Optical detection system

US11215556B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11215556-B2
Application numberUS-202016784055-A
CountryUS
Kind codeB2
Filing dateFeb 6, 2020
Priority dateSep 7, 2018
Publication dateJan 4, 2022
Grant dateJan 4, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An optical detection system includes a sample portion accommodating a sample, a wave source emitting waves to the sample portion, an optical portion provided on a path of an output wave output from the sample portion, and comprising a first spatial light modulator that modulates part of the output wave to a first wave and a second spatial light modulator that modulates part of the output wave to a second wave, a lens portion focusing the first wave and the second wave output from the optical portion, and a detection portion detecting a focused wave that is focused by the lens portion, in which the first spatial light modulator and the second spatial light modulator modulate the output wave such that the first wave and the second wave have destructive interference with respect to the sample under an already known condition.

First claim

Opening claim text (preview).

What is claimed is: 1. An optical detection system comprising: means for accommodating a sample, said sample accommodating means including one of a group including a container and a pipe, accommodating a sample to be subjected to optical detection; a laser source emitting waves to the sample in the sample accommodating means; a system of one or more spatial light modulators provided on a path of an output wave output from the sample in the sample accommodating means, and comprising a first spatial light modulator that controls a wave front of a first output wave to produce a first wave from a first portion of the output wave; a lens portion focusing the first wave and a second wave from a second portion of the output wave different than the first portion; and means to detect waves, said means to detect waves including a photodiode for detecting a focused wave that is focused by the lens portion, wherein in controlling the respective wave front of the first output wave, the first spatial light modulator results in the first wave and the second wave having a constructive interference or a destructive interference with respect to one another responsive to a condition of the sample. 2. The optical detection system of claim 1 , wherein the output wave comprises a speckle pattern that is generated by being multiple-scattered from the sample. 3. The optical detection system of claim 1 , wherein the sample accommodating means further comprises a multiple scattering amplification portion that amplifies a number of multiple scattering of the waves emitted to the sample. 4. The optical detection system of claim 1 , wherein the detection means to detect waves detects the existence of impurities in the sample according to detection of the presence of the focused wave.

Assignees

Inventors

Classifications

  • G01N21/51Primary

    inside a container, e.g. in an ampoule (G01N21/53 takes precedence) · CPC title

  • Speckle · CPC title

  • Investigating contamination, e.g. dust (G01N21/85 takes precedence) · CPC title

  • G01N21/47Primary

    Scattering, i.e. diffuse reflection (G01N21/25, G01N21/41 take precedence {G01N21/55 takes precedence}) · CPC title

  • G01N21/49Primary

    within a body or fluid · CPC title

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What does patent US11215556B2 cover?
An optical detection system includes a sample portion accommodating a sample, a wave source emitting waves to the sample portion, an optical portion provided on a path of an output wave output from the sample portion, and comprising a first spatial light modulator that modulates part of the output wave to a first wave and a second spatial light modulator that modulates part of the output wave t…
Who is the assignee on this patent?
The Wave Talk Inc, Korea Advanced Inst Sci & Tech
What technology area does this patent fall under?
Primary CPC classification G01N21/51. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 04 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).