Measurement processing device, measurement processing method, and program

Patent metadata

Field	Value
Publication number	US-11221241-B2
Application number	US-201916644214-A
Country	US
Kind code	B2
Filing date	Feb 28, 2019
Priority date	Mar 15, 2018
Publication date	Jan 11, 2022
Grant date	Jan 11, 2022

Abstract

A measurement processing device includes: a storage section; a first obtaining section configured to obtain a first signal which is outputted from a first device and indicates a measurement result of measurement of a measurement target object; a temporary storage section configured to store the first signal obtained by the first obtaining section; a second obtaining section configured to obtain a second signal which is outputted from a second device and indicates (i) a position of the measurement target object or (ii) an amount of change which is in accordance with the position of the measurement target object, the second device being different from the first device; a storage control section configured to cause the storage section to store measurement information in which the second signal which has been obtained is associated with the first signal which has been stored in the temporary storage section; and an output control section configured to output, to a control device, at least one measurement information among the measurement information stored in the storage section.

First claim

The invention claimed is:

1. A measurement processing device, comprising:
a storage section;
a first obtaining section configured to obtain a first signal which is outputted from a first device and indicates a measurement result of measurement of a measurement target object;
a temporary storage section configured to store the first signal obtained by the first obtaining section;
a second obtaining section configured to obtain a second signal which is outputted from a second device and indicates (i) a position of the measurement target object or (ii) an amount of change which is in accordance with the position of the measurement target object, the second device being different from the first device;
a storage control section configured to cause the storage section to store measurement information in which the second signal which has been obtained is associated with the first signal which has been stored in the temporary storage section; and
an output control section configured to output, to a control device, at least one measurement information among the measurement information stored in the storage section, wherein
the first obtaining section obtains the first signal and causes the first signal to be stored in the temporary storage section without performing interrupt processing in which the first signal is obtained in accordance with the second signal.

2. The measurement processing device as set forth in claim 1 , wherein the storage control section is configured to output the measurement information to the control device in response to the second signal being obtained by the second obtaining section.

3. The measurement processing device as set forth in claim 1 , wherein the storage control section is configured to output the measurement information to the control device in response to the position indicated by the second signal obtained by the second obtaining section reaching a predetermined position.

4. The measurement processing device as set forth in claim 1 , wherein the storage control section is configured to output the measurement information to the control device in response to the amount of change indicated by the second signal obtained by the second obtaining section reaching a predetermined amount of change.

5. The measurement processing device as set forth in claim 1 , wherein:
the second device is an angle position sensor configured to measure a rotational displacement amount of a rotation axis of a transferring member which transfers the measurement target object; and
the second signal is a digital signal outputted from the angle position sensor in accordance with the rotational displacement amount.

6. The measurement processing device as set forth in claim 1 , further comprising an analog-digital converter configured to convert the first signal from an analog signal into a digital signal,
the temporary storage section being configured to store the first signal which has been converted by the analog-digital converter.

7. A measurement processing method, comprising:
a first obtaining step of obtaining a first signal which is outputted from a first device and indicates a measurement result of measurement of a measurement target object;
a temporary storage step of storing the first signal obtained by the first obtaining step;
a second obtaining step of obtaining a second signal which is outputted from a second device and indicates (i) a position of the measurement target object or (ii) an amount of change which is in accordance with the position of the measurement target object, the second device being different from the first device;
a storage control step of causing a storage section to store measurement information in which the second signal which has been obtained is associated with the first signal which has been stored by the temporary storage step; and
an output control step of outputting, to a control device, at least one measurement information among the measurement information stored in the storage section,
in the first obtaining step, the first signal is obtained without performing interrupt processing in which the first signal is obtained in accordance with the second signal.

8. A non-transitory computer-readable storage medium that stores a program for causing a computer to carry out:
a first obtaining step of obtaining a first signal which is outputted from a first device and indicates a measurement result of measurement of a measurement target object;
a temporary storage step of storing the first signal obtained by the first obtaining step;
a second obtaining step of obtaining a second signal which is outputted from a second device and indicates (i) a position of the measurement target object or (ii) an amount of change which is in accordance with the position of the measurement target object, the second device being different from the first device;
a storage control step of causing a storage section to store measurement information in which the second signal which has been obtained is associated with the first signal which has been stored by the temporary storage step; and
an output control step of outputting, to a control device, at least one measurement information among the measurement information stored in the storage section,
in the first obtaining step, the first signal is obtained without performing interrupt processing in which the first signal is obtained in accordance with the second signal.

9. A measurement processing device, comprising:
a storage section;
a first obtaining section configured to obtain a first signal which is outputted from a first device and indicates (i) a position of a measurement target object or (ii) an amount of change which is in accordance with the position of the measurement target object;
a temporary storage section configured to store the first signal obtained by the first obtaining section;
a second obtaining section configured to obtain a second signal which is outputted from a second device and indicates a measurement result of measurement of the measurement target object, the second device being different from the first device;
a storage control section configured to cause the storage section to store measurement information in which the second signal which has been obtained is associated with the first signal which has been stored in the temporary storage section; and
an output control section configured to output, to a control device, at least one measurement information among the measurement information stored in the storage section, wherein
the first obtaining section obtains the first signal and causes the first signal to be stored in the temporary storage section without performing interrupt processing in which the first signal is obtained in accordance with the second signal.

10. The measurement processing device as set forth in claim 9 , wherein the storage control section is configured to output the measurement information to the control device in response to the second signal being obtained by the second obtaining section.

11. The measurement processing device as set forth in claim 9 , wherein the storage control section is configured to output the measurement information to the control device in response to a value of the measurement result indicated by the second signal obtained by the second obtaining section reaching a predetermined value.

12. The measurement processing device as set forth in claim 9 , wherein the storage control section is configured to output the measurement information to the control device in response to the amount of change of the measurement result indicated by the second signal obtained by the second obtaining section reaching a predetermi

Assignees

• Omron Tateisi Electronics Co

Inventors

• Kudo Masaya

Classifications

• G01D21/02 Primary

  Measuring two or more variables by means not covered by a single other subclass · CPC title

• G01B21/30

  for measuring roughness or irregularity of surfaces · CPC title

• G01D9/00

  Recording measured values · CPC title

• G01D21/00 Primary

  Measuring or testing not otherwise provided for · CPC title