Calibration process for an automated test system

US11226390B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11226390-B2
Application numberUS-201715688112-A
CountryUS
Kind codeB2
Filing dateAug 28, 2017
Priority dateAug 28, 2017
Publication dateJan 18, 2022
Grant dateJan 18, 2022

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

An example method, such as a calibration method, includes: determining a geometry of an arrangement of cells that is perceived by a robot configured to move devices into, and out of, the cells; determining an expected location of a target cell among the cells; determining an offset from the expected location that is based on the geometry that is perceived by the robot; and calibrating the robot based on the offset.

First claim

Opening claim text (preview).

What is claimed is: 1. A method comprising: determining a first geometry of an arrangement of cells that is perceived by a robot configured to move devices into, and out of, the cells, the first geometry comprising a distortion of an expected geometry of the arrangement of cells, the first geometry being determined by moving the robot to predefined locations on a calibration device having a same geometry as a tray containing the arrangement of cells and recording coordinates of the predefined locations; determining an expected location of a target cell among the cells based on the expected geometry stored in computer memory; determining an offset from the expected location that is based on the first geometry and the expected geometry; and calibrating the robot based on the offset to compensate for the distortion; wherein the expected geometry is a second geometry, and wherein determining the offset comprises: calculating a first dimension error based on a difference in the first dimension between the first geometry and the second geometry; and calculating a second dimension error based on a difference in the second dimension between the first geometry and the second geometry, the offset comprising a combination of the first dimension error and the second dimension error. 2. The method of claim 1 , wherein the first dimension error and the second dimension error are calculated relative to the expected location of the target cell. 3. The method of claim 1 , wherein calibrating the robot comprises incorporating the first dimension error and the second dimension error into a movement of the robot to reach the target cell. 4. The method of claim 1 , wherein the robot comprises multiple heads, and the offset is determined with respect to a first head among the multiple heads; and wherein calibrating the robot comprises calibrating a second head among the multiple heads that is different than the first head, the second head being calibrated based on both the offset and a second offset corresponding to a difference in locations between the first head and the second head. 5. The method of claim 1 , wherein the robot is calibrated to reach the expected location of the target cell by combining the offset with a perceived location of the target cell. 6. The method of claim 1 , wherein the cells are on one or more trays for holding devices that have been tested or devices that have not been tested. 7. The method of claim 1 , wherein the cells comprises one or more receptacles on one or more shuttles configured to move devices between different stages of a test system. 8. The method of claim 1 , wherein the robot is calibrated to a sub-millimeter accuracy. 9. The method of claim 1 , wherein the robot is calibrated to an accuracy of at least 0.1 millimeters. 10. One or more non-transitory machine-readable storage devices storing instructions that are executable to perform operations comprising: determining a first geometry of an arrangement of cells that is perceived by a robot configured to move devices into, and out of, the cells, the first geometry comprising a distortion of an expected geometry of the arrangement of cells, the first geometry being determined by moving the robot to predefined locations on a calibration device having a same geometry as a tray containing the arrangement of cells and recording coordinates of the predefined locations; determining an expected location of a target cell among the cells based on the expected geometry stored in computer memory; determining an offset from the expected location that is based on the first geometry and the expected geometry; and calibrating the robot based on the offset to compensate for the distortion; wherein the expected geometry is a second geometry, and wherein determining the offset comprises: calculating a first dimension error based on a difference in the first dimension between the first geometry and the second geometry; and calculating a second dimension error based on a difference in the second dimension between the first geometry and the second geometry, the offset comprising a combination of the first dimension error and the second dimension error. 11. The one or more non-transitory machine-readable storage devices of claim 10 , wherein the first dimension error and the second dimension error are calculated relative to the expected location of the target cell. 12. The one or more non-transitory machine-readable storage devices of claim 10 , wherein calibrating the robot comprises incorporating the first dimension error and the second dimension error into a movement of the robot to reach the target cell. 13. The one or more non-transitory machine-readable storage devices of claim 10 , wherein the robot comprises multiple heads, and the offset is determined with respect to a first head among the multiple heads; and wherein calibrating the robot comprises calibrating a second head among the multiple heads that is different than the first head, the second head being calibrated based on both the offset and a second offset corresponding to a difference in locations between the first head and the second head. 14. The one or more non-transitory machine-readable storage devices of claim 10 , wherein the robot is calibrated to reach the expected location of the target cell by combining the offset with a perceived location of the target cell. 15. The one or more non-transitory machine-readable storage devices of claim 10 , wherein the cells are on one or more trays for holding devices that have been tested or devices that have not been tested. 16. The one or more non-transitory machine-readable storage devices of claim 10 , wherein the cells comprises one or more receptacles on one or more shuttles configured to move devices between different stages of a test system. 17. The one or more non-transitory machine-readable storage devices of claim 10 , wherein the robot is calibrated to a sub-millimeter accuracy. 18. The one or more non-transitory machine-readable storage devices of claim 10 , wherein the robot is calibrated to an accuracy of at least 0.1 millimeters.

Assignees

Inventors

Classifications

  • Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736) · CPC title

  • G01R35/00Primary

    Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title

  • characterised by control arrangements for positioning, e.g. centring a tool relative to a hole in the workpiece, additional detection means to correct position (G05B19/19 takes precedence) · CPC title

  • Handling, conveying or loading, e.g. belts, boats, vacuum fingers (G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H10P72/00) · CPC title

  • Calibration of manipulator · CPC title

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What does patent US11226390B2 cover?
An example method, such as a calibration method, includes: determining a geometry of an arrangement of cells that is perceived by a robot configured to move devices into, and out of, the cells; determining an expected location of a target cell among the cells; determining an offset from the expected location that is based on the geometry that is perceived by the robot; and calibrating the robot…
Who is the assignee on this patent?
Teradyne Inc
What technology area does this patent fall under?
Primary CPC classification G01R35/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 18 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).