Measurement device with arbitrary waveform generator and trigger unit

US11422159B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11422159-B2
Application numberUS-201715599207-A
CountryUS
Kind codeB2
Filing dateMay 18, 2017
Priority dateMay 18, 2017
Publication dateAug 23, 2022
Grant dateAug 23, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A measurement device comprising a housing, a measurement channel, a trigger unit connected to the measurement channel, and an arbitrary waveform generator housed within the housing is disclosed. The measurement channel comprises an acquisition unit. The trigger unit is configured to detect a predetermined trigger event in a signal processed by the measurement channel. The trigger unit is configured to control the acquisition unit, and the trigger unit is configured to control the arbitrary waveform generator. Moreover, a measurement system and a method for operating a measurement device are disclosed.

First claim

Opening claim text (preview).

The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows: 1. A measurement device, comprising: a housing; a measurement channel; a trigger unit connected to said measurement channel; and an arbitrary waveform generator housed within said housing, said measurement channel comprising an acquisition unit; said trigger unit being configured to detect a predetermined trigger event in a signal processed by said measurement channel; said trigger unit being configured to control said acquisition unit; and said trigger unit being configured to control said arbitrary waveform generator, wherein said trigger unit is configured to cause said arbitrary waveform generator to start generating an output signal, and wherein said trigger unit is configured to cause said arbitrary waveform generator to stop generating the output signal, wherein said measurement device is connectable to a device under test, and wherein said device under test is configured to forward a signal to an input of said measurement device, said signal being processed internally by said measurement device, said arbitrary waveform generator being configured to output said generated output signal to be received by said device under test. 2. The measurement device according to claim 1 , wherein said trigger unit is configured to cause said arbitrary waveform generator to start generating said output signal with a delay. 3. The measurement device according to claim 1 , wherein said trigger unit is configured to cause said arbitrary waveform generator to modify the output signal generated. 4. The measurement device according to claim 1 , wherein said trigger unit is an analog trigger unit, said analog trigger unit being connected to the input of said measurement device. 5. The measurement device according to claim 1 , wherein said trigger unit is a digital trigger unit, said digital trigger unit being configured to receive a digital representative of an input signal. 6. The measurement device according to claim 1 , wherein said measurement device further comprises a bus system, said trigger unit being configured to control said arbitrary waveform generator based on data contained within a bus signal. 7. The measurement device according to claim 1 , wherein said measurement device further comprises a signal output allocated to said arbitrary waveform generator. 8. The measurement device according to claim 1 , wherein said trigger unit is configured to discriminate between at least two different trigger events. 9. The measurement device according to claim 8 , wherein said trigger unit is configured to cause said arbitrary waveform generator to modify said output signal based on which of the at least two different trigger events is detected. 10. The measurement device according to claim 1 , wherein said measurement device comprises an interface that is configured to set said predetermined trigger event. 11. The measurement device according to claim 1 , wherein said measurement device is at least one of an oscilloscope and a spectrum analyzer. 12. The measurement device according to claim 1 , wherein said trigger unit is configured to detect said predetermined trigger event and to control said arbitrary waveform generator in response to said predetermined trigger event detected. 13. Measurement system comprising a device under test and a measurement device according to claim 1 , said device under test and said measurement device being connected with each other. 14. Measurement system according to claim 13 , wherein the device under test is configured to forward further signals to the measurement channel input in response to a certain output signal received from said measurement device. 15. A method for operating a measurement device, comprising the steps of: receiving an input signal; detecting at least one predetermined trigger event in said input signal; generating an output signal appropriate for said at least one predetermined trigger event detected; and outputting said output signal via an integrated arbitrary waveform generator output, wherein an integrated arbitrary waveform generator is controlled to start outputting said output signal based on said at least one predetermined trigger event, and wherein said integrated arbitrary waveform generator is controlled to stop outputting said output signal based on said at least one predetermined trigger event, wherein a device under test is provided, said device under test transmitting said input signal to be received by said measurement device, said integrated arbitrary waveform generator outputting said output signal to be received by said device under test. 16. The method according to claim 15 , wherein said receiving step, said detecting step, said generating step, and said outputting step are performed by a single measurement device. 17. The method according to claim 15 , wherein the method further comprises the steps of: detecting at least one additional predetermined trigger event; and modifying said output signal based on said additional predetermined trigger event.

Assignees

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Classifications

  • for non-recurrent functions, e.g. transients · CPC title

  • for triggering, synchronisation · CPC title

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What does patent US11422159B2 cover?
A measurement device comprising a housing, a measurement channel, a trigger unit connected to the measurement channel, and an arbitrary waveform generator housed within the housing is disclosed. The measurement channel comprises an acquisition unit. The trigger unit is configured to detect a predetermined trigger event in a signal processed by the measurement channel. The trigger unit is config…
Who is the assignee on this patent?
Rohde & Schwarz
What technology area does this patent fall under?
Primary CPC classification G01R13/0254. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 23 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).