Time of flight mass spectrometer and method of mass spectrometry

Patent metadata

Field	Value
Publication number	US-11387094-B2
Application number	US-202117189780-A
Country	US
Kind code	B2
Filing date	Mar 2, 2021
Priority date	Mar 2, 2020
Publication date	Jul 12, 2022
Grant date	Jul 12, 2022

Abstract

A time-of-flight (ToF) mass spectrometer, comprising: a pulsed ion injector for forming an ion beam that travels along an ion path; a detector for detecting ions in the ion beam that arrive at the detector at times according to their m/z values; an ion focusing arrangement located between the ion injector and the detector for focusing the ion beam in at least one direction orthogonal to the ion path; and a variable voltage supply for supplying the ion focusing arrangement with at least one variable voltage that is dependent on a charge state and/or an amount of ions of at least one species of ions in the ion beam. A corresponding method of mass spectrometry is provided. The charge state and/or an amount of ions may be acquired from a pre-scan, or predicted. Tuning of the spectrometer based on a charge state and/or an amount of ions of at least one species of ions in the ion beam may be performed on the fly.

First claim

What is claimed is:

1. A time-of-flight mass spectrometer, comprising:
a pulsed ion injector for forming an ion beam that travels along an ion path;
a detector for detecting ions in the ion beam that arrive at the detector at times according to their m/z values;
an ion focusing arrangement located between the ion injector and the detector for focusing the ion beam in at least one direction orthogonal to the ion path; and
a variable voltage supply for supplying the ion focusing arrangement with at least one variable voltage that is dependent on a charge state and/or an amount of ions of at least one species of ions in the ion beam.

2. A time-of-flight mass spectrometer according to claim 1 , wherein the voltage supply is configured to vary the voltage supplied to the ion focusing arrangement based on data on a charge state and/or an amount of at least one species of ions in the ion beam acquired by the detector and/or a charge measurement device for measuring charge in the ion beam.

3. A time-of-flight mass spectrometer according to claim 1 , further comprising a controller configured to use data on a charge state and/or an amount of ions of at least one species in the ion beam to control the voltage supply.

4. A time-of-flight mass spectrometer according to claim 3 , wherein the controller is configured to predict at least one charge state of product ions in an MS2 analysis from at least one charge state of parent ions acquired in an MS1 analysis.

5. A time-of-flight mass spectrometer according to claim 1 , wherein the variable voltage supply is configured to vary the variable voltage supplied to the ion focusing arrangement from one m/z scan of an ion pulse from the ion injector to a subsequent scan of another ion pulse from the ion injector.

6. A time-of-flight mass spectrometer according to claim 1 , wherein the variable voltage supply is configured to vary the variable voltage supplied to the ion focusing arrangement based on charge state data and/or data of amount of ions in the ion beam acquired from a pre-scan of a pulse of ions from the ion injector.

7. A time-of-flight mass spectrometer according to claim 1 , wherein the variable voltage supply is configured to vary the variable voltage supplied to the ion focusing arrangement within an m/z scan of a pulse of ions from the ion injector.

8. A time-of-flight mass spectrometer according to 7, wherein the variable voltage supply is configured to vary the voltage supplied to the ion focusing arrangement based on data on a charge state and/or an amount of at least one species of ions in the ion beam acquired from the ions on the fly during an m/z scan of a pulse of ions from the ion injector.

9. A time-of-flight mass spectrometer according to claim 7 , wherein the at least one variable voltage is variable in a time dependent manner correlated to arrival times at the focusing arrangement of ions of different charge state and/or different space charge.

10. A time-of-flight mass spectrometer according to claim 1 , wherein the charge state of the ions comprises a multiply charged state, and the variable voltage supply is configured to vary the variable voltage supplied to the ion focusing arrangement to normalize a spatial dispersion of the ions of the multiply charged state to a spatial dispersion of singly charged ions.

11. A time-of-flight mass spectrometer according to claim 1 , wherein the at least one charge state is a charge state of a single ion species.

12. A time-of-flight mass spectrometer according to claim 1 , wherein the at least one charge state is a plurality of charge states of different ion species.

13. A time-of-flight mass spectrometer according to claim 1 , wherein the at least one charge state is a representative charge state of a plurality of different ion species.

14. A time-of-flight mass spectrometer according to claim 13 , wherein the representative charge state is an average charge state of the plurality of different ion species.

15. A time-of-flight mass spectrometer according to claim 1 , further comprising at least one ion mirror configured to reflect the ion beam along the ion path.

16. A time-of-flight mass spectrometer according to claim 15 , further comprising a plurality of ion mirrors configured to reflect the ion beam a plurality of times along the ion path.

17. A time-of-flight mass spectrometer according to claim 16 , further comprising two ion mirrors spaced apart and opposing each other in a direction X, each mirror elongated generally along a drift direction Y, the drift direction Y being orthogonal to the direction X, configured to provide a zigzag ion path by reflecting the ion beam multiple times between the ion mirrors in the direction X whilst the ion beam drifts in the drift direction Y.

18. A time-of-flight mass spectrometer according to claim 1 , wherein the ion path lies in a plane and the ion focusing arrangement is for focusing the ion beam in a direction within the plane.

19. A time-of-flight mass spectrometer according to claim 1 , wherein the ion path lies in a plane and the ion focusing arrangement is for focusing the ion beam in a direction out of the plane.

20. A time-of-flight mass spectrometer according to claim 1 , wherein the ion focusing arrangement comprises at least one ion focusing lens and the voltage supply is for supplying at least one variable voltage to the at least one ion focusing lens, wherein the at least one ion focusing lens is selected from the following: a trans-axial lens, an Einzel lens, and a multipole lens.

21. A time-of-flight mass spectrometer according to claim 20 , comprising at least one ion mirror along the ion path configured to reflect the ion beam, wherein the at the at least one ion focusing lens is located before a first reflection in the at least one ion mirror.

22. A time-of-flight mass spectrometer according to claim 21 , comprising a plurality of ion mirrors configured to reflect the ion beam a plurality of times, wherein at least one ion focusing lens of the ion focusing arrangement is located after a first reflection and before a fifth reflection in the ion mirrors.

23. A time-of-flight mass spectrometer according to claim 1 , further comprising an ion fragmentation device upstream of the ion injector for performing MS2 analysis of ions, wherein the voltage supply is configured to vary the voltage supplied to the ion focusing arrangement in MS2 analysis based on data on a charge state and/or an amount of at least one species of product ions derived from MS1 analysis of ions performed prior to the MS2 analysis.

24. A method of mass spectrometry, comprising:
forming an ion beam from a pulsed ion injector that travels along an ion path;
detecting ions in the ion beam that arrive at a detector at times according to their m/z values;
focusing the ion beam in at least one direction orthogonal to the ion path using an ion focusing arrangement located between the ion injector and the detector; and
supplying the ion focusing arrangement with at least one variable voltage from a variable voltage supply, wherein the variable voltage is dependent on a charge state and/or an amount of ions of at least one species of ions in the ion beam.

25. A method of mass spectrometry according to claim 24 , wherein the dependence of the at least one variable voltage on the charge state and/or the amount of ions of at least one species of ions in the ion beam has been determined from a calibration, whe

Assignees

• Thermo Fisher Scient Bremen Gmbh

Inventors

• Stewart Hamish
• Grinfeld Dmitry E
• Makarov Alexander A

Classifications

• H01J49/022

  Circuit arrangements, e.g. for generating deviation currents or voltages (regulating electric or magnetic variables in general, e.g. current, magnetic field G05F); Components associated with high voltage supply (high voltage supply per se H02M) · CPC title

• H01J49/40 Primary

  Time-of-flight spectrometers (H01J49/36 takes precedence) · CPC title

• H01J49/025

  Detectors specially adapted to particle spectrometers (data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29) · CPC title

• H01J49/063

  Multipole ion guides, e.g. quadrupoles, hexapoles · CPC title

• H01J49/446

  Time-of-flight spectrometers · CPC title