Diagnostic for pulsed solenoid I/P functionality

Patent metadata

Field	Value
Publication number	US-11269017-B2
Application number	US-202016778814-A
Country	US
Kind code	B2
Filing date	Jan 31, 2020
Priority date	Jan 31, 2020
Publication date	Mar 8, 2022
Grant date	Mar 8, 2022

Abstract

Techniques for diagnosing failures in a digital solenoid I/P converter are provided herein. A controller of the I/P converter may apply a fixed voltage to the I/P converter, causing an armature to move from an off-position to an on-position in a properly-functioning I/P converter. The controller may receive an indication of whether a digital logic line trip has occurred, indicating that a current for the I/P coil has reached a desired maximum current level, and an elapsed time from the application of the fixed voltage. The controller may compare the amount of time elapsed from the application of the fixed voltage to an expected amount of elapsed time from the application of the fixed voltage to the I/P coil after which a digital logic line trip will occur for a properly functioning I/P coil and diagnose, based on the comparison, a failure in the I/P converter.

First claim

What is claimed is:

1. A method for diagnosing failures in a digital solenoid I/P converter of a field device in a process control system, wherein the digital solenoid I/P converter includes an I/P coil and drive circuitry, and wherein the digital solenoid I/P converter, when actuated, causes an armature to move from an off-position to an on-position, the method comprising:
establishing that a fixed voltage has been applied to the I/P coil at a first time;
receiving, from a current sensor, an indication of a current level associated with the I/P coil;
performing a first comparison of the indication of the current level associated with the I/P coil and a desired maximum current level;
causing, based on the comparison, a digital logic line to trip when the current level associated with the I/P coil reaches the desired maximum current level;
receiving, from a timer, an indication of an amount of time that has elapsed from the first time to a second time, the second time being a time associated with the digital logic line trip;
performing a second comparison of (i) the amount of time elapsed from the first time to the second time and (ii) an expected amount of elapsed time from the application of the fixed voltage to the I/P coil after which the digital logic line will trip for a properly functioning I/P coil and drive circuitry;
determining, based on the second comparison, whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed; and
causing a controller to take a control action changing the operation of the process control system based on determining that one or more of the I/P coil or the drive circuitry has failed, wherein the control action includes switching from using the field device in the process control system to using a second, redundant field device in the process control system.

2. The method of claim 1 , wherein determining whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed further comprises:
determining, based on the amount of time elapsed from the first time to the second time being substantially equal to the expected amount of elapsed time, that the I/P coil and drive circuitry are properly functioning.

3. The method of claim 1 , wherein determining whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed further comprises:
determining, based on the digital logic line not tripping after the expected amount of elapsed time from the first time, that the I/P coil or the drive circuitry have failed due to an open circuit in the I/P coil or drive circuitry.

4. The method of claim 1 , wherein determining whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed further comprises:
determining, based the amount of time elapsed from the first time to the second time being smaller than the expected amount of elapsed time by greater than a threshold amount of time, that one or more of the I/P coil or the drive circuitry have failed due to a short circuit in one or more of the I/P coil or drive circuitry.

5. The method of claim 1 , wherein determining whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed further comprises:
determining, based the amount of time elapsed from the first time to the second time being smaller than the expected amount of elapsed time by less than a threshold amount of time, that one or more of the I/P coil or the drive circuitry have failed due to the armature already being in the on-position or due to the armature failing to move from the off-position to the on-position.

6. The method of claim 1 , further comprising:
generating an alert based on determining that one or more of the I/P coil or the drive circuitry has failed.

7. The method of claim 1 , further comprising:
removing the fixed voltage applied to the I/P coil after a threshold period of time has elapsed from the time of the application of the fixed voltage to the I/P coil.

8. A system for diagnosing failures in a digital solenoid I/P converter in a process control system, the system comprising:
a digital solenoid I/P converter of a field device of the process control system, including an I/P coil and drive circuitry, the digital solenoid I/P converter being configured to cause an armature to move from an off-position to an on-position when actuated;
a controller configured to cause a fixed voltage to be applied to the I/P coil at a first time;
a current sensor configured to sense an amount of current associated with the I/P coil;
a timer configured to determine an amount of time elapsed from the first time; and
a diagnostic circuit configured to:
perform a first comparison of the sensed amount of current associated with the I/P coil and a maximum desired current level;
cause, based on the first comparison, a digital logic line to trip when the sensed amount of current associated with the I/P coil reaches the maximum desired current level;
receive, from the timer, an indication of an amount of time that has elapsed from the first time to a second time associated with the tripping of the digital logic line;
perform a second comparison of the (i) the amount of time elapsed from first time to the second time to (ii) an expected amount of elapsed time from the application of the fixed voltage to the I/P coil after which a digital logic line trip will occur for a properly functioning I/P coil and drive circuitry;
determine, based on the second comparison, whether the I/P coil and drive circuitry are properly functioning or whether one or more of the I/P coil or the drive circuitry has failed; and
cause the controller to take a control action changing the operation of the process control system based on determining that one or more of the I/P coil or the drive circuitry has failed, wherein the control action includes switching from using the field device in the process control system to using a second, redundant field device in the process control system.

9. The system of claim 8 , wherein the diagnostic circuit is configured to determine that the I/P coil and drive circuitry are properly functioning based on the amount of time elapsed from the first time to the second time being substantially equal to the expected amount of elapsed time from the application of the fixed voltage to the I/P coil.

10. The system of claim 8 , wherein the diagnostic circuit is configured to determine that the I/P coil or the drive circuitry have failed due to an open circuit in the I/P coil or drive circuitry based on the logic line trip not occurring after the expected amount of elapsed time from the application of the fixed voltage to the I/P coil.

11. The system of claim 8 , wherein the diagnostic circuit is configured to determine that one or more of the I/P coil or the drive circuitry have failed due to a short circuit in one or more of the I/P coil or drive circuitry based on the amount of time elapsed from the first time to the second time being smaller than the expected amount of elapsed time by greater than a threshold amount of time.

12. The system of claim 8 , wherein the diagnostic circuit is configured to determine that one or more of the I/P coil or the drive circuitry have failed due to the armature already being in the on-position or due to the armature failing to move from the off-position to the on-position based on the amount of time elapsed from the first tim

Assignees

• Fisher Controls Int Llc

Inventors

• Fontaine Michael R
• Nicholas Davin S
• Bulleit Gregory R
• Arnold Christopher C
• Smid David L

Classifications

• F16K37/0041

  for measuring valve parameters (F16K37/0033 takes precedence) · CPC title

• G01R31/72

  Testing of electric windings (testing of transformers G01R31/62) · CPC title

• F15B2013/0448

  Actuation by solenoid and permanent magnet · CPC title

• F16K37/0025 Primary

  Electrical or magnetic means (F16K37/0075 takes precedence) · CPC title

• F16K31/06

  using a magnet {, e.g. diaphragm valves, cutting off by means of a liquid} · CPC title