Mode I fracture testing fixture

US11298754B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-11298754-B1
Application numberUS-202016878731-A
CountryUS
Kind codeB1
Filing dateMay 20, 2020
Priority dateMay 20, 2020
Publication dateApr 12, 2022
Grant dateApr 12, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An apparatus and method for preparing Double Cantilever Beam (DCB) specimens are disclosed as an apparatus and method for conducting Mode I fracture resistance testing using the DCB specimens. In a first embodiment, a drill jig is used to locate the DCB specimen and guide a drilling process during creation of at least one through-hole in the DCB specimen. The drilling process may employ a traditional drill and drill bit, a laser drill, or a water jet. In another embodiment, a set of rotating pin blocks, each with a full-round or a half-round specimen pin at one end and a hanger full-round pin at the other end, engage the DCB specimen and facilitate the internal application of a fracturing load to the DCB specimen for the Mode I fracture resistance test. The present invention may significantly reduce the time and materials needed to prepare and test a DCB specimen.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for conducting a Double Cantilever Beam (DCB) test comprising the steps of: providing upper and lower pin block hangers; providing at least two rotating pin blocks, each of the at least two rotating pin blocks including a specimen half-round pin and a hanger full-round pin, each specimen half-round pin substantially parallel to a corresponding hanger full-round pin; providing a DCB specimen having one hole therethrough; rotationally mechanically coupling each hanger full-round pin of each of the at least two rotating pin blocks to a corresponding one of the upper and lower pin block hangers; rotationally mechanically coupling each specimen half-round pin of each of the at least two rotating pin blocks to the DCB specimen via the one hole in the DCB specimen; applying a fracturing load to the DCB specimen via the at least two rotating pin blocks and the upper and lower pin block hangers; recording the applied fracturing load as a function of time; recording an interlaminar delamination crack length as a function of time; and calculating the strain energy release rate of the DCB specimen based upon the recorded applied fracturing load and the recorded interlaminar delamination crack length. 2. The method of claim 1 , further comprising the step of performing fractography. 3. The method of claim 1 , wherein a flat surface of a specimen half-round pin of a first of the at least two rotating pin blocks is adapted to face a corresponding flat surface of an opposing specimen half-round pin of a second of the at least two rotating pin blocks. 4. The method of claim 1 , wherein the at least two rotating pin blocks includes four rotating pin blocks; wherein an end of a specimen half-round pin or a hanger full-round pin of each of the four rotating pin blocks includes a portion of an interlocking feature; and wherein the portion of the interlocking feature of a first of the four rotating pin blocks is adapted to fixedly mechanical couple with the portion of the interlocking feature of a second of the four rotating pin blocks. 5. The method of claim 4 , wherein the interlocking feature includes one of a rod and corresponding recess, a tab and corresponding slot, and meshing teeth. 6. The method of claim 1 , wherein each specimen half-round pin and each hanger full-round pin of each of the at least two rotating pin blocks is fixedly or removably attached to a body of a corresponding one of the at least two rotating pin blocks. 7. The method of claim 1 , further comprising the step of preparing the DCB specimen, the step of preparing the DCB specimen including the steps of: locating the DCB specimen within a drill jig; aligning a drill with the DCB specimen at a predetermined position, the predetermined position being aligned with a laminar interface between first and second joined adherend layers that form the DCB specimen; drilling the one hole through the DCB specimen at the predetermined position.

Assignees

Inventors

Classifications

  • Chucks, fixtures, jaws, holders or anvils · CPC title

  • Peeling or tearing · CPC title

  • by applying steady shearing forces (G01N3/26, G01N3/28 take precedence) · CPC title

  • Drilling jigs with means to affix the jig to the workpiece · CPC title

  • B23B47/28Primary

    Drill jigs for workpieces (equipment for setting or guiding the drill B23B49/00) · CPC title

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What does patent US11298754B1 cover?
An apparatus and method for preparing Double Cantilever Beam (DCB) specimens are disclosed as an apparatus and method for conducting Mode I fracture resistance testing using the DCB specimens. In a first embodiment, a drill jig is used to locate the DCB specimen and guide a drilling process during creation of at least one through-hole in the DCB specimen. The drilling process may employ a tradi…
Who is the assignee on this patent?
Nat Tech & Eng Solutions Sandia Llc
What technology area does this patent fall under?
Primary CPC classification B23B47/28. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Apr 12 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).