System and method for testing a device-under-test

Patent metadata

Field	Value
Publication number	US-11255898-B2
Application number	US-202016870374-A
Country	US
Kind code	B2
Filing date	May 8, 2020
Priority date	May 8, 2020
Publication date	Feb 22, 2022
Grant date	Feb 22, 2022

Abstract

The invention relates to a system in particular a quantum sensor system, for testing a device-under-test, DUT, comprising: an optically excitable medium which is arranged to receive electromagnetic, EM, radiation emitted by the DUT, at least one light source configured to irradiate the medium with at least one light beam, wherein the medium is optically excited by the at least one light beam, a field generator unit configured to generate an electric and/or magnetic field within the medium, wherein a resonance frequency of the excited medium is modified by an amplitude of the electric and/or magnetic field, wherein an optical parameter, in particular a luminescence, of the exited medium is locally modified if a frequency of the EM radiation corresponds to the resonance frequency at a position in the medium, an image detector configured to acquire an image of the medium, wherein the image shows an intensity profile that results from the modification of the optical parameter, a processor configured to analyze the DUT based on the acquired image.

First claim

The invention claimed is:

1. A system in particular a quantum sensor system, for testing a device-under-test, DUT, comprising:
an optically excitable medium which is arranged to receive electromagnetic, EM, radiation emitted by the DUT,
at least one light source configured to irradiate the medium with at least one light beam, wherein the medium is optically excited by the at least one light beam,
a field generator unit configured to generate an electric and/or magnetic field within the medium, wherein a resonance frequency of the excited medium is modified by an amplitude of the electric and/or magnetic field,
wherein an optical parameter, in particular a luminescence, of the exited medium is locally modified if a frequency of the EM radiation corresponds to the resonance frequency at a position in the medium,
an image detector configured to acquire an image of the medium, wherein the image shows an intensity profile that results from the modification of the optical parameter, and
a processor configured to analyze the DUT based on the acquired image.

2. The system according to claim 1 , wherein the processor is configured to extract and/or reconstruct a phase information of the EM radiation from the intensity profile.

3. The system according to claim 2 , further comprising an emitter unit, in particular a local oscillator, wherein the emitter unit is configured to emit an EM signal towards the medium, wherein the EM radiation emitted by the DUT is superimposed by the EM signal within the medium, and wherein the processor is configured to extract and/or reconstruct the phase information of the EM radiation from a change in the intensity profile resulting from the superposition of the EM radiation and the EM signal within the medium.

4. The system according to claim 1 , wherein the amplitude of the electric and/or magnetic field varies at different positions in the excited medium, resulting in different resonance frequencies at said positions, wherein the processor is configured to determine the frequency of the EM radiation based on a location and/or a shape of features in the intensity profile.

5. The system according to claim 1 , wherein the amplitude of the electric and/or magnetic field is homogeneous in the excited medium, resulting in an equal resonance frequency everywhere in the medium, wherein the processor is configured to determine a location of a source of the EM radiation on the DUT based on a location and/or a shape of features in the intensity profile.

6. The system according to claim 1 , wherein the system comprises two light sources configured to irradiate the medium with two light beams, wherein of each of the two light beams has a frequency that corresponds to a different resonance frequency of the medium.

7. The system according to claim 1 , wherein the field generator unit comprises a capacitor.

8. The system according to claim 1 , wherein the optically excitable medium is a gas, in particular a caesium gas, wherein the gas is stored in a gas cell.

9. The system according to claim 1 , wherein the optically excitable medium is a solid material, in particular diamond.

10. The system according to claim 1 , wherein the DUT is a printed circuit board, PCB.

11. A method for testing a device-under-test, DUT, comprising the steps:
receiving an electromagnetic, EM, radiation emitted by the DUT at an optically excitable medium,
irradiating the medium with at least one light beam; wherein the medium is optically excited by the at least one light beam
generating an electric and/or magnetic field within the medium, wherein a resonance frequency of the excited medium is modified by an amplitude of the electric and/or magnetic field,
wherein an optical parameter, in particular a luminescence, of the exited medium is locally modified if a frequency of the EM radiation corresponds to the resonance frequency at a position in the medium,
acquiring an image of the medium, wherein the image shows an intensity profile that results from the modification of the optical parameter, and
analyzing the DUT based on the acquired image.

12. The method according to claim 11 , wherein the step of analyzing the DUT comprises:
extracting and/or reconstructing a phase information of the EM radiation from the intensity profile.

13. The method according to claim 12 , wherein the method further comprises:
emitting an EM signal towards the medium, wherein the EM radiation emitted by the DUT is superimposed by the EM signal within the medium; and

wherein the phase information of the EM radiation is extracted and/or reconstructed from a change in the intensity profile resulting from the superposition of the EM radiation and the EM signal within the medium.

14. The method according to claim 11 , wherein the amplitude of the electric and/or magnetic field varies at different positions in the excited medium, resulting in a variation of the resonance frequency at said positions, wherein the step of analyzing the DUT comprises:
determining the frequency of the EM radiation based on a location and/or a shape of features in the intensity profile.

15. The method according to claim 11 , wherein the amplitude of the electric and/or magnetic field is homogeneous in the excited medium, resulting in an equal resonance frequency everywhere in the medium, wherein the step of analyzing the DUT comprises:
determining a location of a source of the EM radiation on the DUT based on a location and/or a shape of features in the intensity profile.

16. The method according to claim 11 , wherein the medium is irradiated with two light beams, wherein of each of the two light beams has a frequency that corresponds to a different resonance frequency of the medium.

Assignees

• Rohde & Schwarz

Inventors

• Winkler Thomas
• Ruster Thomas
• Leong Ryanne

Classifications

• G01R31/309

  of printed or hybrid circuits {or circuit substrates} · CPC title

• G01R1/071

  containing electro-optic elements · CPC title

• G01R31/281 Primary

  Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing (G01R31/2818 takes precedence) · CPC title

• G01R31/2806 Primary

  Apparatus therefor, e.g. test stations, drivers, analysers, conveyors (G01R31/2805, G01R31/281, G01R31/2818 take precedence) · CPC title