Digital grip gauge with shaped tip

US11313660B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11313660-B2
Application numberUS-202016834364-A
CountryUS
Kind codeB2
Filing dateMar 30, 2020
Priority dateMar 30, 2020
Publication dateApr 26, 2022
Grant dateApr 26, 2022

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  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

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  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

In an embodiment, an apparatus includes one or more probes, a tip, a pin, and a measurement device. The one or more probes may be configured for insertion through an aperture in a component. The tip may be slidably engaged with the one or more probes and include a first end configured to contact a first surface of the component. The first end of the tip may be conically shaped. The pin may be slidably engaged with the one or more probes and include a first end configured for insertion into the aperture in the component such that the one or more probes are configured to contact a second surface of the component. The pin may be configured to move between a first position and a second position. An axis of the pin may be substantially aligned with an axis of the tip. The measurement device may be coupled to the tip and configured to measure a value indicating a grip length.

First claim

Opening claim text (preview).

What is claimed is: 1. An apparatus, comprising: one or more probes configured for insertion through an aperture in a component; a tip slidably engaged with the one or more probes, the tip comprising a first end configured to contact a first surface of the component, wherein the first end of the tip is conically shaped; a pin slidably engaged with the one or more probes, the pin comprising a first end configured for insertion into the aperture in the component such that the one or more probes are configured to contact a second surface of the component, wherein an axis of the pin is substantially aligned with an axis of the tip and the pin is configured to move between a first position and a second position; a sleeve at least partially surrounding the tip; one or more terminals positioned on the sleeve and configured to contact a third surface of the component; and a measurement device coupled to the tip and configured to measure a value indicating a grip length. 2. The apparatus of claim 1 , wherein the measurement device is configured to measure the value indicating the grip length when the one or more terminals contact the third surface of the component. 3. The apparatus of claim 1 , wherein the measurement device is configured to measure the value indicating the grip length when an indicator of the value remains within a tolerance for a predetermined period of time. 4. The apparatus of claim 1 , wherein the measurement device is configured to measure the value indicating the grip length in response to input from a user. 5. The apparatus of claim 1 , further comprising a circuit configured to determine when the pin is in the second position. 6. The apparatus of claim 1 , wherein at least one of the one or more probes is configured to couple to a housing. 7. A system, comprising: a gauge comprising: one or more probes configured for insertion through an aperture in a component; a tip slidably engaged with the one or more probes, the tip comprising a first end configured to contact a first surface of the component; a pin slidably engaged with the one or more probes, the pin comprising a first end configured for insertion into the aperture in the component such that the one or more probes are configured to contact a second surface of the component, wherein an axis of the pin is substantially aligned with an axis of the tip; a sleeve at least partially surrounding the tip; one or more terminals positioned on the sleeve and configured to contact a third surface of the component; and a measurement device coupled to the tip and configured to measure a value indicating a grip length; and a receiving unit configured to receive data transmitted by the gauge. 8. The system of claim 7 , wherein the first end of the tip is conically shaped. 9. The system of claim 7 , wherein the gauge further comprises an actuator configured to move the pin between a first position and a second position. 10. The system of claim 7 , wherein the gauge further comprises a display configured to show the value indicating the grip length. 11. The system of claim 7 , wherein the gauge further comprises a transmitter coupled to the measurement device, the transmitter configured to transmit to the receiving unit data indicative of a fastener for use in the aperture in the component. 12. The system of claim 11 , wherein the receiving unit is configured to store data associating the fastener with the aperture. 13. The system of claim 11 , wherein the transmitter is configured to transmit the data indicative of the fastener in response to input from a user. 14. A method, comprising: inserting one or more probes of a grip gauge through an aperture in a component, wherein the grip gauge comprises: a tip slidably engaged with the one or more probes, the tip comprising a first end configured to contact a first surface of the component; and a pin slidably engaged with the one or more probes, the pin configured for insertion in the aperture in the component such that the one or more probes are configured to contact a second surface of the component, wherein an axis of the pin is substantially aligned with an axis of the tip and the pin is configured to move between a first position and a second position; a sleeve at least partially surrounding the tip; one or more terminals positioned on the sleeve and configured to contact a third surface of the component; and determining a grip length for a fastener to be used in the aperture in the component based on a measurement performed using the tip. 15. The method of claim 14 , wherein the measurement is performed in response to input from a user. 16. The method of claim 14 , further comprising: performing the measurement when a value indicating the grip length remains within a tolerance for a predetermined period of time. 17. The method of claim 14 , further comprising: indicating the grip length and the fastener to be used on a display. 18. The method of claim 14 , further comprising: indicating to a user that a measurement device has performed the measurement with a visual or an auditory alert. 19. The method of claim 14 , further comprising: transmitting data indicative of the fastener to be used to a receiver.

Assignees

Inventors

Classifications

  • G01B3/20Primary

    Slide gauges · CPC title

  • G01B5/043Primary

    for measuring length · CPC title

  • Wireless transmission of information between a sensor or probe and a control or evaluation unit · CPC title

  • Depth gauges · CPC title

  • Feeler-pin gauges, e.g. dial gauges (for measuring contours or curvatures G01B5/20) · CPC title

Patent family

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Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11313660B2 cover?
In an embodiment, an apparatus includes one or more probes, a tip, a pin, and a measurement device. The one or more probes may be configured for insertion through an aperture in a component. The tip may be slidably engaged with the one or more probes and include a first end configured to contact a first surface of the component. The first end of the tip may be conically shaped. The pin may be s…
Who is the assignee on this patent?
Lockheed Corp
What technology area does this patent fall under?
Primary CPC classification G01B3/20. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 26 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).