Inspection of a structure with a sloped back wall
US-2019302062-A1 · Oct 3, 2019 · US
US11435323B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11435323-B2 |
| Application number | US-201916717037-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 17, 2019 |
| Priority date | Dec 17, 2019 |
| Publication date | Sep 6, 2022 |
| Grant date | Sep 6, 2022 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Methods, systems and apparatuses are disclosed for non-destructively a substrate using ultrasound waves, and enhancing resolution of imaging created from ultrasound signals that are back reflected from a substrate surface second, or back surface by maintaining the incident angles of the ultrasonic beams at the substrate second surface such that the ultrasonic beams strike the substrate second surface at an angle that is substantially perpendicular to the complex geometric profile of the substrate second surface by supplying known spatial coordinates to the system to maintain the incident angles of the ultrasonic beams at a predetermined angle relative to the substrate second surface.
Opening claim text (preview).
What is claimed is: 1. A method comprising: orienting an ultrasonic probe proximate to a substrate, said substrate comprising a first surface of the substrate and a second surface of the substrate, said second surface of the substrate comprising a complex geometry, said complex geometry comprising a complex geometry profile, and said ultrasonic probe comprising a transducer and a receiver; orienting a controller in communication with the ultrasonic probe, said controller configured to access the complex geometry profile; accessing the complex geometry profile; controlling the orientation of the ultrasonic probe in response to the complex geometry profile; directing ultrasonic energy from the ultrasonic probe in response to the complex geometry profile; directing ultrasonic energy from the ultrasonic probe to the substrate and through the first surface of the substrate to the second surface of the substrate; directing back reflection ultrasonic energy from the second surface of the substrate to the receiver; receiving back reflection ultrasonic energy from the second surface of the substrate at the receiver; and wherein the receiver is positioned to receive back reflection ultrasonic energy from the second surface of the substrate in response to the complex geometry profile. 2. The method of claim 1 , further comprising: scanning the ultrasonic probe in a predetermined direction relative to the first surface of the substrate in response to the complex geometry profile. 3. The method of claim 1 , further comprising: accessing the complex geometry profile, said complex geometry profile comprising profile information at a pixel level. 4. The method of claim 1 , wherein the complex geometry is a non-planar geometry. 5. The method of claim 1 , wherein, in the step of directing ultrasonic energy from the ultrasonic probe in response to the complex geometry profile, further comprising: directing ultrasonic energy from the transducer to the second surface of the substrate in an orientation that is perpendicular to the second surface of the substrate. 6. The method of claim 1 , wherein, in the step of directing back reflection ultrasonic energy from the second surface of the substrate to the receiver, further comprising: directing back reflection ultrasonic energy from the second surface of the substrate to the receiver in an orientation that is perpendicular to the second surface of the substrate. 7. The method of claim 1 , wherein, in the step of accessing the complex geometry profile, said complex geometry profile is accessed from a memory. 8. The method of claim 1 , wherein the controller is in communication with a robot. 9. The method of claim 8 , wherein the robot is configured to move the ultrasonic probe relative to the substrate. 10. A method comprising: orienting an ultrasonic probe proximate to a substrate, said substrate comprising a first surface of the substrate and a second surface of the substrate, said second surface of the substrate comprising a complex geometry, said complex geometry comprising a complex geometry profile, and said ultrasonic probe comprising a transducer and a receiver; orienting a scanning device configured to dimensionally scan the second surface of the substrate; dimensionally scanning the complex geometry profile with the scanning device; providing a controller, said controller in communication with the ultrasonic probe, said controller further in communication with the scanning device; accessing the complex geometry profile obtained by the scanning device; controlling the ultrasonic probe in response to the complex geometry profile obtained by the scanning device; directing ultrasonic energy from the ultrasonic probe to the substrate and through the first surface of the substrate to the second surface of the substrate; directing ultrasonic energy from the ultrasonic probe in response to the complex geometry profile; directing back reflection ultrasonic energy from the second surface of the substrate to the receiver; receiving back reflection ultrasonic energy from the second surface of the substrate at the receiver; and wherein the receiver is positioned to receive back reflection ultrasonic energy from the second surface of the substrate in response to the complex geometry profile. 11. The method of claim 10 , further comprising: moving the ultrasonic probe in a predetermined direction relative to the first surface of the substrate in response to the complex geometry profile. 12. The method of claim 10 , wherein the complex geometry is a non-planar geometry. 13. The method of claim 10 , wherein, in the step of directing ultrasonic energy from the ultrasonic probe in response to the complex geometry profile, the method further comprising: directing ultrasonic energy from the transducer to the second surface of the substrate in an orientation that is perpendicular to the second surface of the substrate. 14. The method of claim 10 , wherein, in the step of directing back reflection ultrasonic energy from the second surface of the substrate to the receiver, the method further comprising: directing back reflection ultrasonic energy from the second surface of the substrate to the receiver in an orientation that is perpendicular to the second surface of the substrate. 15. The method of claim 10 , wherein the controller is in communication with a robot. 16. The method of claim 15 , wherein the robot is configured to move the ultrasonic probe relative to the substrate. 17. A system for non-destructively scanning a substrate comprising: an ultrasonic probe, said ultrasonic probe comprising a transducer and a receiver, said ultrasonic probe configured to scan a substrate, said substrate comprising a first surface of the substrate and a second surface of the substrate, said second surface of the substrate comprising a complex geometry profile; and a controller configured to be in communication with the ultrasonic probe, said controller configured to access the complex geometry profile; a robotic array in communication with the controller; wherein said transducer is configured to direct ultrasonic energy from the transducer to the first surface of the substrate, and from the first surface of the substrate through the substrate to the second surface of the substrate in response to the complex geometry profile; and wherein, during a scan of the substrate, said transducer is further configured to direct ultrasonic energy from the transducer to the second surface of the substrate in a direction that remains perpendicular to the second surface of the substrate during a scan duration. 18. The system of claim 17 , further comprising a memory, said memory comprising the complex geometry profile. 19. The system of claim 17 , further comprising: a scanning device, said scanning device configured to scan the complex geometry profile of the second surface of the substrate, said scanning device configured to be in communication with the controller. 20. The system of claim 17 , further comprising: a processor in communication with the receiver, said processor configured to receive signals sent from the receiver. 21. The system of claim 19 , wherein the scanning device comprises a laser.
Probes {(transducers for acoustic waves B06B, G10K; for measuring G01H)} · CPC title
one transducer · CPC title
one emitter, one receiver · CPC title
Complex surfaces · CPC title
by moving the transducer · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.