Resistive sensor based data acquisition system using low distortion analog front-end and digital gain error correction

Patent metadata

Field	Value
Publication number	US-11290120-B2
Application number	US-202016987254-A
Country	US
Kind code	B2
Filing date	Aug 6, 2020
Priority date	Aug 6, 2020
Publication date	Mar 29, 2022
Grant date	Mar 29, 2022

Abstract

A data acquisition system (DAS) for processing an input signal from a resistive sensor (e.g., Hall effect sensor) includes a sensor signal path that digitizes the input signal. An input impedance of the sensor signal path attenuates the input signal. A gain error corrector applies a gain error correction factor in a digital domain of the DAS to the digitized input signal to compensate for a loading effect to the resistive sensor. The sensor signal path includes an inverting amplifier that provides low distortion for the input signal and an ADC (e.g., delta-sigma, SAR, pipelined, auxiliary) that digitizes the input signal. A sensor characterization path digitizes the sensor resistance which the gain error corrector uses, along with the inverting amplifier input impedance, to calculate the gain error correction factor.

First claim

The invention claimed is:

1. A data acquisition system (DAS) for processing an input signal from a resistive sensor, comprising:
a sensor signal path that digitizes the input signal;
wherein an input impedance of the sensor signal path attenuates the input signal;
a gain error corrector that applies a gain error correction factor in a digital domain of the DAS to the digitized input signal to compensate for a loading effect to the resistive sensor;
a sensor characterization path that characterizes a resistance of the sensor; and
wherein the gain error corrector uses the characterized resistance of the sensor to determine the gain error correction factor.

2. The DAS of claim 1 , wherein the sensor signal path comprises:
an analog front-end circuit that comprises an inverting amplifier that provides low distortion for the input signal.

3. The DAS of claim 1 , wherein the sensor signal path comprises an analog-to-digital converter (ADC).

4. The DAS of claim 3 , wherein the ADC is one of the following: a delta-sigma analog-to-digital converter (ADC), a successive approximation register (SAR) ADC, a pipelined ADC, or an auxiliary ADC for digitizing the input signal.

5. The DAS of claim 1 , wherein the gain error corrector further uses the input impedance of the sensor signal path to determine the gain error correction factor.

6. The DAS of claim 1 , wherein the gain error corrector applies the gain error correction factor determined by the sensor characterization path to the digitized input signal continuously in real time to account for temperature drift.

7. The DAS of claim 1 , wherein the sensor characterization path comprises an analog-to-digital converter (ADC).

8. The DAS of claim 7 , wherein the ADC is one of the following: a delta-sigma ADC, a successive approximation register (SAR) ADC, a pipelined ADC, or an auxiliary ADC for digitizing the sensor resistance.

9. The DAS of claim 7 , wherein the sensor characterization path further comprises:
an analog front-end circuit, coupled to the ADC, that comprises an amplifier.

10. The DAS of claim 1 , wherein the resistive sensor comprises a Hall effect sensor.

11. A method for using a data acquisition system (DAS) to process an input signal from a resistive sensor, comprising:
digitizing, by a sensor signal path of the DAS, the input signal;
wherein an input impedance of the sensor signal path attenuates the input signal from the resistive sensor;
applying, in a digital domain, a gain error correction factor to the digitized input signal to compensate for a loading effect to the resistive sensor;
characterizing, by a sensor characterization path of the DAS, a resistance of the sensor; and
using the characterized sensor resistance to determine the gain error correction factor.

12. The method of claim 11 , further comprising:
using an inverting amplifier as an analog front-end circuit of the sensor signal path to provide low distortion for the input signal.

13. The method of claim 11 , wherein said digitizing the input signal is performed by an analog-to-digital converter (ADC).

14. The method of claim 11 , further comprising:
further using the input impedance of the sensor signal path to determine the gain error correction factor.

15. The method of claim 11 , wherein said applying the gain error correction factor to the digitized input signal comprises:
applying the gain error correction factor characterized by the sensor characterization path to the digitized input signal continuously in real time to account for temperature drift.

16. The method of claim 11 , wherein said characterizing the resistance of the sensor comprises digitizing the sensor resistance using an analog-to-digital converter (ADC).

17. The method of claim 11 , wherein the resistive sensor comprises a Hall effect sensor.

18. A method using a system to measure a signal from a Hall effect sensor, comprising:
the system having a measurement resistance that attenuates the signal from the Hall effect sensor;
measuring the signal from the Hall effect sensor;
measuring a resistance of the Hall effect sensor;
calculating a gain error correction factor as a function of the measurement resistance of the system and the measured resistance of the Hall effect sensor; and
applying the gain error correction factor to the measured signal from the Hall effect sensor.

19. The method of claim 18 , wherein the system comprises an inverting amplifier that receives the signal from the Hall effect sensor, wherein the inverting amplifier has an input resistance that comprises the measurement resistance of the system.

20. The method of claim 18 , wherein said applying the gain error correction factor to the measured signal from the Hall effect sensor is performed in a digital domain.

Assignees

• Cirrus Logic Int Semiconductor Ltd
• Cirrus Logic Inc

Inventors

• Lee Seung Bae
• Melanson John L
• Bhattacharya Anindya
• Drakshapalli Prashanth

Classifications

• G01R33/07

  Hall effect devices · CPC title

• G01R33/0023 Primary

  Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration (G01R33/0017 takes precedence) · CPC title

• G01R15/20

  using galvano-magnetic devices, e.g. Hall-effect devices {, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices} · CPC title

• H03M1/1047

  using an auxiliary digital/analogue converter for adding the correction values to the analogue signal (H03M1/1052 takes precedence) · CPC title

• H03M1/38 Primary

  sequentially only, e.g. successive approximation type (converting more than one bit per step H03M1/14) · CPC title