Frequency-modulating sensor array

US11320329B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11320329-B2
Application numberUS-201715702717-A
CountryUS
Kind codeB2
Filing dateSep 12, 2017
Priority dateSep 12, 2016
Publication dateMay 3, 2022
Grant dateMay 3, 2022

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

Spatially-distributed resonant MEMS sensors are coordinated to generate frequency-modulated signals indicative of a sensed property, such as regional contact forces, ambient conditions and/or environmental composition. The resonant MEMS sensors generate signals that oscillate at respective frequencies corresponding to the sensed property, increasing or decreasing in frequency in response to an increase or decrease in that property to effect a frequency-modulated digital output.

First claim

Opening claim text (preview).

What is claimed is: 1. A sensing apparatus comprising: a first surface; a plurality of resonant MEMS devices each disposed in physical contact with a respective region of the first surface and having a mechanical resonance frequency that varies according to deflection of the first surface in the respective region of physical contact; and readout circuitry to obtain, within a first time interval, information indicative of the respective mechanical resonance frequencies of the plurality of resonant MEMS devices sufficient to identify a locus and amplitude of a force applied to the first surface. 2. The sensing apparatus of claim 1 wherein each of the plurality of resonant MEMS devices comprises a resonant MEMS structure and circuitry to (i) apply an actuating signal to the resonant MEMS structure to sustain at least temporary resonant vibration thereof and (ii) circuitry to sense, as the mechanical resonance frequency of the resonant MEMS device, a frequency of the resonant vibration. 3. The sensing apparatus of claim 2 wherein the circuitry to apply the actuating signal to the resonant MEMS structure comprises at least one of (i) circuitry to generate the actuating signal or (ii) circuitry to receive the actuating signal from an external source. 4. The sensing apparatus of claim 1 wherein the first surface comprises a substantially planar surface that encompasses the respective regions of physical contact of at least a portion of the plurality of resonant MEMS devices, the substantially planar surface subject to localized deflection in response to the applied force. 5. The sensing apparatus of claim 1 further comprising circuitry to generate, based on the information indicative of the respective mechanical resonance frequencies, information indicative of the locus and amplitude of the force applied to the first surface. 6. The sensing apparatus of claim 1 wherein the information indicative of the mechanical resonance frequencies comprises a first set of resonance frequency values and wherein the readout circuitry to obtain the first set of resonance frequency values within the first time interval is additionally to obtain, over a sequence of time intervals that follow the first time interval, additional sets of resonance frequency values, the sensing apparatus further comprising circuitry to generate, based on the first set of resonance frequency values and the additional sets of resonance frequency values, information indicative of motion of an object in physical contact with the first surface. 7. The sensing apparatus of claim 6 wherein the circuitry to generate the information indicative of motion of the object in physical contact with the first surface comprises circuitry to generate information indicative of force applied to the first surface by the object as the object moves. 8. The sensing apparatus of claim 1 wherein the readout circuitry to obtain the information indicative of respective mechanical frequencies comprises circuitry to receive, from each of the plurality of resonant MEMS devices, a respective digital value indicative of the mechanical resonance frequency of the resonant MEMS device during the first time interval. 9. The sensing apparatus of claim 8 wherein each of the resonant MEMS devices comprises a resonant MEMS structure and circuitry to (i) enable resonant vibration of the resonant MEMS structure, (ii) generate an oscillating signal in response to the resonant vibration, (iii) detect a frequency of the oscillating signal and (iv) generate, as the respective digital value indicative of the mechanical resonance frequency, a multi-bit digital numeric value according to the frequency of the oscillating signal. 10. The sensing apparatus of claim 1 wherein the readout circuitry to obtain information indicative of the respective mechanical resonance frequencies sufficient to identify the locus of the force applied to the first surface comprises circuitry to obtain information that enables triangulation of a position on the first surface at which the force is applied. 11. The sensing apparatus of claim 1 wherein obtaining information indicative of the respective mechanical resonance frequencies sufficient to identify the locus of the force applied to the first surface comprises obtaining information that enables triangulation of a position on the first surface at which the force is applied. 12. A method of operation within a sensing apparatus having a first surface and a plurality of MEMS devices disposed in physical contact with respective regions of the first surface, the method comprising: enabling a respective resonant member within each of the plurality of MEMS devices to vibrate at a respective resonance frequency that varies according to deflection of the first surface in the respective region of physical contact; and obtaining from the plurality of MEMS devices, within a first time interval, information indicative of the respective mechanical resonance frequencies of the vibrating resonance members thereof sufficient to identify a locus and amplitude of a force applied to the first surface. 13. The method of claim 12 wherein enabling the respective resonant member within each of the plurality of MEMS devices to vibrate at the respective resonance frequency comprises applying an actuating signal to the resonant MEMS structure to sustain at least temporary resonant vibration thereof, and wherein obtaining the information indicative of the respective mechanical resonance frequencies comprises sensing vibrational frequencies of the respective resonant members of the MEMS devices. 14. The method of claim 13 wherein applying the actuating signal to the resonant MEMS structure to sustain at least temporary resonant vibration thereof comprises at least one of (i) generating the actuating signal within the MEMS device containing the resonant MEMS structure or (ii) generating the actuating signal externally to the MEMS device containing the resonant MEMS structure and supplying the actuating signal to the MEMS device. 15. The method of claim 14 wherein the first surface comprises a substantially planar surface that encompasses the respective regions of physical contact of at least a portion of the plurality of resonant MEMS devices and that is subject to localized deflection in response to the applied force, and wherein obtaining information indicative of the respective mechanical resonance frequencies of the vibrating resonance members sufficient to identify the locus and amplitude of the force applied to the first surface comprises generating information indicative of locus and amplitude of a force applied to the substantially planar surface. 16. The method of claim 12 further comprising generating, based on the information indicative of the respective mechanical resonance frequencies, information indicative of the locus and amplitude of the force applied to the first surface. 17. The method of claim 12 wherein the information indicative of the mechanical resonance frequencies comprises a first set of resonance frequency values, and wherein the method further comprises: obtaining, over a sequence of time intervals that follow the first time interval, additional sets of resonance frequency values; and generating, based on the first set of resonance frequency values and the additional sets of resonance frequency values, information indicative of motion of an object in physical contact with the first surface. 18. The method of claim 17 wherein generating the information indicative of motion of the object in physical contact with the firs

Assignees

Inventors

Classifications

  • using distributed sensing elements · CPC title

  • for measuring force distributions, e.g. using force arrays (G01L1/148 takes precedence) · CPC title

  • of an element not provided for in the following subgroups of G01L9/0008 · CPC title

  • G01L5/16Primary

    for measuring several components of force · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11320329B2 cover?
Spatially-distributed resonant MEMS sensors are coordinated to generate frequency-modulated signals indicative of a sensed property, such as regional contact forces, ambient conditions and/or environmental composition. The resonant MEMS sensors generate signals that oscillate at respective frequencies corresponding to the sensed property, increasing or decreasing in frequency in response to an …
Who is the assignee on this patent?
Sitime Corp
What technology area does this patent fall under?
Primary CPC classification G01L5/16. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 03 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).