Processing apparatus, sysyem, X-ray measurement method, and program

Patent metadata

Field	Value
Publication number	US-11221423-B2
Application number	US-202017078626-A
Country	US
Kind code	B2
Filing date	Oct 23, 2020
Priority date	Oct 24, 2019
Publication date	Jan 11, 2022
Grant date	Jan 11, 2022

Abstract

There are provided a storage section 220 that stores an output value read out by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and a calculation section 230 that calculates a count value based on the output value that has been read out, wherein the calculation section 230 uses a model in which an apparent time constant of the pulse signal monotonously decreases against increase in pulse detection ratio with respect to exposure. According to such a model, the corresponding apparent time constant is able to be obtained even in any higher count rate. As a result of this, reduced can be the influence of count loss even on the count rate that has not been able to be covered by the conventional method.

First claim

The invention claimed is:

1. A processing apparatus comprising:
a storage section that stores an output value read out by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and
a calculation section that calculates a count value based on the output value that has been read out,
wherein the calculation section uses a model in which an apparent time constant of the pulse signal monotonously decreases against increase in pulse detection ratio with respect to exposure.

2. The processing apparatus according to claim 1 ,
wherein the pulse detection ratio corresponds to a rate of a total time during which the pulse signal is detected with respect to the exposure, to a total time of the exposure.

3. The processing apparatus according to claim 1 ,
wherein the apparent time constant is a true time constant when the pulse detection ratio is zero.

4. The processing apparatus according to claim 1 ,
wherein the apparent time constant is a product of the true time constant and a constant smaller than 1 when the pulse detection ratio is 1.

5. The processing apparatus according to claim 1 ,
wherein the storage section stores a time constant of the pulse signal, and calculation section reads out and uses the stored time constant when using the model.

6. A system comprising the semiconductor detector, and the processing apparatus according to claim 1 .

7. The system according to claim 6 ,
wherein the exposure is performed in a shorter time than the time constant of the pulse signal with the semiconductor detector.

8. The system according to claim 7 ,
wherein the count value is corrected with assuming that the pulse signal is counted in a time obtained by summing the time constant of the pulse signal and a unit time of the exposure, in the calculation of the count value.

9. An X-ray measurement method comprising the steps of:
reading out an output value by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and
calculating a count value based on the output value that has been read out,
wherein a model in which an apparent time constant of the pulse signal monotonously decreases against increase in pulse detection ratio with respect to exposure is used in the step of calculating the count value.

10. A non-transitory computer readable recording medium having recorded thereon a program, the program causing a computer to execute the processes of:
reading out an output value by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and
calculating a count value based on the output value that has been read out,
wherein a model in which an apparent time constant of the pulse signal monotonously decreases against increase in pulse detection ratio with respect to exposure is used in the processing of calculating the count value.

Assignees

• Rigaku Denki Co Ltd

Inventors

• Kobayashi Shintaro
• Nakae Yasukazu
• Sakumura Takuto
• Sakuma Yasutaka

Classifications

• G01T1/247 Primary

  Detector read-out circuitry (for processing gain or off-set correction H04N) · CPC title

• G01T1/24

  with semiconductor detectors · CPC title

• G01T1/1663

  Processing methods of scan data, e.g. involving contrast enhancement, background reduction, smoothing, motion correction, dual radio-isotope scanning, computer processing (for measuring spatial distribution of radiation G01T1/2992; general purpose image data processing G06T1/00; computerized tomography G06T12/00); Ancillary equipment · CPC title

• G01T1/171 Primary

  Compensation of dead-time counting losses · CPC title

• G01T1/18 Primary

  with counting-tube arrangements, e.g. with Geiger counters (tubes H01J47/08; {with alarm provision G01T7/125}) · CPC title