X-ray imaging system and method of x-ray imaging

Patent metadata

Field	Value
Publication number	US-11226298-B2
Application number	US-201916586386-A
Country	US
Kind code	B2
Filing date	Sep 27, 2019
Priority date	Dec 7, 2018
Publication date	Jan 18, 2022
Grant date	Jan 18, 2022

Abstract

An x-ray imaging system includes an x-ray source configured to emit x-ray radiation towards a sample, and a primary detector configured to detect x-ray radiation from the x-ray source passing through the sample. The x-ray imaging system also includes a secondary detector configured to detect x-ray radiation from the x-ray source scattered in the sample, and imaging optics configured to guide x-ray radiation scattered in the sample onto the secondary detector.

First claim

The invention claimed is:

1. An X-ray imaging system comprising:
an x-ray source configured to emit x-ray radiation towards a sample;
a primary detector positioned opposite the x-ray source, such that the x-ray source and the primary detector are disposed on opposite sides of the sample, respectively, when the x-ray radiation is emitted towards the sample, the primary detector being configured to detect x-ray radiation from the x-ray source passing through the sample;
at least one secondary detector configured to detect x-ray radiation from the x-ray source scattered in the sample; and
imaging optics disposed between the at least one secondary detector and the sample when the x-ray radiation is emitted towards the sample, the imaging optics being configured to guide x-ray radiation scattered in the sample onto the at least one secondary detector; and
a collimator disposed between the imaging optics and the sample when the x-ray radiation is emitted towards the sample,
wherein the x-ray source is configured to emit x-ray radiation in the form of a fan beam, and
wherein the x-ray source is configured to emit monochromatic x-ray radiation.

2. The X-ray imaging system of claim 1 , wherein the primary detector is configured to determine an energy of detected x-ray photons.

3. The X-ray imaging system of claim 1 , wherein the at least one secondary detector is configured to determine an energy of detected x-ray photons.

4. The X-ray imaging system of claim 1 , wherein the at least one secondary detector comprises a plurality of secondary detectors.

5. The X-ray imaging system of claim 1 , wherein the x-ray imaging system is configured to be movable around the sample.

6. The X-ray imaging system of claim 1 , wherein the collimator is configured to allow only x-ray radiation scattered in a direction perpendicular to a direction of the x-ray radiation emitted by the x-ray source to reach the at least one secondary detector.

7. A method of x-ray imaging, the method comprising:
emitting x-ray radiation from an x-ray source towards a sample;
detecting x-ray radiation from the x-ray source passing through the sample with a primary detector positioned opposite the x-ray source, such that the x-ray source and the primary detector are disposed on opposite sides of the sample, respectively, when the x-ray radiation is emitted towards the sample;
collimating x-ray radiation scattered in the sample with a collimator disposed between the sample and imaging optics when the x-ray radiation is emitted towards the sample;
guiding the collimated x-ray radiation scattered in the sample onto a secondary detector with the imaging optics disposed between the secondary detector and the sample when the x-ray radiation is emitted towards the sample, and
detecting the guided collimated x-ray radiation scattered in the sample with the secondary detector,
wherein x-ray radiation emitted by the x-ray source is emitted in the form of a fan beam passing through the sample, and
wherein the x-ray radiation emitted by the x-ray source is emitted as monochromatic x-ray radiation.

8. The method of claim 7 , wherein photons detected by the primary detector that have lower energy than the monochromatic x-ray radiation emitted by the x-ray source are ignored for x-ray imaging.

9. The method of claim 8 , wherein information relating to the photons detected by the primary detector that have lower energy than the monochromatic x-ray radiation emitted by the x-ray source is used for improving the x-ray imaging.

10. The method of claim 7 , wherein intensity of the x-ray radiation detected by the secondary detector is used to analyze the sample.

11. The method of claim 7 , wherein photons detected by the secondary detector that have lower energy than the monochromatic x-ray radiation emitted by the x-ray source are used to analyze the sample.

Assignees

• Siemens Healthcare Gmbh

Inventors

• Kappler Steffen
• Radicke Marcus
• Freudenberger Jörg
• Fritzler Anja
• Geithner Peter
• Hackenschmied Peter
• Weber Thomas

Classifications

• G01N23/20008

  Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor (monochromators for X- rays using crystals G21K1/06) · CPC title

• A61B6/483

  involving scattered radiation · CPC title

• G01N23/20083 Primary

  by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement · CPC title

• A61B6/4208

  characterised by using a particular type of detector · CPC title

• A61B6/4241

  using energy resolving detectors, e.g. photon counting · CPC title