Controlling parameters of an amplifier system based on a measured physical quantity

Patent metadata

Field	Value
Publication number	US-11228284-B2
Application number	US-201916272215-A
Country	US
Kind code	B2
Filing date	Feb 11, 2019
Priority date	Feb 20, 2018
Publication date	Jan 18, 2022
Grant date	Jan 18, 2022

Abstract

A method for controlling one or more parameters of an amplifier system may include receiving an indication of a physical quantity associated with the amplifier system, determining one or more parameters of the amplifier system in response to the indication, and causing the amplifier system to operate in accordance with the one or more parameters.

First claim

What is claimed is:

1. A method for controlling one or more parameters of an amplifier system comprising:
receiving an indication of an estimated temperature associated with the amplifier system;
determining one or more parameters of the amplifier system in response to the indication wherein:
the one or more parameters comprise a selected frequency response of the amplifier system, such that the selected frequency response of the amplifier system varies as a function of the estimated temperature; and
determining the one or more parameters of the amplifier system in response to the indication comprises selecting the selected frequency response corresponding to the estimated temperature from a plurality of stored frequency responses; and

causing the amplifier system to operate in accordance with the one or more parameters.

2. The method of claim 1 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises:
selecting two frequency responses corresponding to the estimated temperature from a plurality of stored frequency responses; and
interpolating between the two selected frequency responses to set the selected frequency response.

3. The method of claim 1 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises calculating the selected frequency response based on the estimated temperature.

4. The method of claim 1 , wherein the amplifier system comprises a digital signal processor and a transducer amplifier.

5. The method of claim 1 , wherein the amplifier system comprises an equalizer stage and a transducer amplifier.

6. A method for controlling one or more parameters of an amplifier system comprising:
receiving an indication of an estimated impedance associated with the amplifier system;
determining one or more parameters of the amplifier system in response to the indication; and
causing the amplifier system to operate in accordance with the one or more parameters.

7. The method of claim 6 , wherein the one or more parameters comprise a selected amplifier configuration associated with the amplifier system.

8. The method of claim 7 , wherein the selected amplifier configuration defines one or more of a boost headroom associated with the amplifier system, an amplifier gain, amplifier compensation network parameters, and a frequency response of the amplifier system.

9. The method of claim 7 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises selecting the selected amplifier configuration corresponding to the estimated impedance from a plurality of stored amplifier configurations.

10. The method of claim 7 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises:
selecting two amplifier configurations corresponding to the estimated impedance from a plurality of stored amplifier configurations; and
interpolating between the two amplifier configurations to set the selected amplifier configuration.

11. The method of claim 7 , wherein the estimated impedance is an impedance of a transducer driven by the amplifier system.

12. The method of claim 11 , wherein the estimated impedance comprises an estimated resistance of the transducer, and wherein an amplifier gain of the amplifier system is varied as a function of the estimated resistance.

13. The method of claim 11 , wherein the estimated impedance comprises an estimated inductance of the transducer, and wherein a frequency response of the amplifier system is varied as a function of the estimated inductance.

14. The method of claim 11 , wherein the estimated impedance comprises an estimated capacitance of the transducer, and wherein a frequency response of the amplifier system is varied as a function of the estimated capacitance.

15. An apparatus for controlling one or more parameters of an amplifier system comprising:
at least one input configured to receive an estimated temperature associated with the amplifier system; and
a controller configured to:
determine one or more parameters of the amplifier system in response to the indication, wherein the one or more parameters comprises a selected frequency response of the amplifier system, such that the selected frequency response of the amplifier system varies as a function of the estimated temperature, wherein determining the one or more parameters of the amplifier system in response to the indication comprises selecting the selected frequency response corresponding to the estimated temperature from a plurality of stored frequency responses; and
cause the amplifier system to operate in accordance with the one or more parameters.

16. The apparatus of claim 15 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises:
selecting two frequency responses corresponding to the estimated temperature from a plurality of stored frequency responses; and
interpolating between the two selected frequency responses to set the selected frequency response.

17. The apparatus of claim 15 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises calculating the selected frequency response based on the estimated temperature.

18. The apparatus of claim 15 , wherein the amplifier system comprises a digital signal processor and a transducer amplifier.

19. The apparatus of claim 15 , wherein the amplifier system comprises an equalizer stage and a transducer amplifier.

20. An apparatus for controlling one or more parameters of an amplifier system comprising:
at least one input configured to receive an indication of an estimated impedance associated with the amplifier system; and
a controller configured to:
determine one or more parameters of the amplifier system in response to the indication; and
cause the amplifier system to operate in accordance with the one or more parameters.

21. The apparatus of claim 20 , wherein the one or more parameters comprise a selected amplifier configuration associated with the amplifier system.

22. The apparatus of claim 21 , wherein the selected amplifier configuration defines one or more of a boost headroom associated with the amplifier system, an amplifier gain, amplifier compensation network parameters, and a frequency response of the amplifier system.

23. The apparatus of claim 21 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises selecting the selected amplifier configuration corresponding to the estimated impedance from a plurality of stored amplifier configurations.

24. The apparatus of claim 21 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises:
selecting two amplifier configurations corresponding to the estimated impedance from a plurality of stored amplifier configurations; and
interpolating between the two amplifier configurations to set the selected amplifier configuration.

25. The apparatus of claim 21 , wherein the estimated impedance is an impedance of a transducer driven by the amplifier system.

26. The apparatus of claim 25 , wherein the estimated impedance comprises an estimated resistance of the transducer, and wherein an amplifier gain of the amplifier system is varied as a function of the estimat

Assignees

• Cirrus Logic Int Semiconductor Ltd
• Cirrus Logic Inc

Inventors

• Lindemann Eric
• Tyagi Itisha

Classifications

• G01R27/08

  Measuring resistance by measuring both voltage and current · CPC title

• H03F3/187

  in integrated circuits · CPC title

• G01R27/2605

  Measuring capacitance (capacitive sensors G01D5/24) · CPC title

• H03F1/30 Primary

  Modifications of amplifiers to reduce influence of variations of temperature or supply voltage {or other physical parameters (in differential amplifiers H03F3/45479)} · CPC title

• H03F2200/03

  the amplifier being designed for audio applications · CPC title