Solar cell manufacturing method and solar cell
US-2017301805-A1 · Oct 19, 2017 · US
US11316061B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11316061-B2 |
| Application number | US-202017071647-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 15, 2020 |
| Priority date | Oct 31, 2014 |
| Publication date | Apr 26, 2022 |
| Grant date | Apr 26, 2022 |
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n-type amorphous semiconductor layers (4) and p-type amorphous semiconductor layers (5) are alternately disposed on the back surface of a semiconductor substrate (1) so as to be separated from each other at a desired interval paralleled with the direction of the surface of the semiconductor substrate (1). An electrode (6) is disposed on the n-type amorphous semiconductor layer (4), and an electrode (7) is disposed on the p-type amorphous semiconductor layer (5). A protective film (8) includes an insulating film, and is disposed on a passivation film (3), the n-type amorphous semiconductor layer (4), the p-type amorphous semiconductor layer (5), and the electrodes (6, 7), so as to be in contact with the passivation film (3), the n-type amorphous semiconductor layer (4), the p-type amorphous semiconductor layer (5), and the electrodes (6, 7).
Opening claim text (preview).
The invention claimed is: 1. A photovoltaic device comprising: a monocrystalline silicon substrate; a first amorphous semiconductor layer on a surface of the monocrystalline silicon substrate and having a first conductivity type; a second amorphous semiconductor layer on the surface of the monocrystalline silicon substrate adjacent to and spaced apart from the first amorphous semiconductor layer and having a second conductivity type opposite to the first conductivity type; a first electrode on the first amorphous semiconductor layer; and a second electrode on the second amorphous semiconductor layer and spaced apart from the first electrode; wherein the first amorphous semiconductor layer includes a first flat region and a first thickness decreasing region adjoining the first flat region in a first direction which is a width direction of the first amorphous semiconductor layer, the first flat region is a region which has the thickest film thickness in a direction perpendicular to the first direction of the first amorphous semiconductor layer, the first thickness decreasing region extending from the first flat region to a point of the first amorphous semiconductor layer at which a decrease rate of a thickness of the first amorphous semiconductor layer is changed from a first decrease rate to a second decrease rate greater than the first decrease rate, wherein the first thickness decreasing region is, along the first direction, disposed on both sides of the first flat region, and wherein the first electrode is disposed on the first flat region and on the first thickness decreasing region which is disposed on the both sides of the first flat region along the first direction. 2. The photovoltaic device according to claim 1 , wherein dopant concentration of the first thickness decreasing region is higher than dopant concentration of the first flat region. 3. The photovoltaic device according to claim 2 , wherein the monocrystalline silicon substrate has the second conductivity type. 4. The photovoltaic device according to claim 1 , wherein the second amorphous semiconductor layer includes a second flat region and a second thickness decreasing region adjoining the second flat region in a second direction which is a width direction of the second amorphous semiconductor layer, the second flat region is a region which has the thickest film thickness in a direction perpendicular to the second direction of the second amorphous semiconductor layer, the second thickness decreasing region is a region which has a film thickness smaller than the thickest film thickness of the second flat region. 5. The photovoltaic device according to claim 4 , wherein dopant concentration of the second thickness decreasing region is higher than dopant concentration of the second flat region. 6. The photovoltaic device according to claim 4 , wherein the second electrode is disposed on the second thickness decreasing region and the second flat region.
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