Method for inspecting membrane electrode structure

US11421985B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11421985-B2
Application numberUS-202117163950-A
CountryUS
Kind codeB2
Filing dateFeb 1, 2021
Priority dateFeb 4, 2020
Publication dateAug 23, 2022
Grant dateAug 23, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

Official abstract text for this publication.

A method for inspecting a membrane electrode structure (1) which includes a first step in which detection medium capable of detecting elements of a first electrode catalyst layer (12) and a second electrode catalyst layer (22) and an element of a metal foreign matter (40) is sent along a thickness direction from the side of a first electrode layer (10) to a second electrode layer (20) side to obtain a thickness direction profile of a detection signal, and a second step in which an analysis unit identifies a thickness direction position of the metal foreign matter (40), from intensity of the detection signal in the thickness direction profile, and in which the analysis unit identifies thickness direction positions of the first and second electrode catalyst layer (12)(22), or a thickness direction position of an electrolyte membrane (30), from the intensity of the detection signal in the thickness direction profile.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for inspecting a membrane electrode structure formed by sandwiching an electrolyte membrane between a first electrode layer comprising a first electrode catalyst layer and a first gas diffusion layer, and a second electrode layer comprising a second electrode catalyst layer and a second gas diffusion layer, the method comprising: a first step in which a detection medium capable of detecting elements of the first electrode catalyst layer and the second electrode catalyst layer or an element of the electrolyte membrane, and an element of a metal foreign matter is sent such that a focal point is moved along a thickness direction from a side of the first electrode layer to a side of the second electrode layer, thereby obtaining a thickness direction profile of a detection signal; and a second step in which an analysis unit identifies a thickness direction position of the metal foreign matter, from intensity of the detection signal in the thickness direction profile, and in which the analysis unit identifies thickness direction positions of the first electrode catalyst layer and the second electrode catalyst layer, or a thickness direction position of the electrolyte membrane, from the intensity of the detection signal in the thickness direction profile. 2. The method for inspecting the membrane electrode structure according to claim 1 , comprising a third step in which the thickness direction position of the metal foreign matter identified by the second step is compared with the thickness direction positions of the first electrode catalyst layer and the second electrode catalyst layer, or the thickness direction position of the electrolyte membrane, and in which, when the metal foreign matter is spaced apart from the first electrode catalyst layer and the second electrode catalyst layer, or the electrolyte membrane, at equal to or more than a predetermined value in the thickness direction, the membrane electrode structure is determined as a non-defective product. 3. The method for inspecting the membrane electrode structure according to claim 2 , wherein the predetermined value is set to a value at which, when the metal foreign matter is present in the first gas diffusion layer or the second gas diffusion layer, the membrane electrode structure is not determined as the defective product. 4. The method for inspecting the membrane electrode structure according to claim 1 , comprising, prior to the first step, a scanning step of scanning a surface of the membrane electrode structure and detecting a presence or absence of the metal foreign matter, wherein the first step and the second step are performed at a location where the metal foreign matter has been detected by the scanning step. 5. The method for inspecting the membrane electrode structure according to claim 1 , comprising a fourth step in which the thickness direction position of the metal foreign matter identified by the second step is compared with the thickness direction positions of the first electrode catalyst layer and the second electrode catalyst layer, or the thickness direction position of the electrolyte membrane, and in which, of manufacturing steps of the first electrode catalyst layer and the second electrode catalyst layer, the electrolyte membrane, and the membrane electrode structure, in which manufacturing step the metal foreign matter was mixed is identified.

Assignees

Inventors

Classifications

  • Manufacturing or production processes characterised by the final manufactured product · CPC title

  • Gas diffusion layers · CPC title

  • by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence · CPC title

  • G01N23/04Primary

    and forming images of the material · CPC title

  • thickness, density, surface weight (unit area) · CPC title

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What does patent US11421985B2 cover?
A method for inspecting a membrane electrode structure (1) which includes a first step in which detection medium capable of detecting elements of a first electrode catalyst layer (12) and a second electrode catalyst layer (22) and an element of a metal foreign matter (40) is sent along a thickness direction from the side of a first electrode layer (10) to a second electrode layer (20) side to o…
Who is the assignee on this patent?
Honda Motor Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01N23/04. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 23 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).