System and method for graphene-structure detection downhole

Patent metadata

Field	Value
Publication number	US-11231407-B2
Application number	US-201916578559-A
Country	US
Kind code	B2
Filing date	Sep 23, 2019
Priority date	Sep 23, 2019
Publication date	Jan 25, 2022
Grant date	Jan 25, 2022

Abstract

A method may comprise sampling a wellbore fluid; analyzing the wellbore fluid and determining a presence of a graphene-like substrate, a concentration of the graphene-like substrate, or both, in the wellbore fluid; and correlating the presence and the concentration of the graphene-like substrate to at least one subterranean formation characteristic.

First claim

What is claimed is:

1. A method comprising:
sampling a wellbore fluid;
analyzing the wellbore fluid and determining a presence of a graphene-like substrate, a concentration of the graphene-like substrate, or both, in the wellbore fluid; and
correlating the presence and the concentration of the graphene-like substrate to at least one subterranean formation characteristic.

2. The method of claim 1 , wherein sampling the wellbore fluid comprises sampling in a wellbore using a wellbore sampling tool.

3. The method of claim 1 , wherein sampling the wellbore fluid comprises sampling at a surface of the wellbore by pumping the wellbore fluid out of the wellbore.

4. The method of claim 1 , wherein determining a presence of the graphene-like substrate comprises detecting a characteristic signal of graphene-like substrates.

5. The method of claim 4 , wherein the characteristic signal is a spectrographic peak.

6. The method of claim 5 , wherein the spectrographic peak is at least about 2700 cm −1 for a Raman shift.

7. The method of claim 5 , wherein the spectrographic peak is at least about 284 eV binding energy for X-ray photoelectron spectroscopy.

8. The method of claim 1 , wherein the at least one subterranean formation characteristic comprises at least one of reservoir architecture, interval productivity, reservoir charging mechanisms, reservoir filling history, reservoir migration pathways, or combinations thereof.

9. The method of claim 8 , wherein the reservoir architecture comprises at least one of trap configuration, seal capacity, a base of a producing zone, or combinations thereof.

10. The method of claim 1 , wherein the presence of the graphene-like substrate is determined as a function of depth.

11. The method of claim 1 , wherein the graphene-like substrate comprises from at least about 10 up to at least about 1,000 stacked layers.

12. The method of claim 11 , wherein the graphene-like substrate comprises from at least about 10 up to at least about 500 stacked layers.

13. The method of claim 12 , wherein the graphene-like substrate comprises from at least about 10 up to at least about 100 stacked layers.

14. The method of claim 13 , wherein the stacked layers comprise a hexagonal crystal structure substrate.

15. The method of claim 1 , wherein determining a presence of the concentration of the graphene-like substrate comprises detecting a total concentration of gas-liquid molecules and performing measurements at various depths.

16. The method of claim 15 , further comprising predicting a stacking structure of the graphene-like substrate based on the total concentration of gas-liquid molecules and chemical environment as a function of depth, then measuring the stacking structure of the graphene-like substrate.

17. The method of claim 16 , further comprising determining a gradient model after predicting the stacking structure of the graphene-like substrate.

18. The method of claim 17 , further comprising determining components derived from the gradient model.

Assignees

• Halliburton Energy Services Inc

Inventors

• Price James M
• Jones Christopher Michael
• Li Jian
• Golovko Julia

Classifications

• G01N33/24 Primary

  Earth materials (G01N33/42 takes precedence) · CPC title

• E21B49/10

  using side-wall fluid samplers or testers · CPC title

• E21B49/0875

  determining specific fluid parameters · CPC title

• G01N23/2273

  Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS] · CPC title

• E21B49/086

  Withdrawing samples at the surface · CPC title