Surface property measurement method, surface property measurement apparatus, and recording medium

Patent metadata

Field	Value
Publication number	US-11284863-B2
Application number	US-201615763301-A
Country	US
Kind code	B2
Filing date	Sep 13, 2016
Priority date	Sep 29, 2015
Publication date	Mar 29, 2022
Grant date	Mar 29, 2022

Abstract

A surface property measurement technology by which a surface property of a substance can be evaluated with high accuracy, is provided.A surface property measurement method includes radiating an ultrasonic wave to a measurement target and acquiring a reflected signal from the measurement target; calculating, by a measurement apparatus, a maximum value of a cross-correlation function between the reflected signal from the measurement target and a reference reflected signal from a reference substance acquired in advance; calculating a reflection component at an interface, by using the maximum value of the cross-correlation function; and outputting, as a measurement value, one of an acoustic impedance of the measurement target or an acoustic impedance of the reference substance, according to a result of comparing the reflection component with the reference reflected signal.

First claim

The invention claimed is:

1. A surface property measurement method comprising:
radiating an ultrasonic wave to a measurement target and acquiring a reflected signal from the measurement target;
calculating, by a measurement apparatus, a maximum value of a cross-correlation function between the reflected signal from the measurement target and a reference reflected signal from a reference substance acquired in advance;
calculating a reflection component at an interface, by using the maximum value of the cross-correlation function;
outputting, as a measurement value, one of an acoustic impedance of the measurement target or an acoustic impedance of the reference substance, according to a result of comparing the reflection component with the reference reflected signal, and
outputting the acoustic impedance of the reference substance, upon determining that an intensity of the reflection component is not lower than an intensity of the reference reflected signal.

2. The surface property measurement method according to claim 1 , further comprising:
calculating and outputting the acoustic impedance of the measurement target, upon determining that an intensity of the reflection component is lower than an intensity of the reference reflected signal.

3. The surface property measurement method according to claim 1 , wherein the calculating of the reflection component includes multiplying the reference reflected signal by a ratio of the reflected signal from the measurement target to the reference reflected signal and by the maximum value of the cross-correlation function.

4. The surface property measurement method according to claim 1 , further comprising:
one-dimensionally or two-dimensionally and relatively scanning the ultrasonic wave to the measurement target; and
outputting the measurement value for each coordinate point.

5. The surface property measurement method according to claim 1 , wherein the radiating of the ultrasonic wave includes radiating the ultrasonic wave upon bringing an acoustic window of a probe of the measurement apparatus in contact with the measurement target.

6. The surface property measurement method according to claim 1 , wherein the reference substance is water or a gelatinous substance.

7. The surface property measurement method according to claim 1 , wherein
the measurement target is skin, and wherein
the surface property measurement method further comprises:
evaluating at least one of elasticity, texture, pores, and wrinkles of the skin, based on the measurement value.

8. The surface property measurement method according to claim 1 , wherein
the measurement target is an organic or inorganic, single-layered or multilayered substance, and wherein
the surface property measurement method further comprises:
evaluating at least one of surface roughness, elasticity, and defects of an outermost layer of the measurement target, based on the measurement value.

9. A non-transitory computer-readable recording medium storing a surface property measurement program that causes a computer to execute a process, the process comprising:
acquiring a reflected signal of an ultrasonic wave radiated to a measurement target;
calculating a maximum value of a cross-correlation function between the reflected signal from the measurement target and a reference reflected signal from a reference substance acquired in advance;
calculating a reflection component at an interface, by using the maximum value of the cross-correlation function;
outputting, as a measurement value, one of an acoustic impedance of the measurement target or an acoustic impedance of the reference substance, according to a result of comparing the reflection component with the reference reflected signal, and
outputting the acoustic impedance of the reference substance, upon determining that an intensity of the reflection component is not lower than an intensity of the reference reflected signal.

10. A surface property measurement apparatus comprising:
an ultrasonic wave transmitting/receiving unit configured to radiate an ultrasonic wave to a measurement target and receive a reflected signal from the measurement target;
a memory configured to store an intensity of a reference reflected signal from a reference substance measured in advance, and an acoustic impedance of the reference substance; and
a signal processing unit configured to calculate a reflection component at an interface, based on a maximum value of a cross-correlation function between the reflected signal from the measurement target and the reference reflected signal, and output, as a measurement value, one of an acoustic impedance of the measurement target or the acoustic impedance of the reference substance, according to a result of comparing the reflection component with the reference reflected signal,
wherein the signal processing unit reads, from the memory, and outputs the acoustic impedance of the reference substance, upon determining that an intensity of the reflection component is not lower than the intensity of the reference reflected signal.

11. The surface property measurement apparatus according to claim 10 , wherein the signal processing unit calculates and outputs the acoustic impedance of the measurement target, upon determining that an intensity of the reflection component is lower than the intensity of the reference reflected signal.

Assignees

• Shiseido Co Ltd
• National Univ Corporation Toyohashi Univ Of Technology
• Honda Electronic

Inventors

• Ogura Yuki
• Hozumi Naohiro
• Yoshida Sachiko
• Kobayashi Kazuto
• Hara Yusuke

Classifications

• A61B8/485 Primary

  involving measuring strain or elastic properties · CPC title

• G01N2291/015

  Attenuation, scattering · CPC title

• G01N29/041

  on the surface of the material, e.g. using Lamb, Rayleigh or shear waves · CPC title

• G01N29/11

  by measuring attenuation of acoustic waves · CPC title

• G01N29/4436

  with a reference signal (amplitude comparison G01N29/48) · CPC title