Profile measuring machine and profile measuring method

Patent metadata

Field	Value
Publication number	US-11221201-B2
Application number	US-202016934500-A
Country	US
Kind code	B2
Filing date	Jul 21, 2020
Priority date	Jul 29, 2019
Publication date	Jan 11, 2022
Grant date	Jan 11, 2022

Abstract

A profile measuring machine is for measuring a profile of a workpiece having a plurality of known-profile portions and a plurality of unknown-profile portions, the known-profile portions being cyclically arranged via the respective unknown-profile portions. The profile measuring machine includes: a scanning probe having a contact piece capable of being in contact with the workpiece; a drive mechanism for moving the scanning probe; an autonomous scanning measurement unit for controlling the drive mechanism to perform the autonomous scanning measurement; a measurement-path calculator for calculating a movement path of the scanning probe; and a nominal-value scanning measurement unit for controlling the drive mechanism to move the scanning probe along the movement path to perform a nominal-value scanning measurement. The measurement-path calculator calculates the movement path for the workpiece based on measurement results of the unknown-profile portions measured by the autonomous scanning measurement unit and design data of the known-profile portions.

First claim

What is claimed is:

1. A profile measuring machine configured to measure a profile of a workpiece comprising a plurality of known-profile portions whose profiles are known, the known-profile portions being cyclically arranged via respective unknown-profile portions whose profiles are unknown, the profile measuring machine comprising:
a scanning probe comprising a contact piece configured to be in contact with the workpiece;
a drive mechanism configured to move the scanning probe;
an autonomous scanning measurement unit configured to control the drive mechanism to perform an autonomous scanning measurement, in which the scanning probe is moved along the workpiece to measure the profile of the workpiece while the scanning probe is pressed against the workpiece by a predetermined push amount;
a measurement-path calculator configured to calculate a movement path of the scanning probe for performing a scanning measurement on the workpiece; and
a nominal-value scanning measurement unit configured to control the drive mechanism to perform a nominal-value scanning measurement, in which the scanning probe is moved along the movement path to measure the profile of the workpiece, wherein
the measurement-path calculator is configured to calculate the movement path for the workpiece based on measurement results of at least one of the unknown-profile portions measured by the autonomous scanning measurement unit and design data of the known-profile portions.

2. The profile measuring machine according to claim 1 , wherein
the autonomous scanning measurement unit is configured to perform the autonomous scanning measurement on one of the unknown-profile portions, and
the measurement-path calculator is configured to calculate the movement path based on the measurement results of the one of the unknown-profile portions and the design data of the known-profile portions.

3. The profile measuring machine according to claim 1 , wherein
the nominal-value scanning measurement unit is configured to output a measurement error signal when the push amount of the scanning probe is out of a predetermined tolerable range in the measurement along the movement path, and
the autonomous scanning measurement unit is configured to perform the autonomous scanning measurement again when the measurement error signal is outputted.

4. A profile measuring machine configured to measure a profile of a workpiece comprising a plurality of known-profile portions whose profiles are known, the known-profile portions being cyclically arranged via respective unknown-profile portions whose profiles are unknown, the profile measuring machine comprising:
a scanning probe comprising a contact piece configured to be in contact with the workpiece;
a drive mechanism configured to move the scanning probe;
an autonomous scanning measurement unit configured to control the drive mechanism to perform an autonomous scanning measurement, in which the scanning probe is moved along the workpiece to measure the profile of the workpiece while the scanning probe is pressed against the workpiece by a predetermined push amount;
a measurement-path calculator configured to calculate a movement path of the scanning probe when a profiling measurement is performed on the workpiece; and
a nominal-value scanning measurement unit configured to control the drive mechanism to perform a nominal-value scanning measurement, in which the scanning probe is moved along the movement path to measure the profile of the workpiece, wherein
the measurement-path calculator is configured to calculate the movement path for the workpiece based on measurement results of a combination of at least one of the known-profile portions and at least one of the unknown-profile portions measured by the autonomous scanning measurement unit.

5. The profile measuring machine according to claim 4 , wherein
the autonomous scanning measurement unit is configured to perform the autonomous scanning measurement on a pair of one of the unknown-profile portions and one of the known-profile portions, and
the measurement-path calculator is configured to calculate the movement path based on the measurement results of the pair of one of the unknown-profile portions and one of the known-profile portions.

6. The profile measuring machine according to claim 4 , wherein
the nominal-value scanning measurement unit is configured to output a measurement error signal when the push amount of the scanning probe is out of a predetermined tolerable range in the measurement along the movement path, and
the autonomous scanning measurement unit is configured to perform the autonomous scanning measurement again when the measurement error signal is outputted.

7. A profile measuring method configured to measure a profile of a workpiece using a profile measuring machine comprising: a scanning probe comprising a contact piece configured to be in contact with the workpiece; and a drive mechanism configured to move the scanning probe, the workpiece comprising a plurality of known-profile portions whose profiles are known, the known-profile portions being cyclically arranged via respective unknown-profile portions whose profiles are unknown, the profile measuring method comprising:
an autonomous scanning measurement step of controlling the drive mechanism to perform an autonomous scanning measurement, in which the profile of the workpiece is measured by moving the scanning probe along the workpiece while the scanning probe is pressed against the workpiece by a predetermined push amount;
a movement-path calculation step, in which a movement path of the scanning probe when a scanning measurement is performed on the workpiece is calculated; and
a nominal-value scanning measurement step of controlling the drive mechanism to perform a nominal-value scanning measurement, in which the scanning probe is moved along the movement path to measure the profile of the workpiece, wherein
in the measurement-path calculating step, the movement path for the workpiece is calculated based on measurement results of at least one of the unknown-profile portions measured in the autonomous scanning measurement step and design data of the known-profile portions.

8. A profile measuring method configured to measure a profile of a workpiece using a profile measuring machine comprising: a scanning probe comprising a contact piece configured to be in contact with the workpiece; and a drive mechanism configured to move the scanning probe, the workpiece comprising a plurality of known-profile portions whose profiles are known, the known-profile portions being cyclically arranged via respective unknown-profile portions whose profiles are unknown, the profile measuring method comprising:
an autonomous scanning measurement step of controlling the drive mechanism to perform an autonomous scanning measurement, in which the profile of the workpiece is measured by moving the scanning probe along the workpiece while the scanning probe is pressed against the workpiece by a predetermined push amount;
a movement-path calculation step, in which a movement path of the scanning probe when a scanning measurement is performed on the workpiece is calculated; and
a nominal-value scanning measurement step of controlling the drive mechanism to perform a nominal-value scanning measurement, in which the scanning probe is moved along the movement path to measure the profile of the workpiece, wherein
in the measurement-path calculation step, the movement path for the workpiece is calculated based on measurement results of a combination of one of the known-profile portions and one of the unknown-profile portions measured in the autonomous scanning measurement step.

Assignees

• Mitutoyo Corp

Inventors

• Ishii Kazunari
• Takemura Fumihiro

Classifications

• G01B21/20 Primary

  for measuring contours or curvatures, e.g. determining profile · CPC title

• G01B5/008 Primary

  using coordinate measuring machines · CPC title

• G01B5/202

  of gears · CPC title