Light source measurement apparatus

Patent metadata

Field	Value
Publication number	US-11456572-B2
Application number	US-201916712841-A
Country	US
Kind code	B2
Filing date	Dec 12, 2019
Priority date	Dec 26, 2018
Publication date	Sep 27, 2022
Grant date	Sep 27, 2022

Abstract

A light source measurement apparatus includes an objective lens that collects light emitted from a light source having a plurality of light emission points, a first reflection attenuation filter, a second reflection attenuation filter, a condensing lens, a space filter, and a movable stage, in which the first reflection attenuation filter and the second reflection attenuation filter are disposed such that polarization directions are orthogonal to each other, in which the space filter has an opening through which light emitted from a measurement target light emission point among the plurality of light emission points is transmitted, and in which the opening has a shape in which a dimension of the measurement target light emission point in a fast direction is larger than a dimension of the measurement target light emission point in a slow direction.

First claim

What is claimed is:

1. A light source measurement apparatus comprising:
an objective lens that collects light emitted from a light source having a plurality of light emission points;
a first reflection attenuation filter that (i) causes a part of light emitted from the objective lens to pass through the first reflection attenuation filter and (ii) reflects another parts of the light emitted from the objective lens;
a second reflection attenuation filter that (i) causes the part of light having passed through the first reflection attenuation filter to pass through the second reflection attenuation filter and (ii) reflects another part of the light having passed through the first reflection attenuation filter;
a condensing lens that collects light having passed through the second reflection attenuation filter;
a space filter disposed at a condensing position of the light collected by the condensing lens; and
a movable stage on which the light source is mounted,
wherein the first reflection attenuation filter and the second reflection attenuation filter are arranged such that polarization directions of the first reflection attenuation filter and the second reflection attenuation filter are orthogonal to each other,
wherein the space filter has an opening through which passes light emitted from a measurement target light emission point, the measurement target light emission point being one of the plurality of light emission points, and
wherein a dimension of the opening in a fast direction of the measurement target light emission point is larger than a dimension of the opening in a slow direction of the measurement target light emission point.

2. The light source measurement apparatus of claim 1 ,
wherein an advancing direction of the light having passed through the first reflection attenuation filter matches an advancing direction of the light emitted from the objective lens, and an advancing direction of reflected light reflected at the first reflection attenuation filter is orthogonal to the advancing direction of the light emitted from the objective lens, and
wherein an advancing direction of the light having passed through the second reflection attenuation filter matches the advancing direction of the light emitted from the objective lens, and an advancing direction of reflected light reflected at the second reflection attenuation filter is orthogonal to the advancing direction of the light emitted from the objective lens, and is orthogonal to the advancing direction of the reflected light reflected at the first reflection attenuation filter.

3. The light source measurement apparatus of claim 1 ,
wherein a magnification of the objective lens is larger than a magnification of the condensing lens.

4. The light source measurement apparatus of claim 1 ,
wherein, in a case where a dimension of a light emitting element of the measurement target light emission point in the fast direction is indicated by Lf, a focal length of the objective lens is indicated by F1, and a focal length of the condensing lens is indicated by F2, a fast-direction dimension Of of the opening is defined in a range of ±10% of a greater value of (1.3×Lf×F2)/F1 and 0.2×F1.

5. The light source measurement apparatus of claim 4 ,
wherein, in a case where a dimension of the light emitting element in the slow direction is indicated by Ls, a slow-direction dimension Os of the opening is defined in a range of ±10% of a greater value of (1.3×Ls×F2)/F1 and F1.

6. The light source measurement apparatus of claim 1 , further comprising:
a split optical system that splits light having passed through the opening into light beams;
an NFP measurer that measures an NFP of the measurement target light emission point on the basis of an image of one of the light beams split by the split optical system; and
an FFP measurer that measures an FFP of the measurement target light emission point on the basis of an image of the other of the light beams split by the split optical system.

7. The light source measurement apparatus of claim 6 , further comprising:
a light emission point measurer that captures an image including all of the plurality of light emission points; and
a calculator,
wherein the calculator calculates a deviation amount of an irradiation angle of the measurement target light emission point on the basis of an image acquired by the FFP measurer, and performs image processing on the image captured by the light emission point measurer such that the deviation amount is corrected.

Assignees

• Panasonic Ip Man Co Ltd

Inventors

• Mori Shigeyuki
• Funami Koji
• Mori Masahiro

Classifications

• G02B19/0023

  at least one surface having optical power · CPC title

• G02B19/0057

  in the form of a laser diode array, e.g. laser diode bar (semiconductor laser arrays with beam combining arrangement H01S5/4012) · CPC title

• H01S5/0014 Primary

  Measuring characteristics or properties thereof (measuring techniques per se G01J, G01K, G01N, G01R) · CPC title

• G01B11/27

  for testing the alignment of axes {(means for centering or aligning a light guide within a ferrule G02B6/3834)} · CPC title

• G01B11/272 Primary

  using photoelectric detection means · CPC title