Polarization measurement with interference patterns of high spatial carrier frequency

Patent metadata

Field	Value
Publication number	US-11248955-B2
Application number	US-201916536709-A
Country	US
Kind code	B2
Filing date	Aug 9, 2019
Priority date	Aug 10, 2018
Publication date	Feb 15, 2022
Grant date	Feb 15, 2022

Abstract

The present inventive concepts relate to an inspection apparatus that snapshots an interference image pattern having a high spatial carrier frequency produced from a one-piece off-axis polarimetric interferometer and that precisely and promptly measures a Stokes vector including spatial polarimetric information. The inspection apparatus dynamically measure in real-time a two-dimensional polarization information without employing a two-dimensional scanner.

First claim

What is claimed is:

1. An inspection apparatus, comprising:
a light generator configured to generate a light;
a first linear polarizer configured to linearly polarize the light;
a polarization interferometer configured to split the linearly polarized light into a first light and a second light and cause the first light and the second light to have spatial phase difference information;
a first non-polarizing beam splitter between the first linear polarizer and the polarizing beam splitter;
a second linear polarizer configured to
receive the first light and the second light passing through or reflecting on a measured object, and
linearly polarize the first light and the second light to produce an interference image pattern with a spatial carrier frequency including anisotropic information of the measured object; and

an image sensor configured to capture the interference image pattern from the second linear polarizer,
wherein the polarization interferometer includes:
a polarizing beam splitter configured to split the linearly polarized light into the first and the second light, the polarizing beam splitter including a first surface and a second surface configured to receive the first light and the second light, respectively, the first and second surfaces being adjacent to each other,
a first mirror on the first surface, and
a second mirror on the second surface,
wherein the first mirror and the second mirror are integrally attached to the polarizing beam splitter, and
wherein the first mirror and the second mirror have an angle deviated from perpendicular.

2. The inspection apparatus of claim 1 , wherein the deviation angle is 0.02° to 0.1°.

3. The inspection apparatus of claim 1 , further comprising a second non-polarizing beam splitter between the first non-polarizing beam splitter and the measured object.

4. The inspection apparatus of claim 3 , wherein the second linear polarizer is disposed on one side of the second non-polarizing beam splitter.

5. The inspection apparatus of claim 1 , further comprising a collimating lens configured to receive and collimate the light from the light generator.

6. The inspection apparatus of claim 1 , further comprising a light-receiving lens between the second linear polarizer and the image sensor.

7. The inspection apparatus of claim 1 , wherein the light generator is configured to generate monochromatic light.

8. An inspection apparatus, comprising:
a light generator configured to generate a light;
a first linear polarizer configured to linearly polarize the light;
a beam splitter configured to split the linearly polarized light into a first light and a second light, the beam splitter including a first surface and a second surface configured to receive the first light and the second light, respectively, the first and second surfaces being adjacent to each other;
a first mirror and a second mirror respectively on the first surface and the second surface;
a second linear polarizer configured to receive and linearly polarize the first light and the second light from the beam splitter; and
an image sensor configured to capture an interference image from the second linear polarizer,
wherein an angle between the first mirror and the second mirror is deviated from perpendicular, and
wherein the first mirror and the second mirror are integrally attached to the beam splitter.

9. The inspection apparatus of claim 8 , wherein the deviation angle is 0.02° to 0.1°.

10. The inspection apparatus of claim 8 , wherein the beam splitter is a polarizing beam splitter.

11. The inspection apparatus of claim 10 , further comprising a non-polarizing beam splitter between the first linear polarizer and the polarizing beam splitter.

12. The inspection apparatus of claim 8 , wherein the light generator is configured to generate a monochromatic light.

13. An inspection method, comprising:
linearly polarizing a light by a first linear polarizer;
splitting the linearly polarized light that passes through the first linear polarizer and a first non-polarizing beam splitter into a first light and a second light by a polarization interferometer
causing, by the polarization interferometer, the first light and the second light to have a spatial phase difference;
radiating a measured object with the first light and the second light that have the spatial phase difference, and each of which is reflected by the first non-polarizing beam splitter;
receiving and linearly polarizing, by a second linear polarizer, the first light and the second light from the measured object; and
capturing an interference image pattern of the measured object from the linearly polarized first and second lights
wherein the polarization interferometer includes:
a polarizing beam splitter configured to split the linearly polarized light into the first light and the second light, the polarizing beam splitter including a first surface and a second surface configured to receive the first light and the second light, respectively, the first and second surfaces being adjacent to each other;
a first mirror on the surface; and
a second mirror on the second surface,

wherein the first mirror and the second mirror are integrally attached to the polarizing beam splitter, and
wherein the first mirror and the second mirror have an angle deviated from perpendicular.

14. The inspection method of claim 13 , wherein the light is a monochromatic light.

15. The inspection method of claim 13 , wherein the first light and the second light are a P-polarization wave and an S-polarization wave, respectively.

16. The inspection method of claim 13 , wherein the interference image pattern is captured in a snapshot mode.

17. The inspection method of claim 13 , wherein the light is generated by a light generator, and
wherein the light generator is a tunable laser capable of wavelength modulation.

Assignees

• Nat Univ Chonbuk Ind Coop Found

Inventors

• Kim Daesuk

Classifications

• G01J3/4531

  Devices without moving parts · CPC title

• G01J3/12

  Generating the spectrum; Monochromators · CPC title

• G01J3/447

  Polarisation spectrometry · CPC title

• G01J3/0224

  using polarising or depolarising elements · CPC title

• G01J3/08 Primary

  Beam switching arrangements · CPC title