Vapor phase epitaxy method

Patent metadata

Field	Value
Publication number	US-11280025-B2
Application number	US-202017129720-A
Country	US
Kind code	B2
Filing date	Dec 21, 2020
Priority date	Dec 20, 2019
Publication date	Mar 22, 2022
Grant date	Mar 22, 2022

Abstract

A vapor phase epitaxy method including: providing a III-V substrate of a first conductivity type, introducing the III-V substrate into a reaction chamber of a vapor phase epitaxy system at a loading temperature, heating the III-V substrate from the loading temperature to an epitaxy temperature while introducing an initial gas flow, depositing a III-V layer with a dopant concentration of a dopant of the first conductivity type on a surface of the III-V substrate from the vapor phase from an epitaxial gas flow, fed into the reaction chamber and comprising the carrier gas, the first precursor, and at least one second precursor for an element of main group III, wherein during the heating from the loading temperature to the epitaxy temperature, a third precursor for a dopant of the first conductivity type is added to the initial gas flow.

First claim

What is claimed is:

1. A vapor phase epitaxy method comprising:
providing a III-V substrate of a first conductivity type;
introducing the III-V substrate into a reaction chamber of a vapor phase epitaxy system at a loading temperature;
heating the III-V substrate from the loading temperature to an epitaxy temperature while introducing an initial gas flow comprising a carrier gas and a first precursor for a first element from main group V;
depositing a III-V layer with a dopant concentration of a dopant of the first conductivity type on a surface of the III-V substrate from the vapor phase from an epitaxial gas flow, fed into the reaction chamber and comprising the carrier gas, the first precursor, and at least one second precursor for an element of main group III; and
adding, during the heating from the loading temperature to the epitaxy temperature, a third precursor for a dopant of the first conductivity type to the initial gas flow.

2. The vapor phase epitaxy method according to claim 1 , wherein the addition of the third precursor begins during the heating below a temperature of 500° C. or below a temperature of 400° C. or below a temperature of 300° C.

3. The vapor phase epitaxy method according to claim 1 , wherein a total mass flow of the initial gas flow is at most 10% of a total mass flow of the epitaxial gas flow.

4. The vapor phase epitaxy method according to claim 1 , wherein a planetary reactor is used as the reaction chamber.

5. The vapor phase epitaxy method according to claim 1 , wherein a III-V substrate with a dopant concentration of at least 1·10 17 cm −3 or at least 1·10 18 cm −3 is provided.

6. The vapor phase epitaxy method according to claim 1 , wherein the III-V layer is grown with a dopant concentration decreasing from 10 17 cm −3 to 10 15 cm −3 .

7. The vapor phase epitaxy method according to claim 1 , wherein the III-V layer is grown with a layer thickness of at most 30 μm.

8. The vapor phase epitaxy method according to claim 1 , wherein the first conductivity type is p or n.

9. The vapor phase epitaxy method according to claim 1 , wherein the III-V layer is grown firmly bonded on the surface of the III-V substrate.

10. The vapor phase epitaxy method according to claim 1 , wherein the dopant concentration within the III-V layer is set by a ratio of a mass flow of the first precursor to a mass flow of the second precursor and/or by a mass flow, added to the epitaxial gas flow, of the third precursor.

11. The vapor phase epitaxy method according to claim 1 , wherein the third precursor is dimethylzinc or diethylzinc or carbon tetrabromide or 1,2-bis(cyclopentadienyl)magnesium or monosilane or disilane or dimethyl telluride or diethyl telluride or diisopropyl telluride.

12. The vapor phase epitaxy method according to claim 1 , wherein the III-V substrate has a constant dopant concentration over a layer thickness or a dopant concentration that changes by at most 1%.

13. The vapor phase epitaxy method according to claim 1 , wherein the III-V substrate comprises or consists of GaAs.

14. The vapor phase epitaxy method according to claim 1 , wherein the epitaxy temperature is at least 550° C. or at least 600° C. and at most 900° C.

15. The vapor phase epitaxy method according to claim 1 , wherein the addition of the third precursor begins during the heating starting from a temperature of at least 150° C. or at least starting from a temperature of 200° C.

Assignees

• Azur Space Solar Power Gmbh

Inventors

• WAECHTER Clemens
• Keller Gregor

Classifications

• H10P14/24

  using chemical vapour deposition [CVD] · CPC title

• H10P14/3444

  P-type · CPC title

• H10P14/3442

  N-type · CPC title

• H10P14/2911

  Arsenides · CPC title

• H10P14/3414

  being group IIIA-VIA materials · CPC title