wherein the aluminum layer has a root mean square surface roughness of less than 0.4 nm.

Assignees

Inventors

Classifications

  • G02B5/0808Primary

    having a single reflecting layer (G02B5/0883, G02B5/0891 take precedence) · CPC title

  • C23C14/025Primary

    Metallic sublayers · CPC title

  • Ultraviolet [UV] mirrors (apparatus for microlithography exposure G03F7/70; X-ray multilayer structures G21K1/06) · CPC title

  • Metallic material, boron or silicon · CPC title

  • Cleaning or etching treatments · CPC title

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Frequently asked questions

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What does patent US11466356B2 cover?
A method for producing an aluminum layer is provided. The method includes depositing a metallic seed layer on a substrate, the seed layer having a thickness of not more than 5 nm, and also includes applying the aluminum layer to the seed layer, wherein the aluminum layer has a thickness of more than 30 nm. Further, an optical element, which can be a mirror layer, is provided including the metal…
Who is the assignee on this patent?
Fraunhofer Ges Forschung, Univ Jena Friedrich Schiller
What technology area does this patent fall under?
Primary CPC classification G02B5/0808. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 11 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).