Gate system for sample detection and method of sample inspection

US11215626B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11215626-B2
Application numberUS-201916406272-A
CountryUS
Kind codeB2
Filing dateMay 8, 2019
Priority dateMay 9, 2018
Publication dateJan 4, 2022
Grant dateJan 4, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The present disclosure provides a gate system for sample detection and a method of sample inspection, which relate to the field of detection and analysis technology. The gate system comprises: an accommodating apparatus configured to accommodate an inserted ticket to be detected; a wipe sampling apparatus including a wipe sampling belt which is configured to drive the ticket to be detected to move within the accommodating apparatus and to conduct a wipe sampling to the ticket; an inspiratory sampling apparatus configured to collect samples dropped from the wipe sampling apparatus; and a detection apparatus configured to detect the samples and output detection results. The gate system for sample detection and the method of sample inspection provided by the present disclosure have a wide range of applications and can perform rapid sampling and detection to those substances that are difficult to be volatilized.

First claim

Opening claim text (preview).

What is claimed is: 1. A gate system for sample detection, comprising: an accommodating apparatus configured to accommodate a ticket to be detected the accommodating apparatus comprising a card slot configured to accommodate the ticket to be detected; a wipe sampling apparatus including a wipe sampling belt, the wipe sampling belt being configured to drive the ticket to be detected to move within the accommodating apparatus and to conduct a wipe sampling on the ticket to be detected; an inspiratory sampling apparatus configured to blow off samples from the wipe sampling apparatus by air flow at a high-temperature capable of vaporizing the samples to vaporize the samples and to collect the vaporized samples through cyclone; a detection apparatus configured to detect the samples and output detection results, an information reader configured to read information of the ticket to be detected by a chip built in the information reader, and to verify the information of the ticket; and a spring plate configured to remove the ticket from the card slot after the verification of the information of the ticket is completed, wherein the inspiratory sampling apparatus comprises: a sampling inspiratory port provided under the wipe sampling apparatus, and configured to draw the samples into the inspiratory sampling apparatus; airflow discharge ports configured to form airflows; and a sampling head configured to collect the samples, wherein the airflow discharge ports comprise a peripheral rotary airflow discharge port configured to discharge airflow to form a partial negative pressure, and a central rotary airflow discharge port configured to discharge airflow to heat the wipe sampling belt and force the samples to be desorbed. 2. The gate system according to claim 1 , wherein the accommodating apparatus comprises: an elastically loaded protrusion configured to increase a contact pressure between the ticket to be detected and the wipe sampling belt such that the ticket to be detected becomes in contact with the wipe sampling belt. 3. The gate system according to claim 1 , wherein the wipe sampling apparatus further comprises: an electric roller configured to drive the wipe sampling belt for transmission; and a semiconductor refrigeration chip configured to cool the wipe sampling belt. 4. The gate system according to claim 1 , wherein the central rotary airflow discharge port is positioned outside of the sampling inspiratory port for discharging an airflow with a first flow rate; and the peripheral rotary airflow discharge port is positioned outside of the central rotary airflow discharge port for discharging an airflow with a second flow rate higher than the first flow rate. 5. The gate system according to claim 4 , wherein the inspiratory sampling apparatus further comprises an O-ring seal and a flared sampling head cover. 6. The gate system according to claim 1 , wherein the inspiratory sampling apparatus comprises a cyclone sampling apparatus. 7. The gate system according to claim 1 , wherein the detection apparatus comprises: at least one of a chromatographic column and an ion migration tube, and a sample exchange semi-permeable membrane. 8. A method of sample inspection, comprising: receiving a ticket to be detected; conducting a wipe-sampling to the ticket to be detected with a wipe sampling belt in a wipe sampling apparatus; blowing off samples from the wipe sampling belt by air flow at a high-temperature capable of vaporizing samples to vaporize the samples, and collecting the vaporized samples through cyclone effect; detecting the samples and outputting detection results; after receiving the ticket to be detected, reading and verifying information of the ticket to be detected within an accommodating apparatus by a gate system; and removing the ticket from a card slot by a spring plate after the verification of the information of the ticket is completed, wherein the gate system comprises: the spring plate configured to remove the ticket from the card slot after the verification of the information of the ticket is completed; and the accommodating apparatus configured to accommodate the ticket to be detected, the accommodating apparatus comprising the card slot configured to accommodate the ticket to be detected, an inspiratory sampling apparatus configured to blow off samples from the wipe sampling apparatus by air flow and to collect the samples blown from the wipe sampling belt; wherein the inspiratory sampling apparatus comprises: a sampling inspiratory port provided under the wipe sampling apparatus, and configured to draw the samples into the inspiratory sampling apparatus; airflow discharge ports configured to form airflows; and a sampling head configured to collect the samples, wherein the airflow discharge ports comprise a peripheral rotary airflow discharge port configured to discharge airflow to form a partial negative pressure, and a central rotary airflow discharge port configured to discharge airflow to heat the wipe sampling belt and force the samples to be desorbed. 9. The method according to claim 8 , wherein the gate system further comprises: the wipe sampling apparatus including the wipe sampling belt, the wipe sampling belt is configured to drive the ticket to be detected to move within the accommodating apparatus and to conduct the wipe-sampling to the ticket to be detected; and a detection apparatus configured to detect the samples and output the detection results.

Assignees

Inventors

Classifications

  • Sampling from a surface, swabbing, vaporising · CPC title

  • using the transfer device for another function · CPC title

  • Devices for withdrawing samples {(sampling of foundation soil E02D1/04; collecting or conveying radioactive samples G01T7/00, e.g. G01T7/02, G01T7/08)} · CPC title

  • Other cooling arrangements · CPC title

  • Mass spectrometers {(mass spectrometers per se H01J49/00)} · CPC title

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What does patent US11215626B2 cover?
The present disclosure provides a gate system for sample detection and a method of sample inspection, which relate to the field of detection and analysis technology. The gate system comprises: an accommodating apparatus configured to accommodate an inserted ticket to be detected; a wipe sampling apparatus including a wipe sampling belt which is configured to drive the ticket to be detected to m…
Who is the assignee on this patent?
Univ Tsinghua, Nuctech Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01N35/04. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 04 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).