Freeform concave grating imaging spectrometer

US11340113B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-11340113-B1
Application numberUS-202117235090-A
CountryUS
Kind codeB1
Filing dateApr 20, 2021
Priority dateFeb 5, 2021
Publication dateMay 24, 2022
Grant dateMay 24, 2022

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  1. Title

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A freeform concave grating imaging spectrometer includes a slit, a freeform concave grating, and an image surface. The lights incident from the slit is irradiated on the freeform concave grating to be dispersed and reflected, to form a reflected light beam. The reflected light beam is irradiated on the image surface, so that the lights of different wavelengths incident from the slit are separated and imaged on the image surface.

First claim

Opening claim text (preview).

What is claimed is: 1. A freeform concave grating imaging spectrometer, comprising: a slit; a freeform concave grating; and an image surface; wherein the freeform concave grating is positioned to disperse and reflect a light beam irradiated from the slit, to form a reflected light beam, the image surface is positioned to form an image from the reflected light beam irradiated from the freeform concave grating, and the image on the image surface shows light beams of different wavelengths comprised of the light beam; and a line space of the freeform concave grating is constant, a spectral dispersion of the freeform concave grating is greater than or equal to 240 nm/mm, a slit length of the slit is less than or equal to 2.1 mm, a numerical aperture of the freeform concave grating imaging spectrometer is less than or equal to 0.13, and a system length of the freeform concave grating imaging spectrometer is greater than or equal to 61 mm. 2. The freeform concave grating imaging spectrometer of claim 1 , further comprising a detector configured for recording information on the image surface. 3. The freeform concave grating imaging spectrometer of claim 2 , wherein the detector is located on the image surface. 4. The freeform concave grating imaging spectrometer of claim 2 , wherein the freeform concave grating imaging spectrometer consists of the slit, the freeform concave grating, the image surface, and the detector. 5. The freeform concave grating imaging spectrometer of claim 1 , wherein the slit and the image surface are located on the same side of the freeform concave grating. 6. The freeform concave grating imaging spectrometer of claim 1 , wherein the freeform concave grating is configured to dispersing and imaging incident light beams. 7. The freeform concave grating imaging spectrometer of claim 1 , wherein a spectral range of the freeform concave grating imaging spectrometer is in a range from 400 nm to 1000 nm. 8. The freeform concave grating imaging spectrometer of claim 1 , wherein the slit is a fixed slit, a unilateral adjustable asymmetric slit, or a bilateral adjustable symmetric slit. 9. A freeform concave grating imaging spectrometer, comprising: a slit; a freeform concave grating; and an image surface, wherein the freeform concave grating is positioned to disperse and reflect a light beam irradiated from the slit, to form a reflected light beam, the image surface is positioned to form an image from the reflected light beam irradiated from the freeform concave grating, and the image on the image surface shows light beams of different wavelengths comprised of the light beam; and a line space of the freeform concave grating is variable, a spectral dispersion of the freeform concave grating is greater than or equal to 100 nm/mm, a slit length of the slit is less than or equal to 2.3 mm, a numerical aperture of the freeform concave grating imaging spectrometer is less than or equal to 0.16, and a system length of the freeform concave grating imaging spectrometer is greater than or equal to 37 mm. 10. The freeform concave grating imaging spectrometer of claim 9 , wherein the freeform concave grating imaging spectrometer consists of a single optical element, and the single optical element is the freeform concave grating. 11. The freeform concave grating imaging spectrometer of claim 9 , further comprising a detector configured for recording information on the image surface. 12. The freeform concave grating imaging spectrometer of claim 11 , wherein the detector is located on the image surface. 13. The freeform concave grating imaging spectrometer of claim 11 , wherein the freeform concave grating imaging spectrometer consists of the slit, the freeform concave grating, the image surface, and the detector. 14. The freeform concave grating imaging spectrometer of claim 9 , wherein the slit and the image surface are located on the same side of the freeform concave grating. 15. The freeform concave grating imaging spectrometer of claim 9 , wherein the freeform concave grating is configured to dispersing and imaging incident light beams. 16. The freeform concave grating imaging spectrometer of claim 9 , wherein a spectral range of the freeform concave grating imaging spectrometer is in a range from 400 nm to 1000 nm. 17. The freeform concave grating imaging spectrometer of claim 9 , wherein the slit is a fixed slit, a unilateral adjustable asymmetric slit, or a bilateral adjustable symmetric slit.

Assignees

Inventors

Classifications

  • Multispectral imaging, e.g. filter imaging · CPC title

  • Variable spacing · CPC title

  • G01J3/18Primary

    using diffraction elements, e.g. grating (gratings per se G02B) · CPC title

  • Slit arrangements {slit adjustment} · CPC title

  • G01J3/2823Primary

    Imaging spectrometer · CPC title

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What does patent US11340113B1 cover?
A freeform concave grating imaging spectrometer includes a slit, a freeform concave grating, and an image surface. The lights incident from the slit is irradiated on the freeform concave grating to be dispersed and reflected, to form a reflected light beam. The reflected light beam is irradiated on the image surface, so that the lights of different wavelengths incident from the slit are separat…
Who is the assignee on this patent?
Univ Tsinghua, Hon Hai Prec Ind Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01J3/18. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 24 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).