Measuring X-ray CT apparatus and production work piece measurement method

US11262319B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11262319-B2
Application numberUS-201916291699-A
CountryUS
Kind codeB2
Filing dateMar 4, 2019
Priority dateMar 12, 2018
Publication dateMar 1, 2022
Grant dateMar 1, 2022

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

When measuring a mass-produced work piece using a measuring X-ray CT apparatus, which is configured to emit X-rays while rotating a work piece that is arranged on a rotary table and to reconstruct a projection image thereof to generate volume data of the work piece, the present invention assigns values to volume data for a predetermined work piece and stores the same as master data; obtains volume data for a mass-produced work piece under identical conditions to the predetermined work piece; measures the volume data and obtains an X-ray CT measured value for the mass-produced work piece; and corrects the X-ray CT measured value for the mass-produced work piece using the master data.

First claim

Opening claim text (preview).

What is claimed is: 1. A measuring X-ray CT apparatus that is configured to emit X-rays while rotating a work piece that is arranged on a rotary table and to reconstruct a projection image thereof to generate volume data of the work piece, the measuring X-ray CT apparatus comprising: one or more memories that store: a set of executable instructions, and volume data for a predetermined work piece as master data, for which values are assigned ahead of time, wherein the predetermined workpiece is a hollow cylindrical workpiece and the master data includes ΔR o and ΔR i , which are calculated using the following master data formulas: Δ R o =R co −R xo   (1) Δ R i =R ci −R xi   (2) wherein R co is an actual coordinate measuring machine measured value of an outer diameter of the predetermined workpiece, R xo is an X-ray CT measured value of the outer diameter of the predetermined workpiece, R ci is an actual coordinate measuring machine measured value of an inner diameter of the predetermined workpiece, and R xi is an X-ray CT measured value of the inner diameter of the predetermined workpiece; and a processor, which when executing the set of executable instructions, is configured to operate as: a system that obtains volume data for a production work piece under identical conditions to the predetermined work piece; a system that measures the volume data for the production work piece and that obtains R wo , which is an X-ray CT measured value of the outer diameter of the production work piece, and R wi which is an X-ray CT measured value of the inner diameter of the production work piece; and a corrector that corrects the X-ray CT measured value for the production work piece in accordance with the following: R′ wo =R wo +ΔR o   (3) R′ wi =R wi +ΔR i   (4) Δα>Δβ  (5) Δα+Δ B   (6) wherein R′ wo is a corrected X-ray CT measured value for an outer diameter of the production workpiece and R′ wi is a corrected X-ray CT measured value for an inner diameter of the production workpiece, and wherein Δα is a difference between the coordinate measuring machine measured values of the predetermined workpiece and the X-ray CT measured values of the predetermined workpiece, and Δβ is a difference between the X-ray CT measured values of the predetermined workpiece and the X-ray CT measured values of the production work piece. 2. The measuring X-ray CT apparatus according to claim 1 , wherein: the production work piece includes a plurality of production work pieces, and the predetermined work piece is a mass-produced work piece selected from the plurality of production work pieces. 3. A work piece measurement method of a measuring X-ray CT apparatus which, when measuring a production work piece, emits X-rays while rotating a work piece that is arranged on a rotary table, and reconstructs a projection image thereof to generate volume data of the work piece, the method comprising: assigning values to volume data for a predetermined work piece, and storing the volume data as master data, wherein the predetermined workpiece is a hollow cylindrical workpiece and the master data includes ΔR o and ΔR i , which are calculated using the following master data formulas: Δ R o =R co −R xo   (1) Δ R i =R ci −R xi   (2) wherein R co is an actual coordinate measuring machine measured value of an outer diameter of the predetermined workpiece, R xo is an X-ray CT measured value of the outer diameter of the predetermined workpiece, R ci is an actual coordinate measuring machine measured value of an inner diameter of the predetermined workpiece, and R xi is an X-ray CT measured value of the inner diameter of the predetermined workpiece; obtaining volume data for a production work piece under identical conditions to the predetermined work piece; measuring the volume data for the production work piece and obtaining R wo , which is an X-ray CT measured value of the outer diameter of the production work piece, and R wi , which is an X-ray CT measured value of the inner diameter of the production work piece; and correcting the X-ray CT measured value for the production work piece, in accordance with the following: R′ wo =R wo +ΔR o   (3) R′ wi =R wi +ΔR i   (4) Δα>Δβ  (5) Δα+Δ B   (6) wherein R′ wo is a corrected X-ray CT measured value for an outer diameter of the production workpiece and R′ wi is a corrected X-ray CT measured value for an inner diameter of the production workpiece, and wherein Δα is a difference between the coordinate measuring machine measured values of the predetermined workpiece and the X-ray CT measured values of the predetermined workpiece, and Δβ is a difference between the X-ray CT measured values of the predetermined workpiece and the X-ray CT measured values of the production work piece. 4. The work piece measurement method according to claim 3 , wherein: the production work piece includes a plurality of production work pieces, and the predetermined work piece is a mass-produced work piece selected from the plurality of production work pieces. 5. The measuring X-ray CT apparatus according to claim 1 , wherein: Δα relates to an error arising from a shape or a material of the predetermined workpiece. 6. The work piece measurement method according to claim 3 , wherein: Δα relates to an error arising from a shape or a material of the predetermined workpiece. 7. The measuring X-ray CT apparatus according to claim 1 , wherein: Δβ relates to a difference between a shape of the predetermined workpiece and a shape of the production work piece. 8. The work piece measurement method according to claim 3 , wherein: Δβ relates to a difference between a shape of the predetermined workpiece and a shape of the production work piece. 9. The measuring X-ray CT apparatus according to claim 1 , wherein: the predetermined workpiece comprises a first material and a second material, the first material and the second material having the same dimensions and different X-ray CT measured values. 10. The work piece measurement method according to claim 3 , wherein: the predetermined workpiece comprises a first material and a second material, the first material and the second material having the same dimensions and different X-ray CT measured values.

Assignees

Inventors

Classifications

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11262319B2 cover?
When measuring a mass-produced work piece using a measuring X-ray CT apparatus, which is configured to emit X-rays while rotating a work piece that is arranged on a rotary table and to reconstruct a projection image thereof to generate volume data of the work piece, the present invention assigns values to volume data for a predetermined work piece and stores the same as master data; obtains vol…
Who is the assignee on this patent?
Mitutoyo Corp
What technology area does this patent fall under?
Primary CPC classification G01N23/046. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 01 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).