Gas measurement system

US11327008B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11327008-B2
Application numberUS-201916677769-A
CountryUS
Kind codeB2
Filing dateNov 8, 2019
Priority dateMay 11, 2017
Publication dateMay 10, 2022
Grant dateMay 10, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A gas measurement system as disclosed can include a coherent light source, which emits a light beam; a detector; a beam path formed between the light source) and the detector; and a gas cell arranged in the beam path such that the detector receives light transmitted through the gas cell. The gas cell can include a porous ceramic and have an optical path length which is a multiple of the actual layer thickness of the gas cell. A optical element can be arranged in the beam path between the light source and the gas cell with the light beam emitted by the light being widened and unfocussed as the light beam enters the gas cell.

First claim

Opening claim text (preview).

The invention claimed is: 1. A gas measurement system for absorption-spectroscopic determination of at least one chemical and/or physical parameter of a gaseous measuring medium, comprising: a coherent light source configured to emit a light beam; a detector; a beam path formed between the light source and the detector; a gas cell arranged in the beam path between the light source and the detector such that the detector will receive light transmitted through the gas cell; and an optical element arranged in the beam path between the light source and the gas cell; wherein the gas cell includes a porous ceramic; wherein the gas cell has an optical path length which is a multiple of an actual layer thickness of the gas cell; and wherein the optical element is configured: as an optically transparent window such that widening of a light beam will occur based on divergence of the light beam; or to include a diffuser or at least one diffractive optical element to deform a light beam; such that when a light beam is emitted by the light source it will be widened and unfocused when entering the gas cell. 2. The gas measurement system according to claim 1 , wherein the optical path length is at least 10 times longer than the actual layer thickness of the gas cell. 3. The gas measurement system according to claim 1 , wherein the gas cell and/or the porous ceramic are exchangeable. 4. The gas measurement system according to claim 3 , comprising: a process window. 5. The gas measurement system according to claim 4 , comprising: a further optical element arranged in the beam path between the gas cell and the detector and having an optical window or a reflector. 6. The gas measurement system according to claim 5 , wherein the coherent light source is a laser, or a tunable laser. 7. The gas measurement system according to claim 6 , wherein the detector is a photodetector, a thermopile detector, a bolometer, a pyroelectric detector, a photomultiplier, a photodiode, or a photoresistor. 8. The gas measurement system according to claim 7 , comprising: a sample preparation unit upstream of the gas cell. 9. The gas measurement system according to claim 1 , comprising: a process window. 10. The gas measurement system according to claim 9 , wherein the optical element is configured to function as a process window. 11. The gas measurement system according to claim 1 , comprising: a further optical element arranged in the beam path between the gas cell and the detector and having an optical window or a reflector. 12. The gas measurement system according to claim 1 , wherein the coherent light source is a laser, or a tunable laser. 13. The gas measurement system according to claim 1 , wherein the detector is a photodetector, a thermopile detector, a bolometer, a pyroelectric detector, a photomultiplier, a photodiode, or a photoresistor. 14. The gas measurement system according to claim 1 , comprising: a sample preparation unit upstream of the gas cell. 15. The gas measurement system according to claim 1 , configured to be NeSSI-compatible. 16. The gas measurement system according to claim 1 , wherein the porous ceramic is nanoporous or microporous. 17. The gas measurement system according to claim 1 , wherein the porous ceramic comprises: zirconium oxide, aluminum oxide, titanium oxide, silicon oxide, magnesium oxide, yttrium oxide, gallium phosphide, porous silicon, or mixtures thereof. 18. The gas measurement system according to claim 1 , wherein the optical path length is at least 50 times longer than the actual layer thickness of the gas cell. 19. The gas measurement system according to claim 1 , wherein the optical path length is at least several hundred times longer than the actual layer thickness of the gas cell. 20. Method for absorption-spectroscopic determination of content of one or more gases, the method comprising: emitting a light beam along a beam path between a light source and a detector, the beam path including a gas cell and an optical element, the gas cell having a porous ceramic and having an optical path length which is a multiple of an actual layer thickness of the gas cell; widening and unfocusing the light beam emitted by the light source before it enters the gas cell using an optical element arranged in the beam path between the light source and the gas cell; and determining content of one or more of the following gases using the detector: oxygen (O2), carbon dioxide (CO2), carbon monoxide (CO), nitrogen oxides (NOx), methane (CH4), amines, ammonia (NH3), hydrogen sulfides (H2S), sulfur oxides (SO2), hydrogen halides, HCI or HF, water and/or moisture (H2O), or mixtures thereof.

Assignees

Inventors

Classifications

  • using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction · CPC title

  • Reflectors · CPC title

  • Diode laser · CPC title

  • Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry (beam switching arrangements G01J3/08) · CPC title

  • for analysing gases, e.g. multi-gas analysis · CPC title

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What does patent US11327008B2 cover?
A gas measurement system as disclosed can include a coherent light source, which emits a light beam; a detector; a beam path formed between the light source) and the detector; and a gas cell arranged in the beam path such that the detector receives light transmitted through the gas cell. The gas cell can include a porous ceramic and have an optical path length which is a multiple of the actual …
Who is the assignee on this patent?
Mettler Toledo Gmbh
What technology area does this patent fall under?
Primary CPC classification G01N21/3504. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 10 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).